In the field of lithium-ion battery research and development, understanding the dynamic changes in the microstructure of electrode materials during charge and discharge processes is crucial. Traditional offline detection methods cannot capture these changes in real time, while the emergence of in situ characterization techniques provides researchers with a powerful tool. Leveraging its expertise in X-ray diffraction (XRD) technology, Dandong Tongda Technology Co., Ltd. has developed an in situ battery accessory for battery research, offering an efficient window to explore the reaction processes inside the "black box" of batteries. Technical Principle: Dynamically Monitoring Microscale Changes in Battery Materials The core design goal of Dandong Tongda's originally battery accessory​ is to enable real-time monitoring of the evolution of the crystal structure of electrode materials using X-ray diffraction (XRD) technology while the battery is operating normally (during charge and discharge). This accessory typically needs to work in synergy with an electrochemical testing system (such as the LAND battery test system) and an X-ray diffractometer (such as Tongda Tech's TD-3500 model). It forms a specialized battery chamber that allows X-rays to penetrate and probe the electrode materials of the battery during operation. The key lies in the design of window materials (such as beryllium windows) with extremely low X-ray absorption rates on the battery components, ensuring effective incidence and emission of X-rays. Simultaneously, the accessory integrates necessary electrodes, insulation, and sealing components to ensure normal electrochemical reactions and maintain excellent sealing during testing. Key Functions and Application Value The value of this in situ battery accessory lies in its ability to help researchers intuitively and dynamically observe a series of microscopic changes in electrode materials during battery charge and discharge processes: Real-Time Observation of Phase Transition Processes: Many electrode materials undergo phase transitions during lithium-ion intercalation and deintercalation. In situ XRD can capture the formation, disappearance, and transformation of these phases in real time, which is critical for understanding the battery's reaction mechanisms. Monitoring Lattice Parameter Changes: By precisely tracking the shifts in XRD diffraction peaks, subtle changes in lattice parameters can be calculated, reflecting the expansion and contraction of the lattice. This is closely related to battery performance metrics such as voltage platforms and cycle life. Unveiling Capacity Decay Mechanisms: Capacity decay during battery cycling is often related to structural degradation of electrode materials, side reactions, and other factors. In situ monitoring can correlate electrochemical performance degradation with structural changes, providing direct insights for improving battery materials and optimizing design. Accelerating New Material Development: For evaluating novel electrode materials, in situ XRD technology can quickly provide key information on structural stability and reaction pathways, speeding up the R&D process.

As a well-known enterprise in the field of domestic precision instruments, Dandong Tongda Technology Co., Ltd. has launched a series of multi-function sample holder products. With high precision, modular design, and extensive application scenarios, these products have become one of the core equipment in material analysis, X-ray diffraction (XRD), and other fields. Core Functions: Meeting Diverse Analytical Needs Material Structure Analysis: Used for crystalline phase detection, orientation degree (texture) analysis, and residual stress testing, supporting the analysis of materials such as metals, ceramics, and thin films. In-plane rotation (β-axis) eliminates preferred orientation, ensuring the reproducibility of diffraction intensity data. Environmental Simulation Function: Optional high-temperature, low-temperature, or vacuum atmosphere modules (e.g., liquid nitrogen temperature control devices) support variable temperature testing from -196°C to 1000°C, meeting special requirements for high-temperature superconducting materials, metal surface treatment, and more. Automation and Intelligence: Supporting software enables automatic scanning, multi-point measurement, and data linkage analysis, improving detection efficiency. Application Fields: From Scientific Research to Industrial Testing Dandong Tongda sample holder are widely used in the following fields: Materials Science: Texture evaluation of rolled metal sheets, orientation analysis of ceramics, and residual stress testing of thin films. Semiconductor Industry: Analysis of multilayer films on silicon substrates (e.g., magnetic films, hardened coatings). Energy and Environmental Protection: Microstructural research on high-temperature superconducting films, battery materials, and catalysts. Higher Education and Scientific Research: Experimental teaching and research projects in crystallography, quantitative phase analysis, and more. Conclusion: An Indispensable Tool for Material Microanalysis The Dandong Tongda Multi-Function Sample Holder, with its high-precision motion control, modular flexibility, and broad environmental adaptability, has become an indispensable tool for material microanalysis. Its technical advantages are deeply rooted in the company's years of accumulated expertise in X-ray diffraction technology, combining research-grade precision with industrial-grade reliability to help users unlock the secrets of material properties at the microscopic scale. The multi-function sample stage serves as the "hands and feet" of modern precision observation and measurement, precisely presenting samples within the "field of view" of analytical instruments. Its selection directly determines the feasibility, efficiency, and reliability of experiments. Understanding its basic principles, functional classifications, and technical specifications is key to selecting and effectively utilizing this equipment.

Dandong Tongda XAFS Spectrometer: A Material Structure Analysis Tool for the Laboratory Precise analysis of atomic material structure without dependence on synchrotron radiation sources. X-ray Absorption Fine Structure (XAFS) spectroscopy serves as an important technique for investigating the local atomic and electronic structures of materials, with broad applications in catalysis, energy research, and materials science. Conventional XAFS methodology primarily relies on synchrotron radiation sources, which presents challenges including limited beam availability, complex application procedures, and the necessity to transport samples to large-scale scientific facilities for analysis. The X-ray Absorption Fine Structure developed by Dandong Tongda Technology Co., Ltd. aims to integrate this sophisticated analytical capability into standard laboratory environments. Core Advantages and Practical Value This instrument's design addresses several critical challenges researchers encounter: Laboratory-Based Alternative to Synchrotron Radiation: Eliminates the traditional dependency on synchrotron radiation sources, enabling researchers to conduct routine XAFS testing efficiently within their own laboratory settings, thereby significantly enhancing research productivity. In-Situ Testing Capabilities: Supports integration of various in-situ sample chambers (e.g., electrochemical, temperature-variable), enabling real-time monitoring of dynamic changes in material local atomic structure under simulated operational conditions (such as catalytic reactions or battery charge/discharge processes), providing valuable insights into reaction mechanisms. Automated Operation for Enhanced Efficiency: An 18-position sample turret enables automatic sample changing, facilitating continuous automated measurement of multiple samples and unmanned operation, thereby streamlining batch sample screening and extended in-situ experiments. Broad Application Scope The TD-XAFS spectrometer finds applications across numerous fields requiring detailed investigation of material local structures: New Energy Materials: Analysis of valence state changes and structural stability in lithium-ion battery electrode materials during charge/discharge processes; investigation of coordination environments at catalytic active sites in fuel cells. Catalysis Science: Particularly suitable for studying precise coordination structures of nanocatalysts and single-atom catalysts, active site characteristics, and their interactions with support materials, even at low metal loadings (<1%). Materials Science: Investigation of disordered structures, amorphous materials, surface/interface effects, and dynamic phase transition processes. Environmental Science: Analysis of valence states and coordination structures of heavy metal elements in environmental samples (e.g., soil, water), crucial for assessing toxicity and mobility. Biological Macromolecules: Study of electronic structures and geometric configurations of metal active centers in metalloproteins and enzymes. Summary Dandong Tongda's TD-XAFS spectrometer represents a high-performance domestic benchtop testing platform designed for universities, research institutions, and corporate R&D centers. It successfully incorporates synchrotron-level capabilities into conventional laboratories, substantially reducing the accessibility barrier to XAFS technology. The instrument provides researchers with convenient, efficient, and flexible tools for microscopic material structure analysis, serving as a practical solution for scientists exploring the microscopic world of matter.

In research fields such as life sciences, radiation biology, and pest control technology, precise, safe, and controllable irradiation methods are fundamental to many critical experiments. Leveraging its expertise in X-ray technology, Dandong Tongda Technology Co., Ltd. has developed the WBK-01 X-ray Irradiator, designed to provide a modern alternative to traditional radioactive isotope sources for various laboratories. I. Core Principle and Design Purpose The equipment operates by accelerating electrons through a high-voltage electric field to strike a metal target (e.g., a gold target), thereby generating high-energy X-rays. This design of an "electrically generated radiation source" fundamentally avoids the use of radioactive isotopes like Cobalt-60 (Co-60) or Cesium-137 (Cs-137), eliminating the long-term custody, substantial decommissioning costs, and potential safety hazards associated with source materials. II. Core Product Features High Safety: No Radiation When Powered Off: X-rays are only generated when the equipment is powered on and operating. There is no residual radiation after operation, significantly reducing laboratory security and management costs. Multiple Safety Interlocks: Equipped with multiple safety protection features including door-operation interlock, emergency stop, and overdose protection, ensuring the safety of operators and the environment. Precise Control and Good Reproducibility: Utilizes a digital control system, allowing users to precisely set irradiation parameters—including voltage (kV), current (mA), and irradiation time—via a touchscreen interface. The system enables stable dose output, ensuring uniformity in experimental conditions and reproducibility of results. Easy Operation and Simple Maintenance: The user interface is simple and intuitive, easy to learn and operate, lowering the barrier to use. Compared to isotope sources which require regular replacement and decay monitoring, the main maintenance for this equipment focuses on the periodic replacement of the X-ray tube, resulting in relatively fixed and manageable long-term maintenance costs. Flexible Sample Compatibility: The irradiation chamber is designed to accommodate various samples, from cell culture dishes and multi-well plates to small animals (e.g., fruit flies, mosquitoes, or mice). The sample stage can be designed to rotate, ensuring uniformity in radiation dose distribution. III. Main Application Scenarios Biomedical Research: Used for creating immunodeficient animal models (e.g., ablating bone marrow cells in mice), inducing cell apoptosis, synchronizing cell cycles, oncology research, and pre-treatment for stem cell transplantation. Sterile Insect Technique (SIT): This is a significant application area. It can be used to irradiate pupae of agricultural pests (e.g., Mediterranean fruit fly) or mosquitoes to render them sterile, thereby supporting green, pollution-free population control programs. Material Modification Research: Can be used to study the effects of X-rays on the properties of various materials (e.g., polymers, semiconductors). IV. Typical Model Parameters (Using WBK-01 as an example) X-ray Tube Voltage: Adjustable based on requirements, typically within a range from several tens to hundreds of kilovolts (kV), to suit different penetration depths and dose rate needs. Dose Rate: Can be adjusted based on voltage, current, and distance to meet the specific requirements of different experimental protocols. Uniformity: Ensured through optical system design and a sample rotation mechanism, guaranteeing uniform dose distribution within the irradiation field for reliable experiments. Summary The core value of the Dandong Tongda X-ray Irradiator lies in its replacement of inconvenient radioactive isotope sources with a safe, controllable, electrically generated X-ray source. It does not pursue excessive features but focuses on providing a stable, reliable, compliant, and easy-to-manage irradiation tool for scientific research and industrial applications. For laboratories seeking alternatives to isotopes or planning to establish new irradiation platforms, this is a practical piece of equipment worthy of evaluation and consideration by users in basic research and applied fields.

The multi-functional residual stress analyzer developed by Dandong Tongda Technology Co., Ltd. is designed to meet the needs of fast and accurate measurements in both laboratory and field environments. Based primarily on the X-ray diffraction principle, it enables non-destructive testing of the residual stress state inside materials. Versatile All-in-One Analysis This analyzer integrates multiple material analysis functions, significantly enhancing equipment utility and efficiency: Residual Stress Analysis: Supports various measurement modes such as standard同倾法 (omega-inclination), standard侧倾法 (psi-inclination), and standard摇摆法 (oscillation), capable of determining principal stresses and shear stresses for a comprehensive stress state evaluation. Retained Austenite Analysis: Employs the four-peak method for retained austenite testing, with fully automated data calculation for quick results. Diffraction Phase Analysis: Used to analyze crystal structures, chemical composition content, and distribution, helping researchers gain deeper insights into material constitution. Grain Size Analysis: Supports grain size evaluation from nanoscale to sub-micron scale, particularly suitable for fine grains ≤200 nm. Technical Features and Performance This instrument boasts multiple technical features aimed at ensuring precision, stability, and ease of use: High-Precision Measurement and Control: Utilizes a high-precision fully closed-loop vector drive servo system to ensure measurement accuracy and repeatability. Efficient Data Acquisition: Equipped with a multi-channel silicon strip linear array detector, which provides noise-free performance, high-intensity measurement, and rapid data collection to enhance detection efficiency. Portable Design: Features a lightweight construction, making it suitable not only for laboratory environments but also for on-site rapid measurements, adapting to various testing scenarios. User-Friendly Operation: Integrates Windows OS or automation functions, supporting one-click testing and real-time result display, lowering the operational barrier. Modularity and Safety: Employs a PLC control system with modular design for ease of operation and stable performance. Safety-wise, its low-power X-ray design complies with relevant safety standards, with radiation levels significantly below the annual public dose limit. Broad Application Fields Dandong Tongda’s multi-functional residual stress analyzer has extensive applications, covering almost all industrial sectors and research institutions requiring evaluation of material mechanical properties: Manufacturing Quality Control: Used to detect residual stresses in stamped, cast, and rolled parts during processing. Automotive Industry: Tests residual stresses in critical components such as camshafts and connecting rods to ensure reliability and durability. Aerospace: Evaluates working loads in critical areas of aerospace materials to assess safety. Materials Science Research: Applicable to various metal materials (e.g., carbon steel, alloy steel, titanium alloy, nickel-based materials), glass, and composite materials for residual stress, retained austenite, phase, and grain size analysis. Dandong Tongda Technology Co., Ltd.’s multi-functional residual stress analyzer demonstrates the company’s technical expertise in the field of material testing by integrating multiple analytical functions. This instrument provides engineers and researchers with a window into the intrinsic stress state of materials, helping to control product quality at the source, optimize process parameters, and thereby enhance product reliability and durability.

In the field of modern technology, many high-tech products—from smartphone screen substrates to core components of laser generators—rely on a fundamental material: synthetic single crystals. The precision of the cutting angle of these crystals directly determines the performance and yield of the final products. The X-Ray Orientation Analyzer is an indispensable instrument in the precision manufacturing of crystal devices. Utilizing the principle of X-ray diffraction, it accurately and rapidly measures the cutting angles of both natural and synthetic single crystals, including piezoelectric crystals, optical crystals, laser crystals, and semiconductor crystals. Dandong Tongda Science and Technology Co., Ltd. offers a range of reliable X-Ray Orientation Analyzers tailored to the research, processing, and manufacturing needs of the crystal materials industry. 01 Versatile Machine for Diverse Crystal Orientation Needs Dandong Tongda's X-Ray Orientation Analyzers primarily include models such as the TYX-200 and TYX-2H8. The TYX-200 model boasts a measurement accuracy of ±30″, with a digital display and a minimum reading of 10″. The TYX-2H8 model is an improved version of the TYX-200, featuring enhancements in the goniometer structure, load-bearing track, X-ray tube sleeve, support body, and an elevated sample stage. These improvements enable the TYX-2H8 to handle samples weighing 1–30 kg with diameters of 2–8 inches. It retains a digital angle display and a measurement accuracy of ±30″. 02 Advanced Technical Features for User-Friendly Operation Dandong Tongda's X-Ray Orientation Analyzers are designed with practicality and reliability in mind. Their user-friendly operation requires no specialized knowledge or advanced skills from the operator. The instrument features a digital angle display, ensuring intuitive and easy-to-read measurements while minimizing the risk of misreading. The display can be zeroed at any position, allowing direct reading of the wafer angle deviation. Some models are equipped with dual goniometers for simultaneous operation, significantly improving detection efficiency. A special integrator with peak amplification enhances measurement accuracy. The X-ray tube and high-voltage cable adopt an integrated design, improving high-voltage reliability. The detector high-voltage system uses a DC high-voltage module, and the vacuum suction sample stage further enhances measurement accuracy and speed. 03 Dedicated Sample Stage Designs for Various Testing Needs To meet the measurement requirements of samples with different shapes and sizes, Dandong Tongda offers a variety of specialized sample stages: TA Sample Stage: Designed for rod-shaped crystals, it features a load-bearing track and can test crystal rods weighing 1–30 kg with diameters of 2–6 inches (expandable to 8 inches). This stage can measure reference surfaces of rod-shaped crystals as well as surfaces of wafer-shaped crystals. TB Sample Stage: Also designed for rod-shaped crystals, it includes a load-bearing track and V-shaped support rails. It can test crystal rods weighing 1–30 kg, with diameters of 2–6 inches (expandable to 8 inches) and lengths of up to 500 mm. It measures end faces of rod-shaped crystals and surfaces of wafer-shaped crystals. TC Sample Stage: Primarily used for detecting the outer reference surfaces of single-crystal wafers such as silicon and sapphire. Its open-design suction plate avoids X-ray obstruction and positioning inaccuracies. The stage's suction pump securely holds wafers sized 2–8 inches, ensuring precise detection. ​ TD Sample Stage: Designed for multi-point measurements of wafers such as silicon and sapphire. Wafers can be manually rotated on the stage (e.g., 0°, 90°, 180°, 270°) to meet specific customer measurement needs. 04 High-Performance Model for Large Sample Challenges For large and challenging sample detection, Dandong Tongda's X-Ray Orientation Analyzers demonstrate exceptional performance. The TYX-2H8 model, for example, is particularly suitable for orienting sapphire crystal ingots and rods. This instrument supports measurements of sapphire A, C, M, and R crystal orientations, with an adjustable measurement range of 0–45° via electric automation. Its technical specifications are impressive: Copper-target X-ray tube with grounded anode and forced air cooling. Adjustable tube current: 0–4 mA; tube voltage: 30 kV. Operation via computer or touchscreen control. Synchronized movement of the X-ray tube and detector; electric-driven rotary table. Total power consumption: ≤2 kW. Most notably, its sample handling capacity includes crystal ingots weighing up to 30–180 kg, with maximum dimensions of 350 mm in diameter and 480 mm in length. These capabilities make it suitable for large sample detection in most industrial scenarios. 05 Broad Applications Supporting Multiple Industries Dandong Tongda's X-Ray Orientation Analyzers are widely used across various industries involved in the research, processing, and manufacturing of crystal materials. In the semiconductor industry, they enable precise orientation cutting of silicon wafers. In the optoelectronics field, they are used for precision processing of sapphire substrates, optical crystals, and laser crystals. In the piezoelectric materials sector, they ensure accurate cutting angle measurements for stable end-product performance. The instruments are particularly well-suited for sapphire materials, which are in high demand due to their hardness, high light transmittance, and excellent physicochemical stability. Sapphire is widely used in LED substrates, consumer electronic screens, and optical windows. Dandong Tongda's X-Ray Orientation Analyzers have become essential tools in China's crystal material research and manufacturing fields, thanks to their reliable performance, diverse configurations, and strong adaptability. Their modular design and variety of sample stage options allow users to select configurations that meet specific needs, ensuring high detection accuracy while improving work efficiency. Whether for research institutions or manufacturing quality control and process optimization, these instruments provide robust technical support, empowering users to achieve breakthroughs in precision manufacturing.

Dandong Tongda's X-ray Crystal Analyzer adopts advanced X-ray diffraction technology, enabling non-destructive detection of microstructural information in various materials. Whether it's single crystal orientation, defect inspection, lattice parameter measurement, or residual stress analysis, this instrument provides accurate and reliable test data, offering solid support for material research and quality control. The instrument is equipped with a highly stable X-ray generator that delivers exceptional performance. The tube voltage can be precisely adjusted within the range of 10-60kV, and the tube current can be regulated from 2-60mA, with a stability of no more than ±0.005%. This ensures highly repeatable and accurate test results, providing researchers with dependable data assurance. Dandong Tongda's X-ray Crystal Analyzer integrates intelligent control and comprehensive safety protection. It features an imported PLC automatic control system, enabling unattended automatic timed measurements. The multi-level safety protection system includes no-pressure, no-current, over-voltage, over-current, over-power, no-water, and X-ray tube over-temperature protections, ensuring the safety of operators. The TDF series X-ray crystal analyzer adopts a vertical tube housing with four windows that can be used simultaneously. It utilizes imported PLC control technology, which offers high precision and strong anti-interference capabilities, ensuring the reliable operation of the system. The PLC controls the switching and adjustment of high voltage and includes an automatic training function for the X-ray tube, effectively extending the service life of both the X-ray tube and the instrument. The instrument's radiation protection enclosure is constructed with high-density, high-transparency leaded glass, with external radiation leakage far below national safety standards, allowing researchers to conduct experimental studies in a secure environment. As a national high-tech enterprise, Dandong Tongda Technology Co., Ltd. has a comprehensive quality management system and a technical R&D team. Its products not only meet domestic market demands but are also exported to numerous countries and regions, demonstrating the strength and capability of China's scientific instrument manufacturing. Dandong Tongda's X-ray Crystal Analyzer, with its outstanding performance and reliable quality, has become a powerful assistant in the field of material analysis. It helps researchers and engineers unveil the layers of the material world and explore more unknown possibilities.

In the fields of materials science and industrial testing, every minute change in crystal structure can determine the final properties of a material. Today, a precision instrument embodying the essence of R&D from Dandong Tongda Science and Technology— TD-3500 X-ray Diffractometer—is opening a new window into the microscopic world for researchers and industrial inspectors with its outstanding performance and intelligent design. Evolution Through Craftsmanship and Technology The TD series diffractometers incorporate years of technological accumulation from Tongda Science and Technology, continuously evolving with the times. As the "gold standard" for material analysis, X-ray diffraction technology enables comprehensive structural analysis of powder, bulk, or thin-film samples: from qualitative and quantitative phase analysis, crystal structure analysis, and material structure analysis, to orientation analysis, macro/micro stress measurement, grain size, and crystallinity determination—the TD-3500 does it all. Intelligent Core, Stable and Reliable The core advantage of the TD-3500 X-ray Diffractometer lies in its use of an imported Siemens PLC control system. This innovative design gives the instrument outstanding features such as high precision, high accuracy, excellent stability, long service life, easy upgradability, user-friendly operation, and intelligent functionality, enabling it to flexibly adapt to the testing and research needs of various industries. The X-ray generator offers two options: high-frequency high-voltage solid-state or工频(line-frequency) generators, with high automation, extremely low failure rates, strong anti-interference capabilities, and excellent system stability. The system automatically controls the shutter switch, adjusts tube voltage and current, and includes an automatic X-ray tube training function. Real-time monitoring via a touchscreen greatly reduces operational complexity. Innovative Control, Revolutionary Operation Compared to traditional single-chip microcomputer circuits, the PLC control technology used in the TD-3500 offers multiple breakthroughs: Simple circuit control for easy debugging and installation Modular design allows users to perform maintenance and debugging themselves, significantly reducing costs Strong expandability for easy addition of various functional accessories without hardware modifications True-color touchscreen for human-machine interaction, user-friendly operation, and intuitive fault information display Precision Measurement, Safety Assured The TD series goniometer uses imported high-precision bearing transmission and is equipped with a high-precision full closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, capable of automatically correcting minute movement position errors to ensure high precision and accuracy of measurement results, with angular reproducibility reaching 0.0001 degrees. For safety, the TD-3500 adopts a hollow-axis structure with electronic lead door interlock装置, providing dual protection. The shutter window is linked to the lead door—when the lead door opens, the shutter automatically closes, ensuring comprehensive operator safety. Flexible Configuration, Comprehensive Compatibility The instrument offers two detector choices—proportional counter (PC) or scintillation counter (SC)—and multiple X-ray tube options including glass, corrugated ceramic, and metal-ceramic tubes, meeting different application scenarios and budget requirements. The TD-3500 X-ray Diffractometer is not only a high-performance analytical instrument but also a reflection of Tongda Science and Technology's relentless pursuit of quality. It is quietly playing a vital role in laboratories across the country, supporting scientific innovation and quality control, and becoming the most trusted analytical partner for scientists and engineers. Whether you are engaged in new material development, mineral resource analysis, pharmaceutical quality control, or metal material testing, the TD-3500 can provide you with accurate and reliable data support, helping you discover more possibilities in the microscopic world. Explore the Unknown with TD-3500—Let Tongda Science and Technology work with you to uncover the mysteries of materials science.

In the fields of materials science and industrial inspection, highly efficient and precise X-ray diffraction analysis has always been a core support for scientific breakthroughs and quality control. The TD-3700 series X-ray diffractometer redefines the performance limits of diffraction equipment with multiple innovative technologies, providing an unprecedented efficient solution for academic research, corporate R&D, and quality control applications. Multi-Detector Synergy Ushers in a New Era of High-Speed Analysis The TD-3700 series breaks through the limitations of traditional detectors by offering a variety of options, including high-speed one-dimensional array detectors, two-dimensional detectors, and SDD detectors. Compared to conventional scintillation or proportional detectors, it increases diffraction signal intensity by dozens of times, capturing high-sensitivity, high-resolution diffraction patterns within extremely short sampling cycles and significantly improving data output efficiency. Coupled with hybrid photon counting technology, the detectors operate noise-free, effectively suppress fluorescence background, and demonstrate excellent energy resolution and signal-to-noise performance—making them particularly suited for analyzing complex samples and trace specimens. Dual Diffraction/Transmission Modes Expand Application Boundaries The instrument not only supports conventional diffraction scanning but also innovatively introduces a transmission mode. This mode offers significantly higher resolution than diffraction mode, making it especially suitable for high-end applications such as crystal structure analysis and nanomaterials research. Meanwhile, diffraction mode, with its ultra-high signal stability, is ideal for routine phase identification. Another major advantage of transmission mode is its support for trace sample testing, greatly alleviating the challenges of sample preparation and limited sample availability. This opens up new possibilities for pharmaceutical development, geological analysis, cultural heritage identification, and other fields. Modular and Intelligent Design for a Reliable and User-Friendly Experimental Platform The TD-3700 adopts a modular hardware design where all components are plug-and-play without requiring calibration, significantly reducing maintenance costs and failure rates. Its one-click acquisition system and customized software greatly enhance operational convenience, allowing even non-specialists to get started quickly. A touchscreen interface provides real-time monitoring of instrument status, making experimental progress clear at a glance. Safety is also uncompromised: an electronic lead door interlock device offers dual protection, while a high-frequency high-voltage X-ray generator ensures stable and reliable performance. Combined with an anti-interference control unit, it maintains long-term operational reliability while ensuring user safety. Born for the Era: A Future-Oriented Benchmark in Diffraction Technology The TD-3700 series X-ray diffractometer integrates rapid analysis, intelligent operation, and comprehensive safety. It not only inherits the stability of the TD-3500 series but also achieves breakthroughs in detector technology, application flexibility, and system integration. Its emergence greatly meets the needs of modern laboratories for high-throughput, high-precision, and diverse sample analysis, making it an indispensable tool for material characterization, chemical analysis, pharmaceuticals, and academic research.