



It is equipped with the use of X-ray diffractometer, is a kind of diffractometer accessories. It is widely used in electrochemical systems containingcontaining carbon, oxygen, nitrogen, sulfur, metal intercalation,etc.
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Dandong Tongda's small-angle diffraction accessory precisely measures nano-multilayer film thickness (0°-5° range). Fully compatible with TD-series diffractometers, it offers plug-and-play convenience and 0.0001° reproducibility, empowering research in new energy and semiconductors.
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thin film attachment enables precise XRD analysis of nanometer/micrometer films, ideal for semiconductors, coatings and polymers. It enhances signal, reduces substrate interference and supports high-speed scanning, widely used in R&D and quality control with TD series diffractometers.
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Polarographic testing using transmission or reflection Stress testing can be performed using the tilt method or the same tilt method. Thin film testing (in-plane rotation of the sample)
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