TD-Mini X-ray Stress Diffractometer

Dandong Tongda Technology Co., Ltd. introduces the TD-Mini X-ray Stress Diffractometer, an advanced non-destructive testing instrument based on X-ray diffraction (XRD) technology. Featuring innovative structural design and an intelligent operating system, this instrument is specifically engineered for precise measurement of surface and near-surface residual stress distribution in materials such as metals and plastics. It successfully achieves a perfect integration of laboratory-level accuracy and exceptional field adaptability.

Core Product Features:
The TD-Mini X-ray Stress Diffractometer offers significant advantages with its compact size and lightweight design. The entire unit weighs under 15 kilograms, making it highly suitable for rapid on-site measurements and mobile detection tasks. Its user-friendly design philosophy, combined with an intelligently guided interface, ensures operators can quickly master the system and perform complex operations without requiring specialized background knowledge. Meanwhile, the instrument's performance, enhanced by advanced algorithmic processing, fully meets various complex detection requirements, including stress analysis of curved components and specially shaped parts. It demonstrates outstanding measurement efficiency, with single measurement time reduced to mere seconds. When coupled with its automated multi-point scanning function, this significantly enhances inspection workflow productivity. Furthermore, the instrument boasts a wide range of applications, effectively serving multiple critical sectors including industrial manufacturing, aerospace, and the energy sector. It is particularly well-suited for application scenarios such as weld stress inspection, heat treatment process evaluation, and coating stress analysis.

Key Component Technical Specifications:

X-Ray Tube: 

Utilizes a fine-focus ceramic X-ray tube equipped with a built-in sealed self-circulating cooling system. Unique thermal design ensures stability for continuous 24/7 operation and incorporates automatic over-temperature protection. A variety of target materials are available—including Cr, Cu, Mn, Co, V, Ti, Fe, Mo—to meet the testing requirements of different materials and ensure optimal diffraction signal quality.

Detection System: 

Configured with a high-speed area-array photon-counting detector that employs advanced silicon strip technology for direct X-ray detection, effectively improving signal acquisition efficiency. This detector features a 640 silicon strip linear array design with an overall counting rate greater than 1×10⁹ cps, offering excellent characteristics such as compact size, fast response, and high sensitivity, guaranteeing measurement accuracy even under weak signal conditions.

Thanks to its innovative portable design, outstanding detection performance, and broad industry applicability, the TD-Mini X-ray Stress Diffractometer has become a reliable and efficient tool in the field of residual stress analysis. The instrument is equipped with professional analysis software that provides comprehensive database support and multiple stress calculation models. It offers robust technical support for quality control and process optimization across various industries, assisting enterprises in achieving precise quality management and process improvements.

Since 2013, Tongda Technology has established a deep collaboration with the academic team of Academician Chen Xiaoming from the Chinese Academy of Sciences, jointly setting up an expert workstation and leveraging top-tier scientific research expertise to continuously advance in the field of X-ray analysis. As the primary lead unit of the "Major National Scientific Instrument and Equipment Development Project" under the Ministry of Science and Technology, the company has partnered with seven research institutions, including Sun Yat-sen University and the Shenyang Institute of Computing Technology, Chinese Academy of Sciences. After eight years of collaborative efforts, in 2021, it successfully launched China's first X-ray single crystal diffractometer with fully independent intellectual property rights, achieving a "from zero to one" breakthrough in domestic equipment for this field.

In terms of talent development, the company's R&D personnel account for 30% of its workforce, significantly higher than the industry average. To date, it has accumulated 23 patents and 7 software copyrights. Its product portfolio comprehensively covers TD series diffractometers, benchtop diffractometers, X-ray fluorescence spectrometers, single crystal diffractometers, crystal orientators, and crystal analyzers, forming a complete X-ray analytical instrument matrix.

On the technological innovation front, the Tongda AI Fully Automatic Diffractometer deeply integrates artificial intelligence and robotics technology: high-precision robotic arms can automatically handle and test diverse samples such as powders, thin films, and bulk materials; remote operation via a mobile phone APP, combined with an automatic door opening and closing system, significantly enhances operational safety and convenience; the modular architecture design endows the product with strong scalability, facilitating future upgrades and maintenance.