Mini X-Ray Diffractometer
- Tongda
- Liaoning, China
- 1—2 months
- 100 units per year
Introduction to TDM-20 X-Ray Diffractometer:
TDM-20 powder X-ray diffractometer(Benchtop XRD) is mainly used for phase analysis of powders, solids and similar pasty materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis and crystal structure analysis of polycrystalline materials such as powder samples and mental samples. Widely used in industry, agriculture, national defense, pharmaceutical, mineral, food safety, petroleum, education and scientific research and other fields.
Benchtop XRD(Powder diffractometer)
TDM-20 powder X-ray diffractometer (Benchtop XRD) breaks through the original international standard 600w technical index and is upgraded to a brand-new 1600W. And the operation is simple, stable performance, low energy consumption, can be equipped with proportional detector or new high-speed array detector, the performance of the whole machine has a jump.
Benchtop XRD(Powder diffractometer)
X-ray diffractometer(powder diffractometer) features:
The equipment is small in size and light in weight；
The high frequency and high voltage power supply can reduce the power consumption of the whole machine；
It can quickly calibrate and test the sample；
The line control is simple and convenient for debugging and installation；
The linearity of full spectrum diffraction angle can reach ±0.01°；
Measurement accuracy of diffraction peak position 0.001.
Welcome to contact Tongda for more product related parameters and usage solutions.
01 Dandong Tongda Science
Diversified High-quality X-ray Diffraction Analysis
The conventional detector uses one channel to receive data when the X-ray hits the sample. An advanced 1D array detector that receives data at 640 channels simultaneously. Thus, the test speed can be increased by more than ten times.
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Instrument accuracy tuning
When measuring silica powder of international standard sample, the peak deviation of all peaks in the full spectrum is not more than±0.01°. The accuracy of the full spectrum diffraction Angle can ensure accurate qualitative and quantitative analysis.
03Dandong Tongda Science
Excellent resolution
When the sampling time is 0.1s and the step width angle is 0.01°, the FWHM of the main peak 28.442°is better than 0.075', and the
resolution is less than 85%. High resolution can solve the problem of overlapping diffraction peaks. For the complex content of the sample to quickly obtain the phase analysis results.
Optional parts:
proportional detector one-dimensional array detector 6 bit automatic sample changer rotating sample holder
About us
An X-ray diffractometer is a precision instrument used to study the crystal structure, morphology and properties of matter. During the packaging and transportation process, certain measures need to be taken to ensure that the safety and performance of the instrument are not affected.
