Multi-functional Residual Stress Analyzer

Chinese version residual stress measurement and analysis software supports both linear and elliptical fitting methods. It employs complete stress equations without assuming zero shear stress, along with the elliptical fitting method, allowing simultaneous measurement of normal stress and shear stress values. Each measurement uses more than 9 ψ angles. Peak profile fitting includes Gaussian, Lorentzian, Pearson VII, parabolic, etc. Measurement results can simultaneously display normal stress values, shear stress values, as well as information such as peak intensity, integral width, and full width at half maximum (FWHM).

TD-RSD XRD Residual Stress Analyzer ±7MPa accuracy, dual-detector innovation, full-auto operation & powerful software. Optimize processes, enhance product reliability. Compact, efficient, leading solution.

The portable X-ray residual stress analyzer is a non-destructive testing device based on X-ray diffraction technology. It is primarily used for measuring surface and near-surface residual stress distribution in materials such as metals and plastics, combining high precision with field adaptability.

PLC control system;Modular design, easy operation, and more stable equipment performance Lightweight design: Lightweight, suitable for rapid on-site measurement; High-precision measurement: High-precision full-closed-loop vector drive servo system control; Simple operation: Integrated Windows system or automation functions, supports one-click testing and real-time result display; Multi-functional compatibility: Measuring carbon steel, alloy steel, titanium alloy and other metals, glass, nickel-based materials and various composite materials; Speed optimization: Multi-channel silicon microstrip line array detector can provide noise-free performance, high-intensity measurement and rapid data acquisition.