X-ray Diffractometer

Chinese version residual stress measurement and analysis software supports both linear and elliptical fitting methods. It employs complete stress equations without assuming zero shear stress, along with the elliptical fitting method, allowing simultaneous measurement of normal stress and shear stress values. Each measurement uses more than 9 ψ angles. Peak profile fitting includes Gaussian, Lorentzian, Pearson VII, parabolic, etc. Measurement results can simultaneously display normal stress values, shear stress values, as well as information such as peak intensity, integral width, and full width at half maximum (FWHM).

Advantages: Continuously adjustable X-ray penetration depth Capability to observe the distribution of crystal planes with different orientations Analysis of orientation distribution in samples such as fibers, thin films, and powders Examination of structural characteristics like lattice distortion and crystallite size

TD-RSD XRD Residual Stress Analyzer ±7MPa accuracy, dual-detector innovation, full-auto operation & powerful software. Optimize processes, enhance product reliability. Compact, efficient, leading solution.

1. Maximum output powder: 3kW 2. Detector type: Array detector or SDD detector 3.Available with a variety of diffractometer accessories 4.Work pattern: PLC automatic control calculus, Integration method conversion, PLC automatically performs PHA, dead time correction 5.Sample measurement type: powder sample, liquid samples, melt-state samples, viscous samples, loose powders, bulk solid samples

1.Maximum output powder: 1200W; 2.Detector Type: Array detector or SDD detector, all of types detectors can be adapted to on this mode; 3.Work Pattern：PLC automatic control calculus, Integration method conversion, PLC automatically performs PHA, dead time correction

XAFS Spectrometer achieves synchrotron-level data quality with >4M photons/s/eV flux, <0.1% stability, and a 1% detection limit. It empowers research across energy, catalysis, and materials science.

Polarographic testing using transmission or reflection Stress testing can be performed using the tilt method or the same tilt method. Thin film testing (in-plane rotation of the sample)

1. Detector type: Array detector or SDD detector; 2. PLC automatic control calculus, Integration mode conversion, PLC automatically performs PHA, dead time correction 3.Sample measurement type: powder sample, liquid samples, melt-state samples, viscous samples, loose powders, bulk solid samples 4.Available with a variety of diffractometer accessories 5.Maximum output powder: 3kW

The AI fully automated X-ray diffractometer deeply integrates the high-precision manipulation of a robotic arm based on a portable diffractometer. Compared to traditional diffractometers, it significantly reduces manual intervention, making it suitable for R&D scenarios requiring high-throughput and high-repeatability testing. It can be remotely controlled via mobile phone or APP, featuring automatic door opening and closing technology. With autonomous sampling and analysis capabilities, it offers precision and convenience.

It is equipped with the use of X-ray diffractometer, is a kind of diffractometer accessories. It is widely used in electrochemical systems containingcontaining carbon, oxygen, nitrogen, sulfur, metal intercalation,etc.