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This guide details essential maintenance for benchtop XRD systems, covering X-ray generation, optics, detectors, and safety. Regular upkeep ensures accuracy, prevents failures, and extends equipment life. The TDM-20 Benchtop XRD from Dandong Tongda Technology meets all your analytical needs.

Dandong Tongda Tech, a professional manufacturer of X-ray analysis instruments, provides high-precision crystal orienters. These key instruments ensure machining accuracy in the research and manufacturing of piezoelectric, optical, laser, and semiconductor crystals, supporting high-end industries.

Dandong Tongda Science & Technology Co., Ltd., achieved a breakthrough by independently developing the TD-5000 X-ray single crystal diffractometer through collaboration with Academician Chen Xiaoming. This success, stemming from a national R&D project, signifies China's leap in high-end scientific instruments, gaining both domestic and international market recognition.

X-ray diffraction (XRD) uses Bragg's Law to analyze material structures by measuring diffraction angles. Dandong Tongda's product line, from the versatile TD-3500 and advanced TD-3700 to the compact TDM-20, provides complete solutions for education, industry, and cutting-edge research.

Dandong Tongda Technology provides superior X-ray tubes for analytical instruments. Our specialized tubes (ceramic, metal-ceramic, glass) ensure excellent compatibility with XRD, XRF, and crystal analyzers. Offering diverse target materials, precise focal spots, and robust power outputs (2.4kW/2.7kW). Committed to quality and reliability for global partners in industrial and research applications.

Dandong Tongda's X-ray non-destructive testing equipment ensures precise internal inspection for aerospace, automotive and construction sectors. Featuring portable design and advanced safety systems, it delivers reliable defect detection while maintaining complete operational safety.

The Multifunctional Integrated Measurement Attachment from Dandong Tongda is a high-precision sample analysis platform mounted on wide-angle goniometers to significantly enhance X-ray analytical capabilities. This multi-axis system enables sophisticated material analysis, including phase identification, residual stress testing, and thin film in-plane structure characterization. Featuring α-axis tilt (-45°-90°), β-axis 360° rotation, and XYZ translation (±10mm) with 0.001°/.001mm resolution, it supports both transmission/reflection pole figure measurements and iso-/side-inclination stress methods. Essential for advanced materials research, it facilitates texture analysis, stress evaluation, and multilayer film studies on metals, ceramics, and various substrates, making it a powerful tool for both research and industrial inspection applications.

The TD-5000 X-ray Single-Crystal Diffractometer is the outcome of a Major Scientific Instrument Development Project funded by China's Ministry of Science and Technology, with Dandong Tongda Science and Technology Co., Ltd. as the lead unit. This instrument represents a significant breakthrough for China in the high-end scientific instrument sector, filling a longstanding domestic gap in the development and manufacturing of single-crystal diffractometers. Its industry recognition is underscored by the prestigious "3i Award - 2022 Outstanding New Instrument of the Year," a highly authoritative accolade in the field.The TD-5000 X-ray Single-Crystal Diffractometer is capable of determining the three-dimensional spatial structure and electron density distribution of crystalline substances, including inorganic compounds, organic compounds, and metal complexes. It can analyze key crystal parameters such as bond lengths, bond angles, configuration, conformation, unit cell parameters, space group, and intermolecular interactions. The instrument is designed to determine the precise three-dimensional spatial structure of new compounds (in crystalline form)—including bond lengths, angles, configuration, conformation, and even bonding electron density—as well as the actual arrangement of molecules within the crystal lattice. It provides comprehensive structural information such as unit cell parameters, space group, molecular crystal structure, hydrogen bonding and weak intermolecular interactions, and molecular configuration and conformation.It is widely used in analytical research across various fields including chemical crystallography, molecular biology, pharmaceutical sciences, mineralogy, and materials science.The system is user-friendly, featuring one-click collection and a modular design. It employs high-precision goniometry with four-circle concentric technology to ensure goniometer center stability. Additionally, it is equipped with a high-performance detector and offers the option of a PILATUS hybrid pixel array detector, enabling high data quality and very fast scanning speeds. Beyond performance, the instrument is safe and reliable, featuring an electronic lead glass door interlock system that provides dual protection. The TD-5000 X-ray Single-Crystal Diffractometer is a precision analytical instrument designed for scientific research and high-end industrial applications. It excels in key performance metrics through sophisticated design and represents a significant breakthrough in its category. For users with relevant procurement needs who demand high-quality, high-standard instrumentation, it is a option worthy of serious consideration. Dandong Tongda Technology Co., Ltd. is committed to fully meeting your expectations with reliable performance and professional support. We look forward to your inquiries and potential collaboration.

In X-ray diffraction analysis, thin film samples present significant challenges due to their extremely thin thickness, weak signals, and typical attachment to a substrate. Traditional testing methods are prone to interference from substrate signals, causing the signals from the thin film itself to be masked or distorted. The core design of the parallel beam thin film accessory lies in increasing the length of the grating slices to filter out more scattered rays. This approach offers two significant advantages: Reduces Substrate Signal Interference: Effectively suppresses non-target signals originating from the sample substrate. Enhances Thin Film Signal Strength: Makes the analytical signals from the target thin film more prominent, thereby yielding clearer and more accurate analysis results. Application Fields: The parallel beam thin film accessory is primarily applied in cutting-edge fields such as environmental protection and electronics. In these industries, the performance of thin film materials often directly determines the quality of the final product. For example, in the electronics industry, various functional thin films are widely used in products like semiconductor devices, display screens, and solar cells. The crystal structure, orientation, and stress state of the thin films significantly impact their electrical, optical, and mechanical properties. By utilizing the parallel beam thin film attachment, researchers can evaluate these key parameters more precisely, providing robust support for product development and quality control. ​ Dandong Tongda Science and Technology Co., Ltd. is a National High-Tech Enterprise specializing in the production of X-ray analysis instruments and non-destructive testing equipment. It was also the undertaking unit of the "National Major Scientific Instrument and Equipment Development Project" initiated by the Ministry of Science and Technology in 2013. Tongda Science and Technology has completed the serialization of its two main product lines: analytical instruments and non-destructive testing instruments.

In the fields of materials science and industrial testing, precise sample analysis relies on reliable instruments. The rotating sample stage produced by Dandong Tongda Technology Co., Ltd. is precisely such a critical accessory dedicated to enhancing the quality of X-ray diffraction (XRD) analysis. In X-ray diffraction analysis, the characteristics of the sample itself often pose challenges. For example, when the grains are excessively coarse, the material exhibits significant texture (or "preferred orientation," meaning the grains are not randomly arranged), or the sample has specific crystal habits (crystal growth patterns), obtaining diffraction data that is statistically representative and truly reflects the overall material properties becomes difficult. When measuring such samples with traditional static sample stages, the diffraction intensity may be distorted due to the aforementioned factors, affecting the accuracy of phase identification, texture analysis, and other evaluations. The core design philosophy of Tongda Technology's rotating sample stage is to address these challenges by enabling smooth rotation of the sample within its own plane. Core Function: Eliminating Orientation Errors and Enhancing Data Reliability The working principle of this rotating sample stage is intuitive and effective. By driving the sample to rotate continuously or in a stepwise manner, it ensures that the X-ray beam covers more grains with different orientations on the sample during irradiation. The main advantages of this approach are: Effective Reduction of Measurement Errors: Through the rotation averaging effect, it significantly mitigates measurement deviations caused by coarse grains or preferred orientation, making the diffraction data more representative of the material's overall properties. Ensuring Result Reproducibility: Whether the sample itself has texture or not, it guarantees good reproducibility of diffraction intensity across multiple measurements or between different laboratories, enhancing the reliability and comparability of data. Simplified Sample Preparation Requirements: It reduces the stringent demands for perfect sample preparation to a certain extent, improving analysis efficiency. Technical Specifications: Precision Control and Flexible Adaptability The rotating sample stage from Dandong Tongda Technology offers the following key technical parameters to meet the rigorous demands of scientific research and industrial testing: ParameterDescription Rotation Methodβ-axis (sample rotates within its own plane) Rotation Speed Range1 ~ 60 RPM (revolutions per minute) Adjustable based on experimental requirements Stepping PrecisionMinimum step width: 0.1º Supports high-precision positioning scanning Operation ModesConstant-speed rotation (for sample scanning), stepping, continuous, and other modes Adapts to various testing workflows and data acquisition needs Typical ApplicationsQuality control and R&D in industries such as environmental protection and electronics CompatibilityPrimarily used as an accessory for X-ray diffraction spectrometers (XRD) Application Scenarios: Serving the Environmental Protection and Electronics Industries This rotating sample stage is not merely a "showpiece" in the laboratory; it directly serves industries with high requirements for material analysis, such as environmental protection and electronics. In areas such as quality control, new product development, and failure analysis in these fields, it assists engineers and researchers in conducting more accurate phase analysis on samples of various forms, including powders, bulk materials, and thin films, ensuring the authenticity and reliability of data.