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China-made X-ray diffractometers (XRD) offer a cost-effective alternative to expensive imported models, delivering comparable accuracy, stability, and automation at 30–50% of the cost. Dandong Tongda Technology’s TD-series industrial XRD supports phase identification, crystal analysis, and non-destructive screening for metallurgy, cement, mining, and chemicals. Benefits include faster delivery, local after-sales support, one-click operation, and full lifecycle service. Ideal for SMEs and labs seeking budget-friendly, reliable quality control solutions.

XRD enables non-destructive phase analysis, crystallinity quantification, and residual stress measurement across cement, metals, chemicals, semiconductors, and pharmaceuticals. It supports end-to-end quality control, reducing defects and ensuring compliance. Benchtop and high-resolution systems are available for production or lab use.

XRD is now essential for global advanced manufacturing. Dandong Tongda offers high-stability, intelligent benchtop & floor-standing XRD systems for non-destructive, high-precision material analysis, supporting R&D and QC in batteries, semiconductors, and pharma with global compliance and low operating costs

X-ray diffractometers (XRD) enable precise phase analysis, non-destructive testing, and intelligent quality control. Dandong Tongda Science and Technology offers high-performance, cost-effective industrial XRD solutions with global service support, empowering metallurgy, mining, chemicals, and advanced materials industries to enhance product quality and reduce testing losses.

Choosing an XRD requires balancing performance (accuracy, speed), versatility (sample types), and usability with long-term value. Key factors include instrument reliability, safety, cost-effectiveness (considering both upfront price and operational costs), and strong supplier support—encompassing training, application guidance, and local service. Before purchase, also assess lab infrastructure, compare market options, and plan for future upgrades and maintenance.

Dandong Tongda Tech, a professional manufacturer of X-ray analysis instruments, provides high-precision crystal orienters. These key instruments ensure machining accuracy in the research and manufacturing of piezoelectric, optical, laser, and semiconductor crystals, supporting high-end industries.

In the field of materials science research, precise measurement serves as the key to unlocking material properties. The multi-functional integrated measurement accessory developed by Dandong Tongda Science and Technology Co., Ltd. is a high-precision tool designed to enhance X-ray diffraction analysis capabilities. This multi-functional integrated measurement accessory is specifically designed for installation on wide-angle goniometers. Its core mission is to accurately analyze plate materials, bulk materials, and thin films deposited on substrates. The accessory can perform various measurement tasks, including crystal phase detection, orientation degree analysis, and stress testing. It supports texture analysis, residual stress determination, and in-plane structure testing of thin films, providing comprehensive data support for materials research. The core technical features of this accessory are reflected in its multi-axis coordinated precision mechanical system and highly adaptable measurement methods. The multi-functional integrated measurement accessory supports pole figure measurements using either transmission or reflection methods, offering flexibility for different samples and testing requirements. For stress testing, it can employ both the side-inclination method and the normal-inclination method. For thin film samples, the accessory also enables in-plane rotation testing, allowing for in-depth analysis of film structures. Its precision mechanical system ensures high measurement accuracy and repeatability, with minimum step increments of 0.001° (for rotation axes) and 0.001mm (for translation axes). The application scope of the multi-functional integrated measurement accessory is extremely broad, covering almost all advanced manufacturing and R&D fields that require material structure analysis. In the field of metal materials, it is used for evaluating the collective organization of metals such as rolled plates; in ceramics, it focuses on assessing ceramic orientation. For thin film materials, the accessory can analyze the preferred crystal orientation of film samples and test the residual stress of multilayer films (evaluating properties such as film peeling). It can also analyze surface oxidation and nitridation films on high-temperature superconducting material films and metal plates, as well as multilayer films on glass, silicon, and metal substrates. Notably, it can also be applied to the analysis of macromolecular materials, paper, lens plating materials, and more, demonstrating its interdisciplinary application potential. Measurement Accessory

The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide

This Thin Film Attachment for X-ray diffractometers enables high-precision analysis of films on substrates. Its optimized optics suppress substrate interference, enhancing weak film signals for reliable data from nanometers to micrometers. Essential for R&D in electronics, semiconductors, and new energy.

TDTC-150: A portable X-ray stress analyzer for lab and on-site use. It rapidly measures residual stress, retained austenite, and analyzes alloy structure & phases. Key features include high precision, multi-mode analysis, and efficient data acquisition for diverse materials.