The TD-5000 X-ray Single-Crystal Diffractometer is the outcome of a Major Scientific Instrument Development Project funded by China's Ministry of Science and Technology, with Dandong Tongda Science and Technology Co., Ltd. as the lead unit. This instrument represents a significant breakthrough for China in the high-end scientific instrument sector, filling a longstanding domestic gap in the development and manufacturing of single-crystal diffractometers. Its industry recognition is underscored by the prestigious "3i Award - 2022 Outstanding New Instrument of the Year," a highly authoritative accolade in the field.The TD-5000 X-ray Single-Crystal Diffractometer is capable of determining the three-dimensional spatial structure and electron density distribution of crystalline substances, including inorganic compounds, organic compounds, and metal complexes. It can analyze key crystal parameters such as bond lengths, bond angles, configuration, conformation, unit cell parameters, space group, and intermolecular interactions. The instrument is designed to determine the precise three-dimensional spatial structure of new compounds (in crystalline form)—including bond lengths, angles, configuration, conformation, and even bonding electron density—as well as the actual arrangement of molecules within the crystal lattice. It provides comprehensive structural information such as unit cell parameters, space group, molecular crystal structure, hydrogen bonding and weak intermolecular interactions, and molecular configuration and conformation.It is widely used in analytical research across various fields including chemical crystallography, molecular biology, pharmaceutical sciences, mineralogy, and materials science.The system is user-friendly, featuring one-click collection and a modular design. It employs high-precision goniometry with four-circle concentric technology to ensure goniometer center stability. Additionally, it is equipped with a high-performance detector and offers the option of a PILATUS hybrid pixel array detector, enabling high data quality and very fast scanning speeds. Beyond performance, the instrument is safe and reliable, featuring an electronic lead glass door interlock system that provides dual protection. The TD-5000 X-ray Single-Crystal Diffractometer is a precision analytical instrument designed for scientific research and high-end industrial applications. It excels in key performance metrics through sophisticated design and represents a significant breakthrough in its category. For users with relevant procurement needs who demand high-quality, high-standard instrumentation, it is a option worthy of serious consideration. Dandong Tongda Technology Co., Ltd. is committed to fully meeting your expectations with reliable performance and professional support. We look forward to your inquiries and potential collaboration.

Dandong Tongda High Temperature Accessory is a precision instrument specifically designed for material research in high-temperature environments. It enables real-time observation and analysis of samples under high-temperature conditions, helping researchers obtain dynamic change information of materials at elevated temperatures. The Dandong Tongda High Temperature Accessory demonstrates outstanding technical performance, capable of meeting the demands of most high-temperature experimental environments. Depending on the experimental environment, the temperature range of the accessory varies: in an inert gas atmosphere, the temperature can range from room temperature to 1200°C; in a vacuum environment, the maximum temperature can reach 1600°C. Such a wide temperature range allows the accessory to adapt to various complex research scenarios, providing comprehensive technical support for studying material behavior at high temperatures. In terms of temperature control, the accessory also performs exceptionally well, with a control accuracy of up to ±0.5°C. This ensures high stability during experiments, offering a solid guarantee for the accuracy and reproducibility of experimental data. The High Temperature Accessory's design and construction reflect a balance between professionalism and practicality. The accessory uses polyester film as the window material, a choice that ensures both good observation clarity and stability in high-temperature environments. The cooling system employs deionized water circulation cooling, effectively ensuring the stable operation of the equipment under prolonged high-temperature conditions and extending its service life. This design considers the requirements of long-duration high-temperature experiments, allowing researchers to conduct continuous observations without worrying about equipment overheating. Whether studying crystal structure phase transitions, material thermal expansion behavior, or observing chemical reactions of materials at high temperatures, this accessory can provide intuitive and accurate experimental data.

Since its establishment in 2010, Dandong Tongda Science & Technology Co., Ltd. has been focusing on the research, development, and production of X-ray analytical instruments and non-destructive testing equipment.The company has accumulated extensive experience in X-ray technology. In 2013, it became the undertaking unit of the "National Major Scientific Instrument and Equipment Development Project" for the X-ray single crystal diffractometer, supported by the Ministry of Science and Technology of China. The Cryostream low-temperature liquid nitrogen cooling system, launched by Dandong Tongda Science & Technology, is a representative product of its Medium-low temperature accessory.This system is specifically designed for scientific experiments requiring precise low-temperature environments and integrates multiple advanced technologies. Precise temperature control is the core advantage of the system. The Medium-low temperature accessory can maintain a temperature stability of up to 0.3 K within the standard temperature range of 100–300 K.Such high temperature stability provides a reliable environment for scientific experiments, ensuring the accuracy and reproducibility of experimental data. Efficient cooling performance is another highlight. The system requires only 35 minutes to cool from room temperature to 100 K.The rapid cooling speed significantly enhances the work efficiency of researchers, making it particularly suitable for experimental scenarios requiring frequent temperature changes. ​ The intelligent control system makes operation more straightforward. Utilizing a fuzzy PID temperature control algorithm, the system achieves accurate and stable real-time control of low-temperature nitrogen gas temperature.This intelligent control approach greatly reduces the operational complexity, allowing researchers to focus more on the experiments themselves rather than equipment adjustments.

The Diffractometer X-Ray Tube​ manufactured by Dandong Tongda Technology Co., Ltd. serves as a core component in numerous X-ray analytical instruments within China. Dandong Tongda's Diffractometer X-Ray Tube primarily features the following technical characteristics: Diverse Target Material Options: This X-ray tube offers a variety of target material choices, including Cu, Co, Fe, Cr, Mo, Ti, W, and more. Users can select the most suitable target material based on the elemental composition of the material being tested and the specific analysis requirements, to achieve optimal analytical results. Flexible Focal Spot Configurations: The product provides different focal spot sizes, such as 0.2×12mm, 0.4×14mm (fine focus), and 1×10mm. Smaller focal spot sizes help improve spatial resolution, while the different shape designs meet the optical system requirements of various analytical instruments like XRD and XRF. Wide Power Range: The maximum output power of the X-ray tube covers multiple levels, including 2.0kW, 2.4kW, and 2.7kW, enabling it to adapt to various application scenarios from routine analysis to those requiring high power. Key Technologies and Performance Advanced Generator Technology: The high-frequency, high-voltage generator designed for use with the X-ray tube can achieve a maximum output power of 5kW. It utilizes microcomputer automatic control, with tube voltage adjustment precision up to 1kV per step and tube current adjustment precision up to 1mA per step, ensuring precise and stable output signals. Exceptional Stability Performance: The output stability of the generator is better than 0.01%. The comprehensive stability of some high-end models can even reach ≤0.3%. This high level of stability is crucial for precision analytical work that requires long-term data acquisition. Comprehensive Safety Protection: The equipment is equipped with extensive alarm and protection devices, including multiple protection functions such as over-voltage, over-current, over-power, water shortage, and X-ray tube over-temperature, ensuring safe and reliable operation. Main Application Areas Dandong Tongda's X-ray tubes are primarily used in the following types of analytical instruments: X-Ray Diffractometers (XRD): Used for phase analysis of materials, crystal structure determination, etc. X-Ray Fluorescence Spectrometers (XRF): Used for qualitative and quantitative elemental analysis. Crystal Analyzers and Orienters: Can be used for single crystal orientation, defect inspection, etc.

The core function of the graphite curved crystal monochromator is to precisely filter out the desired Kα characteristic radiation from complex X-ray signals. This process is based on the Bragg diffraction principle, utilizing the precise arrangement and curved shape of the graphite crystal lattice to achieve selective transmission of X-rays. In practical applications, this component effectively eliminates interference from continuous X-rays, Kβ radiation, and fluorescent radiation generated by the sample itself. This filtering effect is particularly significant when analyzing samples containing elements such as manganese, iron, cobalt, and nickel using copper-target X-ray tubes. Dandong Tongda offers both graphite curved crystals and flat crystals. The use of graphite curved crystal monochromators can enhance the peak-to-background ratio, reduce background noise, improve the resolution of weak peaks, achieve a reflection efficiency of n ≥ 35%, and lower the diffraction angle of the diffractometer. The mosaic spread is ≤ 0.55°, and the crystal surface can be tilted by ±2°. These parameters ensure the stable performance of the instrument over long-term use. In X-ray analysis, the quality of data directly impacts the reliability of research conclusions. The graphite curved crystal monochromator significantly improves the quality of the collected signals by enhancing the peak-to-background ratio and reducing background noise. For diffractometer applications, this component also moderately lowers the diffraction angle, making weak peaks more distinct and improving the instrument's ability to resolve trace components. While this improvement may seem minor, it can play a critical role in key experiments. Application Value The graphite curved crystal monochromator demonstrates broad application value in environmental protection and electronics.It is suitable not only for fundamental research but also meets quality control and analytical needs in industrial production.By working in synergy with X-ray diffraction systems, this component provides reliable data support for materials science, chemical research, and industrial testing. ​ When used in conjunction with copper-target X-ray tubes, it effectively addresses analytical challenges for a variety of sample types.

In X-ray diffraction analysis, thin film samples present significant challenges due to their extremely thin thickness, weak signals, and typical attachment to a substrate. Traditional testing methods are prone to interference from substrate signals, causing the signals from the thin film itself to be masked or distorted. The core design of the parallel beam thin film accessory lies in increasing the length of the grating slices to filter out more scattered rays. This approach offers two significant advantages: Reduces Substrate Signal Interference: Effectively suppresses non-target signals originating from the sample substrate. Enhances Thin Film Signal Strength: Makes the analytical signals from the target thin film more prominent, thereby yielding clearer and more accurate analysis results. Application Fields: The parallel beam thin film accessory is primarily applied in cutting-edge fields such as environmental protection and electronics. In these industries, the performance of thin film materials often directly determines the quality of the final product. For example, in the electronics industry, various functional thin films are widely used in products like semiconductor devices, display screens, and solar cells. The crystal structure, orientation, and stress state of the thin films significantly impact their electrical, optical, and mechanical properties. By utilizing the parallel beam thin film attachment, researchers can evaluate these key parameters more precisely, providing robust support for product development and quality control. ​ Dandong Tongda Science and Technology Co., Ltd. is a National High-Tech Enterprise specializing in the production of X-ray analysis instruments and non-destructive testing equipment. It was also the undertaking unit of the "National Major Scientific Instrument and Equipment Development Project" initiated by the Ministry of Science and Technology in 2013. Tongda Science and Technology has completed the serialization of its two main product lines: analytical instruments and non-destructive testing instruments.

The AI fully automated X-ray diffractometer deeply integrates the high-precision manipulation of a robotic arm based on a portable diffractometer. Compared to traditional diffractometers, it significantly reduces manual intervention, making it suitable for R&D scenarios requiring high-throughput and high-repeatability testing. It can be remotely controlled via mobile phone or APP, featuring automatic door opening and closing technology. With autonomous sampling and analysis capabilities, it offers precision and convenience.

Fiber Accessories utilize the X-ray diffraction (transmission) method to analyze the unique crystal structure of fibers. Parameters such as crystallinity and full width at half maximum (FWHM) are used to determine the orientation degree of the sample. ​ Main Functions and Features of Fiber Accessories: Maintaining Fiber Orientation: This is the most critical aspect. Fibers typically exhibit high anisotropy, with crystals preferentially aligned along the fiber axis. Fiber Accessories can straighten and secure fiber bundles, preserving their original orientation to measure orientation degree and distribution. Adapting to Different Sample Forms: Single Fiber: Extremely thin, requiring special clamps or frames for fixation. Fiber Bundle: Multiple fibers arranged in parallel; Fiber Accessories must align and tension them uniformly. Fiber Fabric: Materials like cloth require a flat frame to stretch them taut. Enabling Special Testing Modes: Transmission Mode: Suitable for thin fiber bundles or single fibers. Fiber Accessories include a dedicated frame to tension the fiber, allowing X-rays to penetrate the sample directly. Reflection Mode: Used for thicker fiber bundles or fabrics. Fiber Accessories provide a flat sample surface for this mode. Fiber Sample Holder: This is a simple metal or plastic frame equipped with slots or knobs. During operation, both ends of the fiber bundle are fixed to the holder, and knobs are rotated to tension the fiber, keeping it straight and parallel. The entire holder can be placed in the XRD goniometer for testing, similar to a standard sample. In summary, Fiber Accessories for XRD are specialized sample fixation devices designed for testing fibrous samples with anisotropic structures. Their core function is to maintain and regulate fiber orientation, while advanced versions may support in-situ stretching and other functionalities, providing critical insights into the orientation of crystal structures in fibers.

In the field of materials science research, precise measurement serves as the key to unlocking material properties. The multi-functional integrated measurement accessory developed by Dandong Tongda Science and Technology Co., Ltd. is a high-precision tool designed to enhance X-ray diffraction analysis capabilities. This multi-functional integrated measurement accessory is specifically designed for installation on wide-angle goniometers. Its core mission is to accurately analyze plate materials, bulk materials, and thin films deposited on substrates. The accessory can perform various measurement tasks, including crystal phase detection, orientation degree analysis, and stress testing. It supports texture analysis, residual stress determination, and in-plane structure testing of thin films, providing comprehensive data support for materials research. The core technical features of this accessory are reflected in its multi-axis coordinated precision mechanical system and highly adaptable measurement methods. The multi-functional integrated measurement accessory supports pole figure measurements using either transmission or reflection methods, offering flexibility for different samples and testing requirements. For stress testing, it can employ both the side-inclination method and the normal-inclination method. For thin film samples, the accessory also enables in-plane rotation testing, allowing for in-depth analysis of film structures. Its precision mechanical system ensures high measurement accuracy and repeatability, with minimum step increments of 0.001° (for rotation axes) and 0.001mm (for translation axes). The application scope of the multi-functional integrated measurement accessory is extremely broad, covering almost all advanced manufacturing and R&D fields that require material structure analysis. In the field of metal materials, it is used for evaluating the collective organization of metals such as rolled plates; in ceramics, it focuses on assessing ceramic orientation. For thin film materials, the accessory can analyze the preferred crystal orientation of film samples and test the residual stress of multilayer films (evaluating properties such as film peeling). It can also analyze surface oxidation and nitridation films on high-temperature superconducting material films and metal plates, as well as multilayer films on glass, silicon, and metal substrates. Notably, it can also be applied to the analysis of macromolecular materials, paper, lens plating materials, and more, demonstrating its interdisciplinary application potential. Measurement Accessory

In the fields of materials science and industrial testing, precise sample analysis relies on reliable instruments. The rotating sample stage produced by Dandong Tongda Technology Co., Ltd. is precisely such a critical accessory dedicated to enhancing the quality of X-ray diffraction (XRD) analysis. In X-ray diffraction analysis, the characteristics of the sample itself often pose challenges. For example, when the grains are excessively coarse, the material exhibits significant texture (or "preferred orientation," meaning the grains are not randomly arranged), or the sample has specific crystal habits (crystal growth patterns), obtaining diffraction data that is statistically representative and truly reflects the overall material properties becomes difficult. When measuring such samples with traditional static sample stages, the diffraction intensity may be distorted due to the aforementioned factors, affecting the accuracy of phase identification, texture analysis, and other evaluations. The core design philosophy of Tongda Technology's rotating sample stage is to address these challenges by enabling smooth rotation of the sample within its own plane. Core Function: Eliminating Orientation Errors and Enhancing Data Reliability The working principle of this rotating sample stage is intuitive and effective. By driving the sample to rotate continuously or in a stepwise manner, it ensures that the X-ray beam covers more grains with different orientations on the sample during irradiation. The main advantages of this approach are: Effective Reduction of Measurement Errors: Through the rotation averaging effect, it significantly mitigates measurement deviations caused by coarse grains or preferred orientation, making the diffraction data more representative of the material's overall properties. Ensuring Result Reproducibility: Whether the sample itself has texture or not, it guarantees good reproducibility of diffraction intensity across multiple measurements or between different laboratories, enhancing the reliability and comparability of data. Simplified Sample Preparation Requirements: It reduces the stringent demands for perfect sample preparation to a certain extent, improving analysis efficiency. Technical Specifications: Precision Control and Flexible Adaptability The rotating sample stage from Dandong Tongda Technology offers the following key technical parameters to meet the rigorous demands of scientific research and industrial testing: ParameterDescription Rotation Methodβ-axis (sample rotates within its own plane) Rotation Speed Range1 ~ 60 RPM (revolutions per minute) Adjustable based on experimental requirements Stepping PrecisionMinimum step width: 0.1º Supports high-precision positioning scanning Operation ModesConstant-speed rotation (for sample scanning), stepping, continuous, and other modes Adapts to various testing workflows and data acquisition needs Typical ApplicationsQuality control and R&D in industries such as environmental protection and electronics CompatibilityPrimarily used as an accessory for X-ray diffraction spectrometers (XRD) Application Scenarios: Serving the Environmental Protection and Electronics Industries This rotating sample stage is not merely a "showpiece" in the laboratory; it directly serves industries with high requirements for material analysis, such as environmental protection and electronics. In areas such as quality control, new product development, and failure analysis in these fields, it assists engineers and researchers in conducting more accurate phase analysis on samples of various forms, including powders, bulk materials, and thin films, ensuring the authenticity and reliability of data.