



thin film attachment enables precise XRD analysis of nanometer/micrometer films, ideal for semiconductors, coatings and polymers. It enhances signal, reduces substrate interference and supports high-speed scanning, widely used in R&D and quality control with TD series diffractometers.
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Thin film measuring accessory from Dandong Tongda Technology enhances performance by incorporating longer grating sheets. This design effectively filters out scattered radiation, reducing interference from substrate signals while significantly strengthening the thin film diffraction signals.
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