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Diffractometer1. The accuracy of Diffractometer is high. 2. The application range of Diffractometer is wide. 3. Diffractometer is easy to operate, convenient and efficient.More- Single Crystal XRD1.The single crystal machine adopts PLC control technology. 2.Modular design, accessories plug and play. 3.Electronic lead door interlocking equipment with double protection. 4.Single crystal X-ray tube: a variety of targets can be selected, such as Cu, Mo,etc. 5. Single crystal adopts four-circle concentric technology to ensure that the center of no goniometer remains unchanged.More
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- Powder Diffractometer1. Detector type: Array detector or SDD detector; 2. PLC automatic control calculus, Integration mode conversion, PLC automatically performs PHA, dead time correction 3.Sample measurement type: powder sample, liquid samples, melt-state samples, viscous samples, loose powders, bulk solid samples 4.Available with a variety of diffractometer accessories 5.Maximum output powder: 3kWMore
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Thin Film Diffraction
- Tongda
- Liaoning, China
- 1—2 months
- 100 units per year
Introduction to Thin Film Attachment
X-ray testing methods are widely used to characterize a range of thin film materials. The physical structural characteristics of thin films make their analysis quite a bit different from that of the powder XRD analysis normally performed.
For example, if a thin film has a strong preferred orientation, only the diffracted rays of certain planes will be observable, which means that characterization is a big problem when compared to powder samples. The thin film attachment helps to improve characterization accuracy through longer collimator slits that effectively reduce radiation scatter, filter unwanted substrate interference, and enhance the diffraction signal of the film itself.
Besides being able to minimize low signal intensity and reduce the high background level, this attachment is specially crafted for the analysis of very small or extremely thin samples, and it is ideal for materials with depths in the range from microns to nanometers.
Applications of Thin Film Attachment
Thin film attachments are a reliable and common method for characterization of semiconductor materials and they are widely implemented in R&D and production departments at companies working in the field of materials science, nanotechnology, and semiconductor materials, as well as in production departments. The thin film attachment method allows different kinds of thin film samples to be studied very easily, especially in cases where the structural characterization of the thin film is concerned. It gives the opportunity to carry out structural and chemical characterization, the degree of crystallinity, the analysis of the texture and orientation of the material, the detection of the presence of different phases and the measurement of stress.
Thin film attachment technique has become one of the main methods in the production and analysis of materials. Here are the main industries or material groups that are using this method:
Metal and Ceramic Materials
For example, using thin film diffraction methods, you can detect preferred crystallographic orientation of a metal sheet rolled out or check whether ceramic is aligned in a certain direction and whether there is any stress after firing (for example, resistance to abrasion, ease of machining, etc.).
Laminated and Functional Coatings
Using thin film diffraction techniques it is possible to study the structures of various coatings such as magnetic films, high strength coating films, high temperature superconductors and also the boundaries between different layers, such as on glass, silicon wafers, or metals.
Through the thin film method, scientists have a means to analyze internal stress, orientation of stress and the extent to which stress was relaxed, in the bulk as well as the surface of the materials, e.g. in films of optical lenses or coatings on various items or the paper surface treatment layer.
Advantages of Thin Film Attachment
High-Efficiency Data Acquisition: Supports high-speed scanning and rapid data processing, enhancing testing efficiency and suitability for high-throughput experimental environments.
User-Friendly Operation and Stability: The attachment’s structural design simplifies calibration procedures, enabling quick sample positioning and testing. Its core components are optimized for extended service life and compatibility with mainstream equipment such as the TD series X-ray diffractometers.
Powerful and Intelligent Functionality: Integrates multiple measurement modes (e.g., transmission/reflection pole figure testing, stress analysis) and enables automated control and data analysis via software, significantly improving detection accuracy and operational intelligence.
Through technological innovation, the thin film attachment addresses key challenges in thin film material characterization and delivers a reliable solution for advanced material R&D and quality control.
Why Choose Tongda
In his role as a contractor at the National Major Scientific Instruments and Equipment Development Special Project sponsored by the Ministry of Science and Technology of China, Prof. Tongda is organizing a joint effort of a total of seven renowned institutions, such as Sun Yat-sen University and the Shenyang Institute of Computing Technology CAS. In 2013, we established an Academician Workstation in partnership with Academician Chen Xiaoming. After eight years of dedicated R&D, we achieved a historic milestone in 2021 by launching China's first domestically developed X-ray single crystal diffractometer with fully independent intellectual property rights—marking a breakthrough from "0 to 1" in this field.
As a company in which 1 out of 3 workers is in the R&D department—considerably higher than the industry standard—we have developed and registered not only 23 patents but also 7 software copyrights. Our product range is so complete that you will find there TD Series Diffractometers, Benchtop Diffractometers, X-ray Fluorescence Spectrometers, X-ray Single Crystal Diffractometers, Crystal Orientation Instruments, and Crystal Analyzers.
The Tongda AI Automatic Diffractometer has taken a giant leap forward by combining precision robotic manipulators with artificial intelligence technology. This diffractometer is equipped with a feature that can perform sample handling independently for different types of samples: powders, thin films, and bulk materials. One can manage the diffractometer through a mobile app remotely while the door opens and closes automatically so that safety can be maximized. A modular design of the machine makes it easy to upgrade or service as well as the possibility of expansion.
When you work with our company Dandong Tongda Science & Technology Co., Ltd. you get not only high-performance devices but you also become a member of the exclusive circle of our Academician-led team that will continuously support you technically through the whole lifecycle of your product development.
You will be able rely on our quick reaction capability and support that comes as a result of 30% of our staff working on R&D.
Our experts have gathered an extensive experience of integrating various systems, that has been verified by national-level major projects.We ensure a high level of quality to serve even most stringent requirements and we can back that by references of our multiple prestigious clients that trust us as their strategic supplier.
