XRD technology plays an important role in the research and development of ceramic materials. It provides a reliable scientific basis for the synthesis, preparation process optimization, performance improvement and application popularization of ceramic materials.
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It is difficult to quantify the amorphous and crystalline phases of cement materials due to the complexity of the mineral phases in the mixture and the significant overlapping peaks. Excellent results can be obtained by Rietveld refinement of the measured sample using standard measurement configurations.
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In materials science research, X-ray diffraction (XRD) is an important experimental method. Through XRD data, we can obtain information such as grain size, lattice distortion and dislocation density.
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Powder X-ray diffraction, as one of the methods for the study of drug polymorphism, has the advantages of not destroying samples and simple operation, and is the main method for the qualitative and quantitative analysis of drug polymorphism at present.
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Powder X-ray diffraction, as one of the methods for the study of drug polymorphism, has the advantages of no sample destruction and simple operation.
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SBA-15 is a mesoporous silicon-based molecular sieve with a highly ordered hexagonal straight pore structure (p6mm), the pore size can vary from 5 to 50 nm, and the pore wall is thicker.
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The composition of the diffraction pattern is mainly the position and intensity of the diffraction peak, and our analysis of the XRD pattern is based on the changes in the intensity and position to explain the changes in the micro and macro of the material.
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SBA-15 is a kind of mesoporous molecular sieve, and its synthesis is another important chemical technology emerging in recent years.
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Grazing incidence means that the X-ray is exposed to the film at a very small incidence Angle (< 5°), which greatly reduces the penetration depth in the film.At the same time, the low incidence Angle increases the irradiation area of the X-ray on the sample
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Parallel beam XRD of X-ray optical crystals has been successfully applied in thin film analysis, sample texture evaluation, crystal phase and structure monitoring, etc.
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