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In the field of lithium-ion battery research and development, understanding the dynamic changes in the microstructure of electrode materials during charge and discharge processes is crucial. Traditional offline detection methods cannot capture these changes in real time, while the emergence of in situ characterization techniques provides researchers with a powerful tool. Leveraging its expertise in X-ray diffraction (XRD) technology, Dandong Tongda Technology Co., Ltd. has developed an in situ battery accessory for battery research, offering an efficient window to explore the reaction processes inside the "black box" of batteries. Technical Principle: Dynamically Monitoring Microscale Changes in Battery Materials The core design goal of Dandong Tongda's originally battery accessory​ is to enable real-time monitoring of the evolution of the crystal structure of electrode materials using X-ray diffraction (XRD) technology while the battery is operating normally (during charge and discharge). This accessory typically needs to work in synergy with an electrochemical testing system (such as the LAND battery test system) and an X-ray diffractometer (such as Tongda Tech's TD-3500 model). It forms a specialized battery chamber that allows X-rays to penetrate and probe the electrode materials of the battery during operation. The key lies in the design of window materials (such as beryllium windows) with extremely low X-ray absorption rates on the battery components, ensuring effective incidence and emission of X-rays. Simultaneously, the accessory integrates necessary electrodes, insulation, and sealing components to ensure normal electrochemical reactions and maintain excellent sealing during testing. Key Functions and Application Value The value of this in situ battery accessory lies in its ability to help researchers intuitively and dynamically observe a series of microscopic changes in electrode materials during battery charge and discharge processes: Real-Time Observation of Phase Transition Processes: Many electrode materials undergo phase transitions during lithium-ion intercalation and deintercalation. In situ XRD can capture the formation, disappearance, and transformation of these phases in real time, which is critical for understanding the battery's reaction mechanisms. Monitoring Lattice Parameter Changes: By precisely tracking the shifts in XRD diffraction peaks, subtle changes in lattice parameters can be calculated, reflecting the expansion and contraction of the lattice. This is closely related to battery performance metrics such as voltage platforms and cycle life. Unveiling Capacity Decay Mechanisms: Capacity decay during battery cycling is often related to structural degradation of electrode materials, side reactions, and other factors. In situ monitoring can correlate electrochemical performance degradation with structural changes, providing direct insights for improving battery materials and optimizing design. Accelerating New Material Development: For evaluating novel electrode materials, in situ XRD technology can quickly provide key information on structural stability and reaction pathways, speeding up the R&D process.

Non-Destructive Testing (NDT) is an indispensable quality assurance technology in modern industry. It enables the detection of internal defects, structures, and property conditions of materials by utilizing characteristics such as acoustic, optical, magnetic, and electrical properties—all without damaging or affecting the performance of the tested object. Compared to destructive testing, NDT has the following characteristics: First, it is non-destructive, as it does not impair the performance of the test object. Second, it is comprehensive. Since the testing is non-destructive, it allows for 100% full inspection of the test object when necessary, which is impossible with destructive testing. Third, it is full-process applicable. Destructive testing is generally only suitable for raw materials, such as tensile, compression, and bending tests commonly used in mechanical engineering. Destructive testing is conducted only on raw materials for manufacturing. For finished products and in-service equipment, destructive testing cannot be performed unless they are no longer intended for use. In contrast, NDT does not damage the test object’s performance, making it suitable for full-process testing, from raw materials and intermediate manufacturing stages to final products, as well as for in-service equipment. Among the many manufacturers of non-destructive testing equipment, Dandong Tongda Technology Co., Ltd. has developed a variety of NDT instruments that approach or achieve internationally advanced levels, thanks to its solid technical expertise and innovative capabilities. Technical Features: Portability, Safety, and Intelligence Tongda Technology's NDT Portable X-ray Welding Testing Machine exhibit several outstanding features. Their X-ray generators adopt an anode grounding and fan-forced cooling design, making them compact, lightweight, portable, and easy to operate. In terms of safety performance, the equipment is equipped with a delayed exposure function, effectively ensuring operator safety. The devices operate on a 1:1 work-rest cycle, with a rational duty cycle design that ensures detection efficiency while extending the equipment’s service life. The company’s products incorporate Programmable Logic Controller (PLC) technology and a modular design concept, enhancing automation, improving anti-interference capabilities, and ensuring an extremely low failure rate. Application Areas: Wide Adoption Across Multiple Industries Tongda Technology's NDT Portable X-ray Welding Testing Machine are suitable for various industrial sectors, including national defense, shipbuilding, petroleum, chemicals, machinery, aerospace, and construction. These instruments are used to inspect the welding quality of materials and components such as ship hulls, pipelines, high-pressure vessels, boilers, aircraft, vehicles, and bridges, as well as the internal quality of various lightweight metals, rubber, ceramics, and other materials.

Dandong Tongda XAFS Spectrometer: A Material Structure Analysis Tool for the Laboratory Precise analysis of atomic material structure without dependence on synchrotron radiation sources. X-ray Absorption Fine Structure (XAFS) spectroscopy serves as an important technique for investigating the local atomic and electronic structures of materials, with broad applications in catalysis, energy research, and materials science. Conventional XAFS methodology primarily relies on synchrotron radiation sources, which presents challenges including limited beam availability, complex application procedures, and the necessity to transport samples to large-scale scientific facilities for analysis. The X-ray Absorption Fine Structure developed by Dandong Tongda Technology Co., Ltd. aims to integrate this sophisticated analytical capability into standard laboratory environments. Core Advantages and Practical Value This instrument's design addresses several critical challenges researchers encounter: Laboratory-Based Alternative to Synchrotron Radiation: Eliminates the traditional dependency on synchrotron radiation sources, enabling researchers to conduct routine XAFS testing efficiently within their own laboratory settings, thereby significantly enhancing research productivity. In-Situ Testing Capabilities: Supports integration of various in-situ sample chambers (e.g., electrochemical, temperature-variable), enabling real-time monitoring of dynamic changes in material local atomic structure under simulated operational conditions (such as catalytic reactions or battery charge/discharge processes), providing valuable insights into reaction mechanisms. Automated Operation for Enhanced Efficiency: An 18-position sample turret enables automatic sample changing, facilitating continuous automated measurement of multiple samples and unmanned operation, thereby streamlining batch sample screening and extended in-situ experiments. Broad Application Scope The TD-XAFS spectrometer finds applications across numerous fields requiring detailed investigation of material local structures: New Energy Materials: Analysis of valence state changes and structural stability in lithium-ion battery electrode materials during charge/discharge processes; investigation of coordination environments at catalytic active sites in fuel cells. Catalysis Science: Particularly suitable for studying precise coordination structures of nanocatalysts and single-atom catalysts, active site characteristics, and their interactions with support materials, even at low metal loadings (<1%). Materials Science: Investigation of disordered structures, amorphous materials, surface/interface effects, and dynamic phase transition processes. Environmental Science: Analysis of valence states and coordination structures of heavy metal elements in environmental samples (e.g., soil, water), crucial for assessing toxicity and mobility. Biological Macromolecules: Study of electronic structures and geometric configurations of metal active centers in metalloproteins and enzymes. Summary Dandong Tongda's TD-XAFS spectrometer represents a high-performance domestic benchtop testing platform designed for universities, research institutions, and corporate R&D centers. It successfully incorporates synchrotron-level capabilities into conventional laboratories, substantially reducing the accessibility barrier to XAFS technology. The instrument provides researchers with convenient, efficient, and flexible tools for microscopic material structure analysis, serving as a practical solution for scientists exploring the microscopic world of matter.

Originally battery accessories are experimental devices designed specifically for electrochemical testing, mainly used for in-situ characterization of battery materials during charging and discharging processes, commonly found in X-ray diffraction (XRD). 1. Core functions and application scenarios of originally battery accessories (1)Originally testing: Real time monitoring of material phase structure changes (such as crystal structure and phase transition) during battery charging and discharging can avoid sample contamination or state changes caused by battery disassembly. Support multiple electrochemical systems, including composites containing carbon, oxygen, nitrogen, sulfur, metal embedment, etc. (2) Multimodal compatibility: X-ray diffraction (XRD): used to analyze the structural evolution of positive/negative electrode materials during charge and discharge processes. 2. Structural composition and technical characteristics of originally battery accessories (1) Key components: Lower insulation cover: usually made of alumina ceramic or polytetrafluoroethylene material, containing coolant flow channels or resistance wire installation pipelines, used for temperature control. Upper conductive cover: connected to the lower insulating cover by bolts to form a closed space, with a beryllium window (diameter 15mm, thickness 0.1mm) at the top to transmit X-rays. Electrode system: originally battery accessories includes a lower electrode (with a support column) and a butterfly spring, which are electrically connected through compression fixation, simplifying the assembly process. (2) Technological innovation: Formal design: Compared with the traditional inverted method, the formal structure does not require flipping assembly, making it easy to operate in the glove box and ensuring the flatness of the beryllium window and diaphragm. Sealing and temperature control: Integrated coolant circulation pipeline and resistance wire heating device, suitable for a temperature range of -400 ℃ to 400 ℃. 3. Technical advantages of originally battery accessories (1) Simplified operation: Reduce assembly steps, decrease operating time inside glove boxes, and improve efficiency. The butterfly spring fixes the electrode without the need for rotation and tightening, avoiding interference with the simulated structure of the battery. (2) Performance improvement: The high X-ray transmittance (>90%) of beryllium windows ensures the detection signal strength. The multifunctional sample stage supports automatic sample changing and is suitable for high-throughput testing. Overall, originally battery accessoriesare important tools for electrochemical research, as their design optimizes the assembly process of traditional battery simulation structures and enhances the reliability and applicability of originally testing.

The multifunctional integrated measurement accessory of X-ray diffractometer (XRD) is a key component for achieving multi scene and multi-scale analysis. Through modular design, it can meet the needs of powder diffraction, small angle scattering, residual stress analysis, in-situ testing, etc. The following are common multifunctional integrated measurement accessories and their core functions: 1. The multifunctional integrated measurement accessory is a temperature and environmental control accessory (1) Function: Supports sample testing under high temperature, low temperature, and humidity control, used to study the crystal structure changes of materials under different temperature or humidity conditions. (2) Characteristics: Temperature range: from room temperature to 1500 ℃; Automatic temperature control and humidity regulation, suitable for in-situ catalysis, phase change analysis and other experiments. (3) Application: Phase transition of metal materials, analysis of polymer crystallinity, research on thermal stability of inorganic materials. 2. Automatic sampler and sample stage for multifunctional integrated measurement accessories (1) Function: Implement automatic switching and precise positioning of multiple samples to improve testing efficiency. (2) Characteristics: Supporting accessories such as sample rotation tables and micro diffraction tables for directional testing of complex samples; Collaborate with intelligent software to optimize measurement parameters and automatically identify sample configurations. (3) Application: Batch sample testing, thin film or micro area analysis. 3. Multi functional integrated measurement accessories suitable for two-dimensional detectors and high-speed one-dimensional detectors (1) Function: Support multi-dimensional data collection to enhance the analysis capability of complex samples. (2) Features: High speed one-dimensional detector, suitable for conventional powder diffraction; Two dimensional semiconductor array detector that can switch between zero dimensional, one-dimensional, or two-dimensional modes, expanding micro area or dynamic in-situ testing capabilities. (3) Application: 2D material crystal orientation analysis, in-situ reaction dynamic monitoring. 4. The multifunctional integrated measurement attachment is a residual stress and micro area diffraction attachment (1) Function: Conduct directional testing on the stress distribution or small areas on the surface of materials. (2) Features: Combining the θ/θ optical system with a microfocus X-ray source to achieve sub millimeter level micro diffraction; Non destructive measurement, used for stress analysis of metal workpieces and semiconductor devices. (3) Application: Fatigue testing of aerospace components, stress characterization of semiconductor thin films. 5. The multifunctional integrated measurement accessory is an intelligent calibration and automation control accessory (1) Function: Ensure testing accuracy and consistency through component recognition and automatic calibration technology. (2) Features: QR code automatic recognition attachment configuration, software guided optimal testing conditions; Fully automatic calibration program to reduce human operation errors. (3) Application: Complex attachment switching (such as high temperature+AXS mode), beginner friendly operation. The accessory design of modern X-ray diffractometers emphasizes modularity, intelligence, and automation. Through software and hardware collaboration, accessories can be quickly switched, parameters optimized, and data standardized. Future trends include higher precision micro area analysis capabilities, integrated solutions for in-situ dynamic testing, and intelligent accessory management systems driven by artificial intelligence.

The TD-5000 X-ray single crystal diffractometer is a high-performance analytical instrument developed and produced by Dandong Tongda Technology Co., Ltd. The following is a detailed introduction to the instrument: 1. Structure and technical characteristics of single crystal diffractometer (1) Core technical support Adopting the four circle concentric angle measuring instrument technology ensures that the center position of the angle measuring instrument remains constant during rotation, improving data integrity and accuracy. Equipped with a hybrid pixel detector, combined with single photon counting and hybrid pixel technology, it achieves low noise and high dynamic range data collection, suitable for challenging sample analysis. High power X-ray generator (3kW or 5kW), supporting the selection of Cu/Mo and other target materials, with a focal size of 1 × 1mm and a divergence of 0.5~1 mrad, meeting different experimental requirements. (2) Modularization and operational optimization The whole machine adopts PLC control technology and modular design to achieve plug and play of accessories, reducing the calibration process. The touch screen monitors the instrument status in real-time, and the one click acquisition system simplifies the operation process. The electronic lead door interlocking device provides dual protection, with X-ray leakage ≤ 0.12 µ Sv/h (at maximum power). 2. Technical parameters of single crystal diffractometer (1) Accuracy and repeatability 2 θ angle repeatability accuracy: 0.0001 ° Minimum step angle: 0.0001 ° Temperature control range: 100K~300K, control accuracy ± 0.3K. (2) Detector performance Sensitive area: 83.8 × 70.0 mm ² Pixel size: 172 × 172 μ m ², pixel spacing error<0.03% Maximum frame rate: 20 Hz, readout time of 7 ms, energy range of 3.5~18 keV. (3) Other key parameters X-ray tube voltage: 10~60 kV (1 kV/step), current 2~50 mA or 2~80 mA. Liquid nitrogen consumption: 1.1~2 L/hour (low-temperature experiment). 3. Application fields of single crystal diffractometer (1) Main research direction Crystal structure analysis: Analyze the atomic arrangement, bond length, bond angle, molecular configuration, and electron cloud density of single crystal materials. Drug crystallography: Study the crystal morphology of drug molecules, evaluate stability and biological activity. New material development: Analyze the three-dimensional structure of synthesized compounds to support material performance optimization. Nanomaterials and Phase Transition Research: Exploring the Characteristics of Nanocrystals and the Mechanism of Material Phase Transition. (2) Typical users School of Materials Science and Technology at Huazhong University of Science and Technology, Zhejiang University, University of Science and Technology of China, and other universities. Research institutions such as China Aerospace Science and Technology Corporation and China Shipbuilding Industry Corporation. 4. After sales service of single crystal diffractometer Provide original spare parts, home maintenance, remote diagnosis, and software upgrade services. Regular calibration services (in compliance with international standards) and providing users with operational and application training. 5. Accessories and extended functions for single crystal diffractometer (1) Optional attachments Multi layer film focusing lens (divergence of 0.5~1 mrad). Low temperature device (liquid nitrogen cooling). (2) Compatible devices It can be used in conjunction with X-ray fluorescence spectrometer (XRF), scanning electron microscope (SEM), etc. to achieve multi-scale material analysis. Overall, as a high-end single crystal diffractometer, the performance of TD-5000 has approached international standards, making it particularly suitable for universities, research institutes, and high-end material development needs. For more details, please refer to the official website of Dandong Tongda Technology Co., Ltd.

The rotating sample holder is an experimental device used for precise control of sample orientation, widely used in fields such as X-ray diffraction (XRD), spectroscopic analysis, and material testing. By rotating the sample, preferred orientation can be eliminated, measurement accuracy and repeatability can be improved. 1. The core function of the rotating sample holder (1) Eliminating preferred orientation: By rotating the sample plane (β axis), diffraction errors caused by coarse grains or texture are reduced, ensuring the reproducibility of diffraction intensity. (2) Multi position measurement: Conduct multi angle measurements on uneven samples (such as grains), average the data at different positions, and improve the accuracy and repeatability of the results. (3) Automated operation: Some devices support automatic rotation and sample change to improve testing efficiency (such as XRD fully automatic rotating sample holder). 2. Technical characteristics of rotating sample holder (1) Structural design: Drive mode: precise rotation is achieved through mechanisms such as motors, shafts, gears and racks, and some equipment is equipped with servo motors and encoders to correct the speed. Clamping device: The sample is fixed by a compression clamp, card slot, or clamping block, and the inner side is partially clamped with a rubber layer to adapt to different materials. Rotation parameters: The rotation speed can reach 1-60RPM, with a minimum step width of 0.1 º, and supports continuous or step modes. (2) Adaptability: Can be installed in XRD instruments, optical/electrical testing systems, etc., supporting multiple sample holders (such as reflective probes, in-situ battery accessories, etc.). Some devices support 360°rotation and are compatible with various measurement requirements such as optics and electronics. 3. Application scenarios of rotating sample holder (1) X-ray diffraction (XRD): Used for analyzing samples with texture or crystallography (such as metal materials, thin films), to eliminate the influence of preferred orientation on diffraction results. The fully automatic model can improve the efficiency of multi sample testing, reduce the number of door opening and closing times, and extend the lifespan of equipment. (2) Spectral analysis and material testing: Used for measuring uneven samples (such as grains) with reflective probes, by rotating and averaging spectral data at different positions. Adapt to in-situ high and low temperature environments, and support complex experimental conditions. (3) Multi functional experiment: By combining probes, electrical or optical sample holders, comprehensive testing of electrical characteristics, surface morphology, and other features can be achieved. The rotating sample holder​ solves the measurement error problem caused by the preferred orientation of traditional fixed sample stages by accurately controlling the sample orientation. At the same time, its automation and multi scene adaptability make it a key tool in fields such as XRD and spectral analysis. The specific selection needs to be matched with the corresponding model based on experimental requirements such as rotation accuracy, sample type, and automation level.

Dandong Tongda's Parallel Optical Film Measuring Accessory is a specialized component for X-ray diffractometers, significantly improving thin-film sample testing performance. Its elongated grating design effectively suppresses scattering interference, enhancing signal clarity for ultra-thin and nanomultilayer films. The accessory supports small-angle diffraction analysis (0°–5°), enabling precise measurement of film thickness and interface structures. Compatible with TD-3500, TD-5000, TD-3700, and TDM-20 diffractometers, it ensures consistent performance across platforms. Widely applied in semiconductor inspection, optical coating evaluation, and new energy material research, this tool addresses challenges like weak signals and background noise. As nanomaterials and semiconductor industries advance, the accessory is poised to play an increasingly critical role in cutting-edge research and quality control.

To understand the changes in crystal structure of samples during high-temperature heating and the changes in mutual dissolution of various substances during high-temperature heating. In situ high-temperature attachment is an experimental device used for in-situ characterization of materials under high temperature conditions, mainly used to study dynamic processes such as crystal structure changes, phase transitions, and chemical reactions of materials during high-temperature heating. The following provides a detailed introduction from the aspects of technical parameters, application scenarios, and precautions: 一、 Technical parameters of in-situ high-temperature attachments 1. Temperature range of in-situ high-temperature attachments Inert gas/vacuum environment: The maximum temperature can reach 1600 ℃. Standard environment: Room temperature to 1200 ℃ (as provided in the TD-3500 XRD accessory). 2. Temperature control accuracy of in-situ high-temperature accessories: usually ± 0.5 ℃ (such as in-situ high-temperature accessories), and the accuracy of some equipment above 1000 ℃ is ± 0.5 ℃. 3. Window materials and cooling methods for in-situ high-temperature attachments Window material: Polyester film (temperature resistant to 400 ℃) or beryllium sheet (thickness 0.1mm), used for X-ray penetration. Cooling method: Deionized water circulation cooling ensures stable operation of the equipment under high temperature conditions. 4. Atmosphere and pressure control of in-situ high-temperature attachments: Supports inert gases (such as Ar, N ₂), vacuum or atmospheric environments, and some models can withstand pressures less than 10 bar. The atmosphere gas flow rate can be adjusted (0.7-2.5L/min), suitable for corrosive gas environments. 二、 Application scenarios of in-situ high-temperature attachments 1. Material research on in-situ high-temperature attachments Analyze the changes in crystal structure (such as platinum phase transition) and phase transition processes (such as melting and sublimation) at high temperatures. Study the chemical reactions of materials at high temperatures, such as dissolution and oxidation. 2. Equipment adaptability of in-situ high-temperature attachments Mainly used in X-ray diffractometers (XRD), such as TD-3500, TD-3700, etc. It can also be used for in-situ tensile testing using scanning electron microscopy (SEM), with customized flange connections required. 三、 Precautions for using in-situ high-temperature accessories 1. Sample requirements for in-situ high-temperature attachments It is necessary to test the chemical stability of the sample in the target temperature range in advance to avoid decomposition into strong acids/bases or ceramic bonding. The sample shape must meet the requirements of the attachment (such as thickness 0.5-4.5mm, diameter 20mm). 2. Experimental operating procedures for in-situ high-temperature attachments The heating rate needs to be controlled (e.g. maximum 200 ℃)/ min@100 ℃) to avoid overheating and damaging the equipment. After the experiment, the sample needs to be cooled to room temperature to prevent structural damage.

一、Core functions and application scenarios of originally battery accessories Functional positioning of originally battery accessories: 1.Implement real-time testing during battery charging and discharging processes (such as XRD, optical observation, etc.) to avoid data loss or sample contamination caused by traditional disassembly. 2.Simulate the working environment of real batteries, support temperature control, electrolyte addition, and sealing guarantee. Typical application scenarios of originally battery accessories: 1.XRD in-situ testing: Analyze the crystal phase changes of electrode materials (such as LiFePO4) during charge and discharge processes. 2.Optical in-situ observation: Observe the surface reaction of the electrode through a beryllium window (polyester film). 3.High throughput screening: supports battery performance research under multiple conditions (temperature, pressure, electrolyte). 4.Widely used in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc.    二、Structural composition and material properties of originally battery accessories 1.Core components of originally battery accessories: Lower insulation cover: mostly made of alumina ceramic or polytetrafluoroethylene material, including installation chamber and coolant flow channel, supporting temperature control. Upper conductive cover: designed with through holes, bolted to the lower insulating cover to form a current path. Lower electrode: including top plate and support column, fixed by butterfly spring compression, simplifying the assembly process. Beryllium window (polyester film): diameter 15mm (customizable), thickness 0.1mm (customizable), used for X-ray penetration or optical observation. 2.Technical improvement of originally battery accessories: Formal assembly: replaces traditional inverted methods, simplifies the operation process, and reduces the impact of compression on the separator and positive electrode materials. Cooling and Heating: The lower insulation cover integrates a coolant channel or resistance wire pipeline, supporting temperature control of -400℃. Sealing design: The butterfly spring compresses and fixes the lower electrode, and cooperates with the installation seat airflow to blow and prevent frost and ice formation. 三、Technical advantages of originally battery accessories 1. Convenient operation of originally battery accessories: The formal structure reduces the operating time inside the glove box and lowers the assembly complexity. Modular design of components (such as replaceable beryllium windows and insulation sleeves) improves maintenance efficiency. 2. Performance parameters: Test range: Temperature range of 0.5-160℃, temperature resistance up to 400 ℃. Sealing: Supports long-term stable storage of electrolyte to avoid leakage. Compatibility: Suitable for X-ray diffractometers and other equipment.