Analyzer

1. X-ray instrument is easy to operate and fast to detect. 2. X-ray instrument is accurate and reliable, with excellent performance. 3. X-ray instrument has various functional accessories to meet the needs of different testing purposes.

Chinese version residual stress measurement and analysis software supports both linear and elliptical fitting methods. It employs complete stress equations without assuming zero shear stress, along with the elliptical fitting method, allowing simultaneous measurement of normal stress and shear stress values. Each measurement uses more than 9 ψ angles. Peak profile fitting includes Gaussian, Lorentzian, Pearson VII, parabolic, etc. Measurement results can simultaneously display normal stress values, shear stress values, as well as information such as peak intensity, integral width, and full width at half maximum (FWHM).

TD-RSD XRD Residual Stress Analyzer ±7MPa accuracy, dual-detector innovation, full-auto operation & powerful software. Optimize processes, enhance product reliability. Compact, efficient, leading solution.

1.The sample table is equipped with a load-bearing track that can measure up to 1 kg and has a diameter of 6 inches (up to 8 inches). 2. A vacuum suction cup device is installed on the sample table. 3. Application: Precise and rapid determination of the cutting angle of natural and artificial single crystals.

The portable X-ray residual stress analyzer is a non-destructive testing device based on X-ray diffraction technology. It is primarily used for measuring surface and near-surface residual stress distribution in materials such as metals and plastics, combining high precision with field adaptability.

PLC control system;Modular design, easy operation, and more stable equipment performance Lightweight design: Lightweight, suitable for rapid on-site measurement; High-precision measurement: High-precision full-closed-loop vector drive servo system control; Simple operation: Integrated Windows system or automation functions, supports one-click testing and real-time result display; Multi-functional compatibility: Measuring carbon steel, alloy steel, titanium alloy and other metals, glass, nickel-based materials and various composite materials; Speed optimization: Multi-channel silicon microstrip line array detector can provide noise-free performance, high-intensity measurement and rapid data acquisition.

1.XAFS is a powerful tool for studying the local atomic or electronic structure of materials. 2.XAFS application fields: industrial catalysis, nanomaterials, also quality analysis, heavy element analysis, etc 3.XAFS product advantage: Ultra-high resolution(as low as 0.5eV), Fluorescence pattern(low content high back base), Ultra-high luminous flux, ultra-low detection limits (as low as 0.3-0.5%, 10.1039/D2CC05081A)