Diffractometer

1. The accuracy of Diffractometer is high. 2. The application range of Diffractometer is wide. 3. Diffractometer is easy to operate, convenient and efficient.

1.The single crystal machine adopts PLC control technology. 2.Modular design, accessories plug and play. 3.Electronic lead door interlocking equipment with double protection. 4.Single crystal X-ray tube: a variety of targets can be selected, such as Cu, Mo,etc. 5. Single crystal adopts four-circle concentric technology to ensure that the center of no goniometer remains unchanged.

Chinese version residual stress measurement and analysis software supports both linear and elliptical fitting methods. It employs complete stress equations without assuming zero shear stress, along with the elliptical fitting method, allowing simultaneous measurement of normal stress and shear stress values. Each measurement uses more than 9 ψ angles. Peak profile fitting includes Gaussian, Lorentzian, Pearson VII, parabolic, etc. Measurement results can simultaneously display normal stress values, shear stress values, as well as information such as peak intensity, integral width, and full width at half maximum (FWHM).

Advantages: Continuously adjustable X-ray penetration depth Capability to observe the distribution of crystal planes with different orientations Analysis of orientation distribution in samples such as fibers, thin films, and powders Examination of structural characteristics like lattice distortion and crystallite size

TD-RSD XRD Residual Stress Analyzer ±7MPa accuracy, dual-detector innovation, full-auto operation & powerful software. Optimize processes, enhance product reliability. Compact, efficient, leading solution.

1. Maximum output powder: 3kW 2. Detector type: Array detector or SDD detector 3.Available with a variety of diffractometer accessories 4.Work pattern: PLC automatic control calculus, Integration method conversion, PLC automatically performs PHA, dead time correction 5.Sample measurement type: powder sample, liquid samples, melt-state samples, viscous samples, loose powders, bulk solid samples

1.Maximum output powder: 1200W; 2.Detector Type: Array detector or SDD detector, all of types detectors can be adapted to on this mode; 3.Work Pattern：PLC automatic control calculus, Integration method conversion, PLC automatically performs PHA, dead time correction

The portable X-ray residual stress analyzer is a non-destructive testing device based on X-ray diffraction technology. It is primarily used for measuring surface and near-surface residual stress distribution in materials such as metals and plastics, combining high precision with field adaptability.

XAFS Spectrometer achieves synchrotron-level data quality with >4M photons/s/eV flux, <0.1% stability, and a 1% detection limit. It empowers research across energy, catalysis, and materials science.

Polarographic testing using transmission or reflection Stress testing can be performed using the tilt method or the same tilt method. Thin film testing (in-plane rotation of the sample)