High-resolution X-ray diffractometers analyze materials by capturing precise diffraction patterns, revealing crystal structure, lattice parameters, atomic positions, and chemical composition. The process involves sample preparation, instrument adjustment, pattern acquisition, and data analysis, offering critical insights for material research and development.

XRD maintenance requires strict environmental control (temperature, humidity), regular cooling system care, and X-ray tube upkeep. Key troubleshooting includes resolving high voltage startup, shutter operation, goniometer errors, and cooling water alarms to ensure instrument stability and data accuracy.

Powder XRD enables non-destructive residual stress analysis by detecting lattice strain via diffraction peak shifts, using the fixed ψ method and Hooke's law. It's vital for materials, aerospace, automotive, and manufacturing.

Benchtop X-ray Diffractometers are vital for quality control, providing non-destructive, precise analysis of material crystal structure, composition, and stress. They enable defect detection, process optimization, and failure analysis across R&D and production, enhancing efficiency, reliability, and compliance.

A single-crystal X-ray diffractometer reveals 3D atomic structure by analyzing X-ray diffraction patterns (Bragg's Law). Through data collection, Fourier transformation, and model refinement, it generates electron density maps to determine molecular configurations.

A quality single crystal for X-ray diffraction requires optimal solvent choice (moderate solubility/volatility), proper growth method (evaporation/diffusion), high sample purity, and a vibration-free environment to ensure well-defined morphology and minimal defects.

This article details a comprehensive three-pronged strategy to eliminate higher-order diffraction interference in X-ray single-crystal analysis. The methods involve hardware filtration at the source using monochromators and slits, parameter optimization during data collection to suppress detection, and software correction algorithms for residual effects in data processing. This combined approach ensures high-precision crystal structure determination by controlling intensity errors.

A premier X-ray crystal analyzer enabling precise exploration of material microstructures. Its advanced PLC control, modular design, and robust 5KW output ensure high reliability for global R&D and industrial quality control applications.

The TD-3500 X-ray Diffractometer ensures stable operation through full-chain PLC automation and a high-precision goniometer with real-time error correction, achieving exceptional angular reproducibility. It offers flexible configurations for diverse applications and performs comprehensive analyses across various critical fields.

The TD-3700 is a next-gen X-ray diffractometer featuring a high-speed array detector for intensity scores of times higher and rapid, noise-free analysis. Its transmission mode excels with trace samples. Modular and one-touch, it ensures easy operation and global compliance for diverse lab applications worldwide.

The TDM-20 benchtop XRD redefines performance standards with a groundbreaking 1200W power core—double the mainstream level. This enables faster, more precise analysis from R&D to QC in pharmaceuticals, materials science, mining, and food safety.