The rotating sample holder is an experimental device used for precise control of sample orientation, widely used in fields such as X-ray diffraction (XRD), spectroscopic analysis, and material testing. By rotating the sample, preferred orientation can be eliminated, measurement accuracy and repeatability can be improved. 1. The core function of the rotating sample holder (1) Eliminating preferred orientation: By rotating the sample plane (β axis), diffraction errors caused by coarse grains or texture are reduced, ensuring the reproducibility of diffraction intensity. (2) Multi position measurement: Conduct multi angle measurements on uneven samples (such as grains), average the data at different positions, and improve the accuracy and repeatability of the results. (3) Automated operation: Some devices support automatic rotation and sample change to improve testing efficiency (such as XRD fully automatic rotating sample holder). 2. Technical characteristics of rotating sample holder (1) Structural design: Drive mode: precise rotation is achieved through mechanisms such as motors, shafts, gears and racks, and some equipment is equipped with servo motors and encoders to correct the speed. Clamping device: The sample is fixed by a compression clamp, card slot, or clamping block, and the inner side is partially clamped with a rubber layer to adapt to different materials. Rotation parameters: The rotation speed can reach 1-60RPM, with a minimum step width of 0.1 º, and supports continuous or step modes. (2) Adaptability: Can be installed in XRD instruments, optical/electrical testing systems, etc., supporting multiple sample holders (such as reflective probes, in-situ battery accessories, etc.). Some devices support 360°rotation and are compatible with various measurement requirements such as optics and electronics. 3. Application scenarios of rotating sample holder (1) X-ray diffraction (XRD): Used for analyzing samples with texture or crystallography (such as metal materials, thin films), to eliminate the influence of preferred orientation on diffraction results. The fully automatic model can improve the efficiency of multi sample testing, reduce the number of door opening and closing times, and extend the lifespan of equipment. (2) Spectral analysis and material testing: Used for measuring uneven samples (such as grains) with reflective probes, by rotating and averaging spectral data at different positions. Adapt to in-situ high and low temperature environments, and support complex experimental conditions. (3) Multi functional experiment: By combining probes, electrical or optical sample holders, comprehensive testing of electrical characteristics, surface morphology, and other features can be achieved. The rotating sample holder​ solves the measurement error problem caused by the preferred orientation of traditional fixed sample stages by accurately controlling the sample orientation. At the same time, its automation and multi scene adaptability make it a key tool in fields such as XRD and spectral analysis. The specific selection needs to be matched with the corresponding model based on experimental requirements such as rotation accuracy, sample type, and automation level.

The small angle diffraction attachment is a specialized component used in X-ray diffraction instruments, mainly for the analysis of the structure and thickness of nanoscale materials. 1. Core functions of small angle diffraction attachments (1) Diffraction angle range: covering a small angle range of 0 ° -5 °, suitable for diffraction analysis of nanoscale materials. (2) Main application: It can accurately test the thickness of nano multilayer films and support the study of material surface or interface structure. 2. Compatible devices for small angle diffraction attachments This attachment is usually used in conjunction with X-ray diffractometers (such as TD-3500, TD-3700, TDM-20, etc.). 3. Application scenarios of small angle diffraction attachments (1) Materials Science: Characterization of Nanofilm and Multilayer Film Structures. (2) Chemistry and Chemical Engineering: Surface Treatment of Materials, Testing of Coating Thickness. (3) Other fields: Nanoscale analysis of materials such as geology, minerals, ceramics, and pharmaceuticals. 4. Manufacturer information Dandong Tongda Technology Co., Ltd. is the main manufacturer of this type of accessory, and its TD series analytical instruments have been mentioned as approaching or reaching international standards, and exported to countries such as the United States and Azerbaijan. In general, small angle diffraction attachments are key tools for nanomaterial analysis and thin film thickness measurement, and need to be used in conjunction with specialized X-ray diffraction instruments. Their application scenarios are concentrated in cutting-edge fields such as materials science and chemical engineering.

Parallel optical film measuring accessory is a specialized component used in X-ray diffractometers, mainly for enhancing the signal intensity and detection accuracy of thin film samples. 1.Core functions of parallel optical film measuring accessories Suppressing scattering interference: By increasing the length of the grating, filtering out more scattered rays, reducing the interference of the substrate signal on the diffraction results of the thin film, and thus improving the signal strength of the thin film. Improving the accuracy of thin film analysis: Suitable for thickness testing and other scenarios of nano multilayer thin films, combined with small angle diffraction attachments, low angle diffraction analysis in the range of 0°~5°can be achieved. 2. Structural characteristics of parallel optical film measuring accessories Grating design: By extending the length of the grating, optimizing the X-ray path, enhancing the filtering ability of scattered rays, and ensuring the purity of the thin film diffraction signal. 3. Application scope of parallel optical film measuring accessory Research on thin film materials: crystal structure analysis of nano multilayer films and ultra-thin films. Semiconductor and coating testing: used to evaluate the uniformity, crystalline quality, and other characteristics of thin films. 4. Compatible equipment for parallel optical film measuring accessory This attachment can be adapted to various X-ray diffractometer models, including: TD-3500 X-ray diffractometer TD-5000 X-ray single crystal diffractometer TD-3700 high-resolution X-ray diffractometer TDM-20 desktop X-ray diffractometer Overall, the parallel optical film measuring accessory significantly improves the diffraction signal quality of thin film samples through structural optimization and scattering suppression, and is widely used in materials science, semiconductor manufacturing, and other fields, especially suitable for high-precision analysis needs of nanoscale thin films.

In situ medium and low temperature accessories are experimental equipment accessory used for material analysis, mainly used for in-situ testing in low or medium low temperature environments. Combined with vacuum environment, temperature control, and special window material design, it is widely used in fields such as chemistry, materials science, and catalytic research. 1. Core functions and technical parameters of in-situ medium and low temperature accessories (1) Temperature range and control accuracy Supports a temperature range of -196 ℃ to 500 ℃ in a vacuum environment (such as liquid nitrogen refrigeration), with a temperature control accuracy of ± 0.5 ℃. Some models can cover temperatures from -150 ° C to 600 ° C, suitable for a wider range of experimental needs. (2) Refrigeration method and cooling system Using liquid nitrogen refrigeration, with a liquid nitrogen consumption of less than 4L/h, and maintaining a stable temperature through a deionized water circulation cooling system. Optional low-temperature liquid nitrogen cooling system (such as Cryostream series). (3) Window Materials and Structural Design The window material is mostly polyester film (such as TD series), and some infrared configurations use KBr or SiO2 windows. The structure includes a high-pressure resistant design (such as 133kPa) and is equipped with multiple gas inlets/outlets, suitable for in-situ reactions or atmosphere control. 2. Application fields of in-situ medium and low temperature accessories (1) Material research Used for in-situ testing of X-ray diffractometers (such as TD-3500) to study changes in crystal structure and phase transition processes at low temperatures. Support research on heterogeneous catalysis, gas-solid interactions, photochemical reactions, etc. (2) Electrochemical and Battery Research It can be extended to in-situ battery accessories to test composites in electrochemical systems (such as carbon, oxygen, nitrogen, sulfur, etc.), with a temperature resistance of up to 400 ℃. (3) Industry Applications The products of Dandong Tongda Technology (TD series) have been applied in the fields of chemistry, chemical engineering, geology, metallurgy, etc., and exported to countries such as the United States and Azerbaijan. 3. Typical products and brands of in-situ medium and low temperature accessories​ Dandong Tongda Technology (TD Series) The accessories for X-ray diffractometers such as TD-3500 and TD-3700 emphasize high-precision temperature control (± 0.5 ℃) and efficient liquid nitrogen refrigeration. Suitable for diffuse reflectance spectroscopy measurement, providing stainless steel reaction chamber, multi window configuration (FTIR or UV Vis compatible), supporting high vacuum to 133kPa environment. Overall, in situ medium and low temperature accessories have become an important tool for material in situ analysis through precise temperature control, vacuum environment, and window design adapted to different instruments. They play an irreplaceable role in the study of low-temperature crystal structures and exploration of catalytic reaction mechanisms.

To understand the changes in crystal structure of samples during high-temperature heating and the changes in mutual dissolution of various substances during high-temperature heating. In situ high-temperature attachment is an experimental device used for in-situ characterization of materials under high temperature conditions, mainly used to study dynamic processes such as crystal structure changes, phase transitions, and chemical reactions of materials during high-temperature heating. The following provides a detailed introduction from the aspects of technical parameters, application scenarios, and precautions: 一、 Technical parameters of in-situ high-temperature attachments 1. Temperature range of in-situ high-temperature attachments Inert gas/vacuum environment: The maximum temperature can reach 1600 ℃. Standard environment: Room temperature to 1200 ℃ (as provided in the TD-3500 XRD accessory). 2. Temperature control accuracy of in-situ high-temperature accessories: usually ± 0.5 ℃ (such as in-situ high-temperature accessories), and the accuracy of some equipment above 1000 ℃ is ± 0.5 ℃. 3. Window materials and cooling methods for in-situ high-temperature attachments Window material: Polyester film (temperature resistant to 400 ℃) or beryllium sheet (thickness 0.1mm), used for X-ray penetration. Cooling method: Deionized water circulation cooling ensures stable operation of the equipment under high temperature conditions. 4. Atmosphere and pressure control of in-situ high-temperature attachments: Supports inert gases (such as Ar, N ₂), vacuum or atmospheric environments, and some models can withstand pressures less than 10 bar. The atmosphere gas flow rate can be adjusted (0.7-2.5L/min), suitable for corrosive gas environments. 二、 Application scenarios of in-situ high-temperature attachments 1. Material research on in-situ high-temperature attachments Analyze the changes in crystal structure (such as platinum phase transition) and phase transition processes (such as melting and sublimation) at high temperatures. Study the chemical reactions of materials at high temperatures, such as dissolution and oxidation. 2. Equipment adaptability of in-situ high-temperature attachments Mainly used in X-ray diffractometers (XRD), such as TD-3500, TD-3700, etc. It can also be used for in-situ tensile testing using scanning electron microscopy (SEM), with customized flange connections required. 三、 Precautions for using in-situ high-temperature accessories 1. Sample requirements for in-situ high-temperature attachments It is necessary to test the chemical stability of the sample in the target temperature range in advance to avoid decomposition into strong acids/bases or ceramic bonding. The sample shape must meet the requirements of the attachment (such as thickness 0.5-4.5mm, diameter 20mm). 2. Experimental operating procedures for in-situ high-temperature attachments The heating rate needs to be controlled (e.g. maximum 200 ℃)/ min@100 ℃) to avoid overheating and damaging the equipment. After the experiment, the sample needs to be cooled to room temperature to prevent structural damage.

The multifunctional sample stage is a highly integrated experimental equipment mainly used in the fields of materials science, semiconductor manufacturing, electron microscopy analysis, etc. Its core features are modular design, multifunctional integration, and high-precision control. 一、 The core functions and structural characteristics of the multifunctional sample stage 1. Modular design of multifunctional sample stage: Multiple functions are achieved through different module combinations, such as self rotation coupling module (speed 0~20 revolutions per minute, with zero limit), lifting module (standard stroke 50mm/100mm, customizable), heater module (maximum temperature up to 1100 ℃), etc. Support DC/RF power supply connection to meet the needs of thin film growth, sample cleaning, or auxiliary film formation. 2. High precision control and sensors for multifunctional sample stage: Equipped with temperature, pressure and other sensors, real-time monitoring of sample environmental parameters, and adjusting heating, cooling and other operations through the control system. Some models integrate pneumatic baffle modules for easy operation. 3. Compatibility and adaptability of multifunctional sample stage: Suitable for testing irregular samples such as trace powders, sheet materials, and large-sized samples, avoiding the damage caused by traditional cutting or grinding. Supports sample sizes below 6 inches and customizable flange interfaces. 二、 Application Fields of Multi functional Sample Stand 1. Thin film technology for multifunctional sample stage: used for advanced thin film growth technologies such as MBE (molecular beam epitaxy), PLD (pulsed laser deposition), magnetron sputtering, as well as substrate annealing, high-temperature degassing and other processes. 2. Electron microscopy analysis of multifunctional sample stage: Cold field scanning electron microscope: Fix the sample with long screws and adjust the conductivity with compatible brass washers. TEM/FIB system: integrates in-situ delamination, nanoprobe testing, and TEM analysis to avoid contamination or damage caused by sample transfer. 3. Failure analysis of multifunctional sample stage: Integrating atomic site stripping, electrical testing and analysis processes in FIB and TEM systems to improve success rate and efficiency. 三、 Technical advantages of multifunctional sample stage 1. Integration and automation of multifunctional sample stage: reduces manual operation complexity through modular design, supports overall movement and precise positioning in vacuum environment. 2. High reliability of the multifunctional sample stage: using standard flange interfaces (such as CF50/CF40) to ensure sealing and compatibility. 3. Customization of multifunctional sample table: Heating material, stroke length, and sample holder type (such as 3-jaw bayonet type, bottom fork type) can be selected according to needs. Overall, the multifunctional sample stage is a key equipment for material research and micro analysis, commonly used in X-ray diffraction instruments. Its value lies in functional integration, operational flexibility, and adaptability to complex experimental requirements. The specific selection needs to match the corresponding modules and performance parameters according to the actual application scenarios (such as thin film technology, electron microscopy analysis, or failure analysis).

一、Core functions and application scenarios of originally battery accessories Functional positioning of originally battery accessories: 1.Implement real-time testing during battery charging and discharging processes (such as XRD, optical observation, etc.) to avoid data loss or sample contamination caused by traditional disassembly. 2.Simulate the working environment of real batteries, support temperature control, electrolyte addition, and sealing guarantee. Typical application scenarios of originally battery accessories: 1.XRD in-situ testing: Analyze the crystal phase changes of electrode materials (such as LiFePO4) during charge and discharge processes. 2.Optical in-situ observation: Observe the surface reaction of the electrode through a beryllium window (polyester film). 3.High throughput screening: supports battery performance research under multiple conditions (temperature, pressure, electrolyte). 4.Widely used in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc.    二、Structural composition and material properties of originally battery accessories 1.Core components of originally battery accessories: Lower insulation cover: mostly made of alumina ceramic or polytetrafluoroethylene material, including installation chamber and coolant flow channel, supporting temperature control. Upper conductive cover: designed with through holes, bolted to the lower insulating cover to form a current path. Lower electrode: including top plate and support column, fixed by butterfly spring compression, simplifying the assembly process. Beryllium window (polyester film): diameter 15mm (customizable), thickness 0.1mm (customizable), used for X-ray penetration or optical observation. 2.Technical improvement of originally battery accessories: Formal assembly: replaces traditional inverted methods, simplifies the operation process, and reduces the impact of compression on the separator and positive electrode materials. Cooling and Heating: The lower insulation cover integrates a coolant channel or resistance wire pipeline, supporting temperature control of -400℃. Sealing design: The butterfly spring compresses and fixes the lower electrode, and cooperates with the installation seat airflow to blow and prevent frost and ice formation. 三、Technical advantages of originally battery accessories 1. Convenient operation of originally battery accessories: The formal structure reduces the operating time inside the glove box and lowers the assembly complexity. Modular design of components (such as replaceable beryllium windows and insulation sleeves) improves maintenance efficiency. 2. Performance parameters: Test range: Temperature range of 0.5-160℃, temperature resistance up to 400 ℃. Sealing: Supports long-term stable storage of electrolyte to avoid leakage. Compatibility: Suitable for X-ray diffractometers and other equipment.

1、 The main functions and applications of fiber accessories: Fiber accessories​ of X-ray diffractometer: Using X-ray diffraction (transmission) method, the orientation and crystal structure of the sample are tested by analyzing the crystallinity, half peak width and other data of the fiber. Fourier transform infrared spectrometer fiber accessories: including microscope, diffuse reflectance, attenuated total reflectance (ATR) and other accessories, used for fiber composition identification, blending ratio determination, single fiber analysis, etc. For example, micro infrared can identify single two-component fibers, and ATR attachments are suitable for surface structure analysis without the need for sample preparation. 2、 Common types and characteristics of fiber accessories: X-ray diffractometer specific accessories: such as small angle diffraction accessories, parallel light thin film accessories, in-situ high/medium low temperature accessories, etc., suitable for different testing requirements. Some instruments support functions such as automatic sample changers and rotating sample tables to improve testing efficiency. Infrared spectrometer accessories: including transmission sampling tools (such as potassium bromide compression device), micro infrared accessories (for single fiber analysis), diffuse reflection scaffolds (suitable for opaque fibers), and ATR accessories (for rapid non-destructive testing), etc. 3、 Typical application scenarios of fiber accessories: Material research: Analyze the crystal structure and molecular orientation of natural fibers (cotton, linen, etc.) and chemical fibers (polyester, acrylic, etc.). Industrial quality inspection: used for determining the blending ratio of textiles and optimizing fiber processing technology (such as tensile orientation monitoring). Research field: Study the dichroism of polymers, fiber micro area stretching orientation, etc. In summary, fiber accessories are indispensable tools in material analysis and fiber testing, and their development relies on advances in instrument technology (such as XRD, FTIR) and innovation in accessory design. The specific selection depends on the testing requirements (such as crystal structure, composition identification) and instrument model.

The multifunctional integrated measurement attachment is used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Functional characteristics of multifunctional integrated measurement accessories： Perform polar diagram testing using transmission or reflection methods; Stress testing can be conducted using either the parallel tilt method or the same tilt method; Thin film testing (in-plane rotation of samples) Application areas of multifunctional integrated measurement accessories： Evaluation of metal assembly structures such as rolled plates; Evaluation of ceramic orientation; Evaluation of crystal priority orientation in thin film samples; Residual stress testing of various metal and ceramic materials (evaluation of wear resistance, cutting resistance, etc.); Residual stress testing of multilayer films (evaluation of film peeling, etc.); Analysis of surface oxidation and nitride films on high-temperature superconducting materials such as thin films and metal plates; Glass Si、 Analysis of multilayer films on metal substrates (magnetic thin films, metal surface hardening films, etc.); Analysis of electroplating materials such as macromolecular materials, paper, and lenses. Technical specifications for multifunctional integrated measurement accessories： Alpha axis (tilt) minimum step distance: 0.001 °/step, dynamic range:- 45°-90° Minimum step pitch of β axis (rotation): 0.001 °/step, dynamic range: 0 ° -360 ° Minimum step distance on the z-axis: 0.001 °/step, dynamic range: 0-10mm Sample size: maximum diameter of 100mm, adjustable thickness

X-ray absorption fine structure spectrometer (XAFS)​ is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. The basic principle of X-ray absorption fine structure spectrometer (XAFS) is that when the energy of X-rays resonates with the energy of an inner electron shell of an element in the sample, a sudden increase in electrons is excited to form a continuous spectrum, which is called the absorption edge. Near the absorption edge, as the X-ray energy increases, the absorption rate monotonically decreases as the penetration depth of the X-ray increases. When the spectrum is extended beyond a specific edge, fine structures can be observed, where X-ray absorption near edge structures (XANES) regions appear as soon as peaks and shoulders with a width exceeding 20 to 30 electron volts pass through the starting point of the edge. The fine structure located on the high-energy side of the edge where energy decays to several hundred electron volts is called X-ray Absorption Fine Structure (XAFS). The main features of X-ray absorption fine structure spectrometer (XAFS) are: Sensitivity to short-range ordering: It depends on short-range ordering and does not rely on long-range ordering, making it possible to measure a wide range of samples. It can be used for amorphous, liquid, molten, catalyst active centers, metal proteins, etc., as well as for structural studies of impurity atoms in crystals. Strong elemental characteristics: The X-ray absorption edge has elemental characteristics, and for atoms of different elements in the sample, the atomic neighbor structure of different elements in the same compound can be studied by adjusting the incident X-ray energy. High sensitivity: Fluorescence method can be used to measure samples of elements with concentrations as low as one millionth. Comprehensive acquisition of structural information: able to provide parameters that determine the local structure, such as the distance between absorbing atoms and neighboring atoms, the number and type of these atoms, and the oxidation state of absorbing elements. Sample preparation is simple: no single crystal is required, and under the experimental conditions, the data collection time is relatively short. Using a synchrotron X-ray source usually only takes a few minutes to measure a spectral line. The main advantages of X-ray absorption fine structure spectrometer (XAFS) are: Core advantage: highest luminous flux product Photon flux exceeding 1000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation Excellent stability: The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV 1% detection limit: High luminous flux, excellent optical path optimization, and excellent light source stability ensure that high-quality EXAFS data can still be obtained when the measured element content is>1%. 4. Application areas of X-ray absorption fine structure spectrometer (XAFS) : Energy field: such as research on lithium batteries and other secondary battery materials, fuel cell research, hydrogen storage material research, etc. XAFS can be used to obtain the concentration, valence state, coordination environment, and dynamic changes of core atoms during charge discharge cycles and electrochemical reactions. Catalysis field: used for research on nanoparticle catalysis, single atom catalysis, etc. Obtain the morphology of the catalyst on the support, the interaction form with the support, and its changes during the catalytic process through XAFS, as well as the neighboring structures of metal ions with extremely low content. In the field of materials science, X-ray absorption fine structure spectrometer (XAFS) is used for the characterization of various materials, the study of complex systems and disordered structural materials, the research of radioactive isotopes, the study of related properties of surface and interface materials, and the study of dynamic changes in materials. In the field of geology, X-ray absorption fine structure spectrometer (XAFS) can be used for element valence state analysis of ore materials in geological research. Environmental field: XES can be used for valence state analysis of Cr/As elements, etc. In the field of radiochemistry, X-ray absorption fine structure spectrometer (XAFS) can be used for valence state analysis of Ce, U elements, etc. The X-ray absorption fine structure spectrometer (XAFS) plays an important role in modern scientific research due to its unique working principle, significant characteristics, and wide application fields. It provides a powerful means for people to gain a deeper understanding of the microstructure and chemical state of matter, promoting the development and progress of multiple disciplinary fields.

The main purpose of NDT portable X-ray welding testing machine is to inspect the processing and welding quality of materials and components such as ship hulls, pipelines, high-pressure vessels, boilers, aircraft, vehicles, and bridges in industrial sectors such as national defense, shipbuilding, petroleum, chemical, mechanical, aerospace, and construction, as well as internal defects and the inherent quality of various light metals, rubber, ceramics, etc. The principle and application of NDT portable X-ray welding testing machine： NDT portable X-ray welding testing machine utilize the acoustic, optical, magnetic, and electrical properties of materials to detect the presence of defects or unevenness in the tested object without damaging or affecting its performance. They provide information such as defect size, location, nature, and quantity. Compared with destructive testing,it has the following characteristics. The first is non-destructive, as it does not compromise the performance of the detected object during testing; The second is comprehensive, as the detection is non-destructive, it is necessary to conduct a 100% comprehensive detection of the tested object, which cannot be achieved by destructive detection; The third is comprehensive, and destructive testing is generally only applicable to the testing of raw materials, such as tension, compression, bending, etc. commonly used in mechanical engineering. Destructive testing is carried out on manufacturing raw materials, and for finished products and in use items, destructive testing cannot be carried out unless they are not intended to continue to serve.on the other hand, it does not damage the performance of the tested object. So,it can not only perform full process testing on manufacturing raw materials, intermediate processes, and even final products, but also test equipment in service. Characteristics of NDT portable X-ray welding testing machine: The X-ray generator has a small volume, with an anode grounded and forced cooling by a fan; ◆ Lightweight, easy to carry, and simple to operate; Work and rest in a 1:1 ratio; Beautiful appearance and reasonable structure; ◆ Delayed exposure to ensure operator safety; Visual inspection range of NDT portable X-ray welding testing machine 1. Inspection of surface defects on welds. Check the welding quality such as surface cracks, incomplete penetration, and leakage of the weld seam. 2. Status check. Check for surface cracks, peeling, pulling, scratches, dents, protrusions, spots, corrosion, and other defects. 3. Internal cavity inspection. When certain products (such as worm gear pumps, engines, etc.) are working, perform endoscopic testing according to the specified technical requirements. 4. Assembly inspection. When there are requirements and needs, use the same 3D industrial video endoscope to inspect the assembly quality; After assembly or a certain process is completed, check each component.Whether the assembly position of the components meets the requirements of the drawings or technical specifications; Is there an assembly defect. 5. Excess item inspection. Check for residual debris, foreign objects, and other debris inside the product cavity.

The WBK-01 X-ray irradiator generates high-energy X-rays to irradiate cells or small animals. X-ray irradiator is used for various basic and applied research. Throughout history, radioactive isotope irradiators have been used, which require transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiator can be installed in laboratories for convenient and rapid irradiation of cells. Various samples can be directly irradiated in the laboratory without affecting fertility or safety. The X-ray irradiator is easy to use for personnel without professional X-ray training, and there are no expensive license applications or safety or radiation source maintenance costs. This device is easy to operate, safe, reliable, and cost-effective, and can replace radioactive isotope sources. 1. Principle of X-ray irradiator: The X-ray tube in the X-ray irradiator generates high-energy electrons, which produce X-rays when they collide with the target material (usually tungsten). Accelerating electrons through a high-voltage electric field to obtain sufficient energy to generate the required X-ray wavelength and intensity. Then, the X-rays are adjusted and optimized through a series of collimators, filters, and other devices, and finally irradiated onto the sample. The main components of an X-ray irradiator are: The X-ray irradiator mainly includes X-ray tubes, high-voltage generators, control circuits, cooling systems, safety protection devices, and sample rooms. Among them, the X-ray tube is the core component responsible for generating X-rays; The high-voltage generator provides the required high voltage and current for the X-ray tube; The control circuit is used to control parameters such as the generation, intensity, and irradiation time of X-rays; The cooling system ensures that the equipment will not be damaged due to overheating during operation; The safety protection device ensures the safety of operators and the usage environment. 3. Application areas of X-ray irradiator: The X-ray irradiator can be used in the field of biology: it can be used for cell culture and division inhibition research, gene change induction, stem cell research, small animal irradiation, T-B cell research, blood cell research, bone marrow transplantation irradiation, transplantation immunity, immunosuppressive therapy, radiation sensitivity research, DNA damage research, etc. The X-ray irradiator can be used in the medical field: in tumor treatment, it can be used to locally irradiate the tumor site, kill cancer cells or inhibit their growth; The X-ray irradiator can also be used as an auxiliary diagnosis for certain diseases, such as helping to determine the condition by observing the imaging changes of tissues and organs through X-rays. The X-ray irradiator can be used in the food industry: it can be used for food irradiation preservation, killing microorganisms in food through X-ray irradiation, inhibiting enzyme activity, thereby extending the shelf life of food while maintaining its original taste and nutritional content. The X-ray irradiator can be used in the industrial field: it can be used for material performance testing and modification, such as cross-linking treatment of polymer materials to improve their strength and stability; It can also be used for non-destructive testing to detect defects and cracks inside materials. In summary, X-ray irradiator​ is an important scientific and industrial device with broad application prospects and value.