XAFS Spectrometer achieves synchrotron-level data quality with >4M photons/s/eV flux, <0.1% stability, and a 1% detection limit. It empowers research across energy, catalysis, and materials science.
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1.XAFS is a powerful tool for studying the local atomic or electronic structure of materials. 2.XAFS application fields: industrial catalysis, nanomaterials, also quality analysis, heavy element analysis, etc 3.XAFS product advantage: Ultra-high resolution(as low as 0.5eV), Fluorescence pattern(low content high back base), Ultra-high luminous flux, ultra-low detection limits (as low as 0.3-0.5%, 10.1039/D2CC05081A)
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