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Global X-ray diffractometer (XRD) has developed steadily in recent years, and China is a market with great development prospects.

The previous one detailed and complete introduction of the company's pre-sale, sale and after-sales service, today introduced is our company's product training related content.

In recent years, there has been a growing interest in the measurement of high-pressure biological samples. This is reflected in the development of new techniques for pressure measurement that are different from those implemented by DAC. One of them is the technique of freezing crystals under pressure.

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.

X-ray diffractometer (XRD) can be divided into X-ray powder diffractometer and X-ray single crystal diffractometer, the basic physical principle of the two is the same.

XRD is a means of research which is Diffraction by X-Ray diffraction of a material to analyze its diffraction pattern to obtain information such as the composition of the material, the structure or shape of atoms or molecules inside the material.

It is necessary to reduce the harmful residual stress and predict the distribution trend and value of residual stress. In this paper, the non-destructive testing method of residual stress testing is introduced.

Nondestructive testing is based on the development of modern science and technology. With the development of modern industry, the application of non-destructive testing is more and more popular.

X-ray crystallography is a technique used to determine the atomic and molecular structure of a crystal, where the crystal structure causes the incident X-ray beam to diffract into many specific directions.

Based on Bragg's Law, in-situ X-ray diffraction (XRD) can be used to monitor the change of phase and its lattice parameters in the electrode or electrode-electrolyte interface in real time during the charge-discharge cycle of a battery.