TDM-20 Mini X-Ray Diffractometer is a high-performance benchtop analytical instrument developed and manufactured by Dandong Tongda Technology Co., Ltd.​ It is primarily used for phase analysis of polycrystalline materials such as powders, solids, bulk specimens, and pastes. Utilizing the principle of X-ray diffraction, the instrument enables qualitative and quantitative analysis, crystal structure analysis, and other functions. It finds extensive applications across various fields including industry, agriculture, defense, pharmaceuticals, mineralogy, food safety, petroleum, and educational research. TDM-20 Benchtop X-ray Diffractometer breaks through the conventional 600W limitation, delivering a maximum output power of 1200W for high-power performance. Additionally, it incorporates a high-frequency, high-voltage power supply, resulting in lower overall power consumption. It boasts high-precision goniometer technology with an angular repeatability of 0.0001°, a diffraction peak position measurement accuracy of 0.001°, and a full-profile diffraction angle linearity of ±0.010°.The instrument incorporates an advanced control system based on PLC (Programmable Logic Controller) technology and a modular design for precise operation. For detection, it can be equipped with either a proportional detector or a new high-performance array detector, significantly enhancing overall performance and data acquisition speed. The TDM-20 also offers highly flexible configuration options, supporting a variety of accessories such as a rotating sample stage, a 1D array detector, and a 6-position automatic sample changer. TDM-20 Mini X-Ray Diffractometer is further characterized by its significant advantage of being compact and portable, with a small footprint and low weight. It is recognized as one of the smallest benchtop X-ray diffractometers globally, rendering it highly suitable for laboratory environments where space is limited. Furthermore, the instrument is provided with a triple interference-free isolation protection scheme. The X-ray leakage radiation is maintained at ≤ 0.12 μSv/h, ensuring compliance with the GBZ 115-2002 protection standard. Hence, the use of the TDM-20 Mini X-Ray Diffractometer is confirmed to be safe and reliable. TDM-20 Mini X-Ray Diffractometer integrates high power, high precision, and a compact design into a single platform. It transcends the limitations of traditional, large-scale X-ray diffractometers, delivering an efficient, convenient, and reliable material analysis solution for various industries. With its advanced technical performance, comprehensive service support, and flexible operation, the TDM-20serves as a powerful tool for laboratory-based material analysis. If you have any requirements for X-ray diffraction equipment, we welcome you to choose the products from Dandong Tongda Science and Technology Co., Ltd.

The auto sample changer adopts an imported stepper motor drive and a programmable logic controller (PLC) as the core control system. The selection of these two key components significantly ensures the precision, stability, and long-term reliability of the equipment's operation. The workflow of the auto sample changer is designed to be simple and efficient: The operator pre-loads up to six samples sequentially into designated positions of the sample changer. After setting the measurement parameters via the control system, the sample changer begins operation. Following program instructions, it automatically and accurately delivers each sample in sequence to the measurement position of the X-ray diffractometer.Once the measurement of one sample is completed, the device automatically removes it and swiftly delivers the next sample until all samples are measured. Measurement data is automatically saved, facilitating subsequent review and analysis while reducing recording errors that may arise from manual operations.The entire process requires no manual intervention, allowing the operator to free up time for other tasks and avoiding potential fatigue-related errors from prolonged operation. In addition to the basic auto sample changing function, the equipment also boasts several noteworthy features: Efficiency Enhancement: Enables unattended continuous auto measurement, making it particularly suitable for rapid screening of batch samples or sequential analysis over long periods. Data Consistency: The automated process reduces human intervention, helping to improve the repeatability and comparability of measurement data. Ease of Operation: The PLC-based control system is typically stable and user-friendly, lowering the operational threshold. Flexible Application: Primarily used in fields such as environmental protection, electronics/batteries, and other areas requiring material analysis technologies. This auto sample changer primarily serves the application field of X-ray diffraction (XRD) analysis. Dandong Tongda Science and Technology Co., Ltd. has accumulated experience in the field of analytical instruments. Its TD series of analytical instruments and non-destructive testing equipment are applied in various material research fields. This 6-position (or 12-position) auto sample changer reflects the company's approach of integrating automation technology into traditional testing equipment to enhance overall efficiency. As a functional accessory, it works in coordination with X-ray diffractometers, enhancing the automation capabilities of the host instrument.

The TDM-20 high-power X-ray diffractometer (benchtop XRD) is mainly used for phase analysis of powders, solids, and similar paste like materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. It is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. It produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!

The TD-3700 series high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply.

Originally Battery Accessory is a device used for electrochemical system research, belonging to X-ray diffractometer accessories，which allows real-time and dynamic monitoring and analysis of the battery under specific conditions. Widely used in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc.

Multifunctional integrated measurement accessory is an instrument accessory that can measure multiple parameters. It is a measurement accessory for X-ray diffractometer, mainly used to improve measurement efficiency, increase measurement functions, and improve instrument maintenance. Used for analysis and testing of various materials in fields such as chemical engineering, machinery, geology, minerals, metallurgy, building materials, ceramics, petrochemicals, pharmaceuticals, etc. Multifunctional integrated measuring accessories play an important role in various fields, providing strong support for scientific research and industrial production.

The TDM-20 X-ray diffractometer is mainly used for phase analysis of powders, solids, and similar paste like materials. The X-ray diffractometer can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. X-ray diffractometer is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research. Benchtop XRD is an experimental equipment used for analyzing the crystal structure of materials. Benchtop XRD determines the crystal structure, lattice parameters, and phase composition of the material by emitting X-rays and measuring the diffraction angle and intensity after their interaction with the sample.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries! It is a powerful analytical tool widely used in fields such as materials science, chemistry, physics, and geology.

The TD-3700 X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDDdetectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. The TD-3700 X-ray powder diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The TD-3700 X-ray powder diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with high-performance detectors. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period.

X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic,organic,and metal complexes,and to analyze the structure of special materials such as twinning, non commensurate crystals,quasicrystals,etc.Determine the accurate three-dimensional space (including bond length, bond angle,configuration,conformation,and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice;Single crystal X-ray diffractometer can provide information on the crystal cell parameters,space group,molecular structure,intermolecular hydrogen bonding and weak interactions,as well as structural information such as molecular configuration and conformation.Single crystal XRD is widely used in analytical research in chemical crystallography,molecular biology,pharmacology,mineralogy,and materials science. Single crystal XRD has high precision: 2θ angle repeatability accuracy: 0.0001°; Minimum step angle: 0.0001°; Temperature control range:100K-300K Control accuracy: ±0.3K Single crystal angle measuring instrument selects four concentric scanning circles. Single crystal XRD adopts low-temperature configuration. The company's technical personnel have completed the installation and debugging of the foreign single crystal X-ray diffractometer,and the test results have greatly satisfied foreign users. At the same time,the functionality,stability,and after-sales service of the instrument have received unanimous praise from foreign users. Overall, X-ray single crystal diffractometer plays an irreplaceable role as an important scientific instrument in research and application in multiple disciplines. With the continuous advancement and innovation of technology, we believe that in the future,single crystal XRD will demonstrate their unique value and potential in more fields.

The multifunctional integratedmeasuring accessories are used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Multifunctional integrated measuring accessories are typically designed to enhance the functionality of X-ray diffractometer , enabling them to adapt to more diverse testing needs. There is a close relationship between multifunctional integrated measurement accessories and X-ray diffractometer. These accessories not only enhance the functionality and performance of X-ray diffractometer, but also improve its ease of operation and safety. In practical applications, users can choose suitable accessories according to their specific needs to expand the application scenarios of X-ray diffractometer and improve measurement efficiency.