The TDM-10 desktop X-ray diffractometer is a compact and high-precision phase analysis device. The following is a detailed introduction to the product: 1. Core functions and applications of TDM-10 desktop X-ray diffractometer (1) Phase analysis Suitable for qualitative and quantitative analysis of powder, solid, paste like materials, and thin film samples, it can identify the crystal structure, phase composition, and crystallinity in the samples. (2) Crystal structure analysis It can measure grain size, crystal orientation, macroscopic/microscopic stress, and structural properties of materials. (3) Industrial and Research Applications Widely used in fields such as geology, materials science, chemistry, biology, medicine, and nuclear industry, suitable for rapid laboratory testing and teaching demonstrations. 2. Technical characteristics of TDM-10 desktop X-ray diffractometer (1) Compact design and efficient performance Small size, light weight, low power consumption, easy to operate, suitable for desktop environments. Equipped with high-frequency and high-voltage power supply, the power can reach 1600W (refer to TDM-20 model), ensuring X-ray stability. (2) High precision measurement The measurement accuracy of diffraction peak position reaches 0.001 °, with excellent angular repeatability, meeting the requirements of high-precision analysis. By using the principles of Debye Scherrer geometry and Bragg's law, the crystal reflection signal is recorded through conical surface diffraction, achieving accurate phase identification. (3) Intelligent Control and Data Processing Computer controlled data acquisition, supporting real-time data acquisition and processing under Windows system, with an intuitive operating interface. Can be paired with array detectors (referring to the high-performance detector technology of TDM-20) to improve detection efficiency and sensitivity. 3. Applicable scenarios of TDM-10 desktop X-ray diffractometer (1) Research field Universities and research institutes are used for material research and development, crystal structure analysis, and characterization of nanomaterials. (2) Industrial applications Mineral identification, drug composition analysis, food safety testing (such as crystal impurity screening), etc. (3) Teaching Demonstration Easy to operate desktop device, suitable for student experimental teaching, covering the basic theory and practical operation of phase analysis. 4. Technical parameters of TDM-10 desktop X-ray diffractometer (1) Measurement accuracy: diffraction peak position accuracy of 0.001 ° (2) Control method: Computer control (Windows system) (3) Power supply: Low power design, high-frequency high-voltage power supply (4) Detector: Supports array detectors or proportional detectors (refer to TDM-20 accessories) (5) Sample stand: can be paired with a rotating sample stand or an automatic sample changer (optional accessory) 5. Product advantages of TDM-10 desktop X-ray diffractometer (1) High cost-effectiveness: Domestic equipment has outstanding performance and is much cheaper than imported equipment, making it suitable for laboratories with limited budgets. (2) Quick detection: Optimize calibration process, shorten testing time, and improve experimental efficiency. (3) Scalability: Supports multiple accessories (such as low-temperature cooling systems, in-situ battery accessories, etc.), which can be extended to special scenario analysis. 6. Related series and comparison of TDM-10 desktop X-ray diffractometer TDM-20 model: TDM-20 is an upgraded version of TDM-10, with higher power (1600W), new high-performance array detectors, support for automatic sample changers and other accessories, suitable for more complex industrial and scientific research needs. Other models: The Dandong Tongda TD series also includes high-resolution diffraction instruments such as TD-3500 and TD-3700, as well as TDF series crystal analyzers, covering multidimensional analysis needs. The TDM-10 desktop X-ray diffractometer has become the preferred equipment for laboratory phase analysis due to its compact design, high-precision measurement, and intelligent operation. It has a wide range of application scenarios, especially suitable for scientific research and industrial environments that require fast and accurate detection. If higher configuration is required, TDM-20 or other models in the same series can be considered.

The TDM-20 desktop X-ray diffractometer is a compact desktop device mainly used for material phase analysis and crystal structure research. 1. The core functions of TDM-20 desktop X-ray diffractometer Phase analysis of TDM-20: TDM-20 can perform qualitative/quantitative analysis on polycrystalline samples such as powders, solids, and paste materials. Crystal structure analysis of TDM-20: Based on the principle of X-ray diffraction, TDM-20 supports the analysis of crystal structures of metal samples, minerals, compounds, etc. 2. Technical characteristics of TDM-20 desktop X-ray diffractometer The high power and performance of TDM-20: using high-frequency high-voltage power supply, the power is increased to 1600W. Equipped with new high-speed array detectors or proportional detectors to improve data acquisition efficiency and accuracy. Convenient operation of TDM-20: The device is small in size and light in weight, suitable for compact laboratory spaces; Supports fast calibration and testing, with simple circuit control and easy installation and debugging. The accuracy and stability of TDM-20: the angle repeatability is as high as 0.0001 °, and the full spectrum diffraction angle linearity is ± 0.01 °. Scalability of TDM-20: TDM-20 can be equipped with a 6-digit automatic sample changer, a rotating sample stage, a low-temperature cooling system, and in-situ high/medium low temperature accessories to meet diverse testing needs. 3. Application scenarios of TDM-20 desktop X-ray diffractometer The research fields of TDM-20 include crystal structure characterization and phase transition analysis in materials science, geology, and pharmaceutical research. Industrial applications of TDM-20: pharmaceutical industry drug consistency assessment, mineral identification, petrochemical catalyst analysis, food safety testing (such as crystal composition determination). Education and National Defense of TDM-20: Rapid Phase Identification in University Teaching Experiments and National Defense Material Development. 4. Manufacturers and accessories of TDM-20 Manufacturer: Dandong Tongda Technology Co., Ltd. Optional accessories: one-dimensional array detector, proportional detector, 6-digit automatic sample changer, rotating sample stage, graphite bent crystal monochromator, etc. Overall, TDM-20, with its high power, high precision, and compact design, has become an efficient tool for laboratory phase analysis and is widely used in scientific research, industry, and teaching fields.

The TD-3500X-ray diffractometer (TD-3500XRD) is a high-performance analytical instrument produced by Dandong Tongda Technology Co., Ltd. It is mainly used for the analysis of crystal structure, phase composition, and material properties. 1. Core technical parameters of TD-3500X-ray diffractometer The X-ray source of TD-3500 diffractometer: Provide Cu K α or Mo K α target material selection, with adjustable tube voltage range of 10~60kV and tube current range of 2~80mA, supporting high-frequency and high-voltage solid-state generators or power frequency generators. Equipped with an imported Siemens PLC control system, it achieves automated light gate switching, tube pressure/flow regulation, and X-ray tube training functions with high stability. Angle measurement system of TD-3500X-ray diffractometer: Adopting a θ -2 θ vertical structure with a diffraction circle radius of 185mm (adjustable to 285mm), it supports testing of liquid, sol, powder, and block samples. The angular resolution reaches 0.0001 degrees, the step accuracy is 0.0001 degrees, and the angle measurement range is -5 °~165 ° (2 θ), suitable for high-precision crystal analysis. Detector of TD-3500X-ray diffractometer: Optional proportional detector (PC) or scintillation detector (SC), with a counting linear range of ≥ 700000 cps and background noise ≤ 1cps. Equipped with dual crystal monochromator technology, effectively suppressing the K α 2 component and improving the monochromaticity of the radiation. Control and software of TD-3500X-ray diffractometer: A human-machine interaction system based on imported PLC and true color touch screen, supporting parameter setting, real-time monitoring, and fault diagnosis. The software has functions such as phase diagram matching, stress analysis, and grain size calculation, and can generate standardized reports. 2. Technical characteristics and advantages of TD-3500X-ray diffractometer High precision and stability of TD-3500X-ray diffractometer: The angle measuring instrument adopts imported high-precision bearings and a fully closed-loop servo drive system, with automatic correction of motion errors and repeatability better than 0.0006 °. PLC modular design has strong anti-interference ability, supports long-term fault free operation, and can expand multiple functional accessories. Safety and protection of TD-3500X-ray diffractometer: The electronic lead door interlocking device achieves dual protection, with the light gate and lead door interlocked to ensure safe operation. Equipped with a circulating water cooling system (split or integrated), it automatically controls the water temperature and monitors the temperature of the X-ray tube to avoid blockage. Intelligent operation of TD-3500X-ray diffractometer: The touch screen displays the instrument status in real-time, supports parameter settings (such as scanning range, step size, sampling time), and remote fault diagnosis. Preset scanning modes (θ -2 θ, single crystal diffraction, thin film analysis) to meet different sample requirements. 3. The main application areas of TD-3500X-ray diffractometer Material analysis of TD-3500X-ray diffractometer: Qualitative/quantitative analysis of phases, identification of crystal structure, determination of grain size and crystallinity. Phase composition and stress analysis of materials such as semiconductors, ceramics, metals, polymers, etc. Research experiment of TD-3500X-ray diffractometer: Analysis of film orientation, phase transition research of catalyst/battery materials, and characterization of nano material structures. Biological crystals, macroscopic/microscopic stress measurement, and material temperature evolution analysis (requiring the use of a thermal analyzer). Typical user case of TD-3500X-ray diffractometer: Wuhan University of Technology (New Material Structure Research), Beijing Institute of Technology (Oxide Semiconductor Phase Transformation Research), Tongji University (Titanium Alloy Structure Analysis), etc. 4. Key points for operation and maintenance of TD-3500X-ray diffractometer Operation process of TD-3500X-ray diffractometer: Start up and preheat for 10-15 minutes → Sample preparation and fixation → Set scanning parameters (such as 2 θ range, step width, tube pressure/flow) → Start scanning → Data analysis. Support the combination of SEM and EDS to achieve comprehensive characterization of micro/nano structures and components. Widely used in materials science, chemistry, physics and other fields, it is the preferred tool for crystal structure and phase analysis.

The TD-3700 X-ray diffractometer is a high-performance and high-resolution X-ray analysis device, characterized by fast analysis, convenient operation, and strong safety. 1. Technical characteristics of TD-3700 X-ray diffractometer (1) Core configuration of X-ray diffractometer Equipped with a high-speed one-dimensional array detectoror SDD detector, using mixed photon counting technology, there is no noise interference, and the data acquisition speed far exceeds traditional scintillation detectors (with a speed increase of more than a hundred times), and it has high dynamic range (24 bits) and excellent energy resolution (687 ± 5 eV). Equipped with an imported programmable logic controller (PLC), it achieves automated control, low failure rate, strong anti-interference ability, and ensures stable operation of the high-voltage power supply for X-ray tubes. (2) Angle measuring system of X-ray diffractometer Adopting a θ/θ vertical angle measuring instrument structure, the sample is placed horizontally and supports testing of various forms of samples such as liquid, sol, powder, and block, to avoid samples falling into the bearing and causing corrosion. The scanning range of 2 θ angle is -110 °~161 °, with a minimum step of 0.0001 °, a repeatability of ± 0.0001 °, and an angle linearity of ± 0.01 °, suitable for high-precision structural analysis. Supports both conventional reflection mode and transmission mode, with the latter having higher resolution and suitable for trace samples (such as powders with low yields) and structural analysis. (3) The X-ray generation system of X-ray diffractometer The rated power can be selected from 3kW or 5kW, with a tube voltage range of 10~60 kV, a tube current of 2~80 mA, and a stability of ≤ 0.005%. Standard Cr/Co/Cu target material, suitable for different material analysis requirements. 2. Software and Control of TD-3700X-ray Diffraction Instrument (1) Control software for X-ray diffractometer Full Chinese interface, supports Windows XP system, can automatically regulate tube pressure, tube flow, and light switch, with X-ray tube aging training function. The application software provides processing functions such as peak searching, background subtraction, K α 2 stripping, integration calculation, spectrum comparison, etc. It supports inserting text annotations and various scaling operations. (2) Operation safety of X-ray diffractometer Dual protection system (linkage of light gate and lead gate), X-ray leakage rate ≤ 0.1 μ Sv/h, in compliance with national standards. Equipped with a circulating refrigeration system (split or integrated), automatic temperature control and monitoring of water flow rate, refrigerant pressure, etc., to avoid X-ray tube blockage. 3. Application scenarios of TD-3700X-ray diffractometer (1) The core function of X-ray diffractometer Qualitative/quantitative analysis of phases, analysis of crystal structure, determination of grain size and crystallinity. Macroscopic/microscopic stress detection, material orientation analysis (such as thin films, bulk samples). (2) Applicable fields of X-ray diffractometer Materials Science: Ceramics, Metals, Polymers, Superconducting Materials, etc. Environment and Geology: Soil, Rock, Mineral Analysis, and Petroleum Logging. Chemical and Pharmaceutical: Identification of Pharmaceutical Ingredients, Crystallinity Testing of Chemical Products. Other: food inspection, electronic materials, magnetic materials, etc. 4. Product advantages of TD-3700X-ray diffractometer (1) Modular design: The hardware system is modular and supports multiple accessories (such as optical accessories and special function software) that are plug and play, without the need to manually adjust the optical path. (2) Efficient and safe balance: One click operation simplifies the process, while reducing the risk of failure through PLC control, protection system, and automatic alarm functions (such as overcurrent protection and overtemperature warning). (3) Localization breakthrough: The TD series is the only XRD equipment in China that uses programmable controller technology, with performance comparable to imported models (such as D8 ADVANCE) and significantly reduced failure rates. The TD-3700X-ray diffractometer is a powerful and widely used X-ray diffractometer. Its high-performance detector, precise angle measuring system, powerful software functions, and wide range of application fields make it an important tool in scientific research and industrial production.

The TDM-20 high-power X-ray diffractometer(Benchtop XRD)is mainly used for phase analysis of powders, solids, and similar paste materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. Benchtop XRD is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research. 1、Core features of TDM-20 benchtop X-ray diffractometer(Benchtop XRD)： The loading of the new high-performance array detector has greatly improved the overall performance of the device, with a small size and light weight; The whole machine is integrated into the desktop size (usually ≤ 1m³), saving space and suitable for small laboratories or teaching environments;The working power of high-frequency and high-voltage power supply can reach 1600W; Quick analysis, able to calibrate and test samples quickly; By using high-performance detectors (such as two-dimensional detectors) and optimizing the optical path, sample scanning can be completed in a few minutes; Simple circuit control, easy to debug and install; The angle repeatability can reach 0.0001; Low power consumption and safety, using low-power X-ray tubes (such as ≤ 50W), equipped with multiple radiation protection, no need for special shielding rooms; User friendly, equipped with automation software, supporting one click operation, real-time data visualization, and standard database (such as ICDD PDF) comparison. 2. Typical application scenarios of TDM-20 benchtop X-ray diffractometer(Benchtop XRD): Materials Science of X-ray diffractometer（Benchtop XRD）: Rapid identification of crystal structure and phase composition (such as metals, ceramics, polymers). Materials Science of X-ray diffractometer（Benchtop XRD）: Industrial site testing of the crystal purity of raw materials or finished products (such as pharmaceuticals and battery materials). Materials Science of X-ray diffractometer（Benchtop XRD）: Undergraduate experimental teaching, visually demonstrating the Bragg diffraction principle. Materials Science of X-ray diffractometer（Benchtop XRD）: Mineral composition analysis of cultural relics or preliminary screening of field samples. 3.Technical parameters of TDM-20 benchtop X-ray diffractometer（Benchtop XRD）: Project : parameter range X-ray source:Cu target (λ=1.54 Å), Mo target optional Voltage/current:10-50 kV/0.1-2 mA Angle measuring instrument range:0-90 ° 2θ (some models can be extended) Angle resolution:≤ 0.01 ° Detector type: one-dimensional linear or two-dimensional surface detector Sample size: Powder (milligrams), film or block 4.Advantages and limitations of TDM-20 benchtop X-ray diffractometer（Benchtop XRD）: Advantages: Low cost (about 1/3-1/2 of large XRD), easy maintenance. Support non-destructive analysis and simple sample preparation (such as directly placing powder). limitations: The resolution and sensitivity are slightly lower than high-end devices, and may not be suitable for ultra-fine structural analysis. Extreme condition testing (such as high-temperature/high-pressure in-situ experiments) is usually not feasible.

The TD-3500 X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!   The TD-3500 X-ray diffractometer adopts an X-ray generator (high-frequency and high-voltage solid-state generator, power frequency generator optional), which has a high degree of automation, extremely low failure rate, strong anti-interference ability, good system stability, and can extend the service life of the whole machine. PLC and computer interface automatically control the opening and closing of the light gate, automatically control the rise and fall of tube pressure and tube flow, and have the function of automatically training X-ray tubes. Real time online monitoring using a touch screen to display instrument status. The TD-3500 X-ray diffractometer adopts advanced recording control unit, PLC control circuit, advanced PLC control technology and true color touch screen to achieve human-computer interaction. The system hardware adopts modular design concept, greatly increasing the anti-interference ability of the system and making it more stable. Due to the use of imported Siemens PLC control circuits with high precision and automation, the system can operate stably for a long time without any faults. The TD-3500 X-ray diffractometer system has the following advantages over the microcontroller circuits used by other companies: Simple circuit control, easy to debug and install; Due to its modular design, the system maintenance is very simple, and users can repair and debug it themselves without the need for manufacturer technicians to be present; Adopting advanced true color touch screen to achieve human-computer interaction, with complete protection functions and very convenient operation, the highly three-dimensional animation design is more humanized, intuitive, and convenient for operators to use and judge fault information, etc; Greatly improving the counting stability of the system, thereby enhancing the overall stability of the entire machine; Due to the strong expansion capability of PLC, it can easily expand various functional accessories without the need to add any additional hardware circuits. Detector of TD-3500 X-ray diffractometer Proportional detector (PC) or scintillation detector (SC). High precision angle measuring instrument for TD-3500 X-ray diffractometer The TD series angle measuring instrument adopts imported high-precision bearing transmission, and the motion control is completed by a high-precision fully closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, which can automatically correct extremely small motion position errors, ensuring high precision and accuracy of measurement results. The angle reproducibility can reach 0.0001 degrees, and smaller step angles can reach 0.0001 degrees. Application areas of TD-3500 X-ray diffractometer: Materials Science: Used to study key information such as crystal structure, phase transition behavior, and texture of materials. Chemical analysis: can be used for qualitative or quantitative analysis of organic, inorganic, polymer compounds and other substances. Geology: helps people understand the formation of mineral deposits, the evolution of the Earth, and more. Biopharmaceuticals: Determine the crystal structure of drugs, optimize drug formulations, and improve drug efficacy. X-ray diffractometer is a powerful analytical tool widely used in multiple fields. By accurately measuring diffraction angle and intensity, it can provide detailed information about the crystal structure and composition of materials.

The TD-3700 high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. The TD-3700 high-resolution X-ray diffractometer supports not only the conventional diffraction data scanning method, but also the transmission data scanning method. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation. The array detector fully utilizes mixed photon counting technology, with no noise, fast data acquisition, and more than ten times the speed of scintillation detectors. It has excellent energy resolution and can effectively remove fluorescence effects. Multi channel detectors have faster readout times and achieve better signal-to-noise ratios. A detector control system with electronic gating and external triggering effectively completes system synchronization. The working principle of TD-3700 high-resolution X-ray diffractometer: By utilizing the fluctuation of X-rays, when they are irradiated onto a crystal, atoms or ions in the crystal act as scattering centers, scattering X-rays in all directions. Due to the regularity of atomic arrangement in crystals, these scattered waves interfere with each other and reinforce each other in certain directions, forming diffraction. By measuring the diffraction angle and diffraction intensity, the structural information of the crystal can be obtained. The main features of TD-3700 high-resolution X-ray diffractometer are: (1) Easy to operate, one click collection system; (2) Modular design, plug and play instrument accessories, no need for calibration; (3) Real time online monitoring using touch screen to display instrument status; (4) Electronic lead door interlocking device, dual protection, ensuring user safety; (5) High frequency and high-voltage X-ray generator, with stable and reliable performance; (6) Advanced recording control unit with strong anti-interference ability. The high precision of the TD-3700 high-resolution X-ray diffractometer enables high-precision analysis of the crystal structure of materials, such as precise determination of lattice constants, cell parameters, etc. The angle measurement accuracy can reach ±0.0001°. The high resolution of TD-3700 high-resolution X-ray diffractometer can clearly distinguish adjacent diffraction peaks, accurately analyze diffraction information of different crystal planes for complex crystal structures, and reveal the microstructure characteristics of materials. The non-destructive nature of the TD-3700 high-resolution X-ray diffractometer: it will not cause damage to the sample during the testing process, and the sample can be kept in its original state for multiple tests, which is particularly important for precious or difficult to obtain samples. Rapid analysis of TD-3700 high-resolution X-ray diffractometer: Modern high-resolution X-ray diffractometers have fast detection capabilities and can complete sample testing in a short period of time, improving work efficiency. 3. Application areas of TD-3700 high-resolution X-ray diffractometer: Semiconductor materials: used to detect the crystal quality of semiconductor single crystal materials and epitaxial thin films, analyze lattice mismatch, defects and other information, which helps optimize the performance of semiconductor devices. Superconducting materials: Study the crystal structure and phase transition process of superconducting materials to provide a basis for optimizing superconducting properties. Nanomaterials: Analyzing the grain size, crystal structure, microscopic strain, etc. of nanomaterials helps researchers better understand their properties and applications. Other fields: It is also widely used in research and quality control of metal materials, ceramic materials, polymer materials, biomaterials, and other fields. High resolution X-ray diffractometer is a high-precision, high-resolution, non-destructive, and fast analytical instrument with important application value in many fields.

The rotating sample holder in an X-ray diffractometer is a key component used for precise adjustment and fixation of the sample position,the sample can rotate within its own plane, which is beneficial for errors caused by coarse grains. For samples with texture and crystallography, rotating sample holder ensures good reproducibility of diffraction intensity and eliminates preferred orientation. Working principle of rotating sample holder: When the X-ray diffractometer is working, high-energy X-rays generated by the X-ray source are irradiated onto the sample fixed on the rotating sample stage. Due to the specific crystal structure and lattice parameters of the sample, X-rays will undergo scattering, absorption, and diffraction phenomena when interacting with the sample, where diffraction phenomena occur according to the requirements of the Bragg equation. The rotating sample holder can rotate at smaller angles according to the setting, allowing the sample to receive X-ray irradiation at different angles, thereby obtaining diffraction patterns at different angles. In this way, the detector can measure the X-ray intensity after sample diffraction and convert it into an electrical signal to be transmitted to the computer for data processing. The main function of the rotating sample holder is: Rotation method: β axis (sample plane) Rotation speed: 1~60RPM Small step width: 0.1 º Operation mode: Constant speed rotation for sample scanning (step, continuous) Advantages of rotating sample holder: The rotating sample holder can improve the accuracy of diffraction data: For samples with irregular powder or particle shapes, the characteristic of preferred orientation is prone to occur during conventional powder sample preparation, resulting in deviations in the distribution of diffraction intensity and affecting the accuracy of diffraction result analysis. Rotating the sample stage can move the sample in a certain form in an appropriate space, eliminating the influence of preferred orientation to a certain extent, thereby improving the accuracy of diffraction data. The rotating sample holder can adapt to various testing needs: able to adapt to different types of X-ray diffraction angle measuring instruments, such as vertical angle measuring instruments, low-power compact powder diffraction equipment, etc., providing convenience for different testing needs. And rotating sample holder can meet the requirements of various samples and testing conditions by adjusting parameters such as speed and steering. The rotating sample holder can expand the instrument's analytical capabilities: New types of rotating sample stages are constantly being developed and applied, such as some sample stages for in-situ electrochemical X-ray diffraction analysis, which can monitor and analyze the changes of materials in different environments or conditions in real time, expanding the analysis capabilities of X-ray diffraction equipment. In summary, the rotating sample holder in X-ray diffractometer is crucial for accurately obtaining crystal structure information of substances. the rotating sample holder can not only improve the accuracy of diffraction data, but also adapt to various testing needs and expand the analytical capabilities of the instrument.

In X-ray diffractometer, the multifunctional integrated measuring accessories are crucial component that greatly enhances the functionality and flexibility of the instrument. Used for the analysis of films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Basic overview of multifunctional integrated measuring accessories: Definition: They are general term for a series of additional devices or modules used in X-ray diffractometer to expand instrument functions, improve measurement accuracy and efficiency. Purpose: These attachments aim to enable X-ray diffractometer to meet a wider range of experimental needs and provide more comprehensive and accurate material structure information. The functional characteristics of multifunctional integrated measuring accessories: Perform polar diagram testing using transmission or reflection methods; Stress testing can be conducted using either the parallel tilt method or the same tilt method; Thin film testing (in-plane rotation of the sample). Technical characteristics of multifunctional integrated measuring accessories: High precision:They typically use advanced sensing technology and control systems to ensure high precision and repeatability of measurements. Automation: Many attachments support automated operations and can be seamlessly integrated with the X-ray diffractometer host to achieve one click measurement. Modular design: facilitates users to select and combine different accessory modules according to their actual needs. Application areas of multifunctional integrated measuring accessories: Widely used in fields such as materials science, physics, chemistry, biology, and geology; Evaluation of metal assembly structures such as rolled plates; Evaluation of ceramic orientation; Evaluation of crystal priority orientation in thin film samples; Residual stress testing of various metal and ceramic materials (evaluation of wear resistance, cutting resistance, etc.); Residual stress testing of multilayer films (evaluation of film peeling, etc.); Analysis of surface oxidation and nitride films on high-temperature superconducting materials such as thin films and metal plates; Glass Si、Analysis of multilayer films on metal substrates (magnetic thin films, metal surface hardening films, etc.); Analysis of electroplating materials such as macromolecular materials, paper, and lenses. The multifunctional integrated measuring accessories in X-ray diffractometer are the key to improving instrument performance. They not only enhance the functionality of the instrument, but also improve the accuracy and efficiency of measurement, providing researchers with more comprehensive and in-depth material analysis methods. With the continuous advancement of technology, these attachments will continue to play an important role in promoting scientific research in related fields to achieve more breakthroughs.

The TDM-20 Benchtop X-ray diffractometer uses a new high-performance array detector, and the loading of this detector has greatly improved the overall performance of the machine. The TDM-20 Benchtop XRD is mainly used for phase analysis of powders, solids, and similar paste like materials. The TDM-20 Benchtop X-ray diffractometer utilizes the principle of X-ray diffraction to perform qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. Benchtop XRD​ is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

The TD-3700 high-resolution X-ray diffractometer​ is equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. TD-3700 X-ray diffractometer integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. TD-3700 X-ray diffractometer can increase the diffraction calculation intensity by tens of times or more, obtain complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity in a shorter sampling period, and also support transmission data scanning. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. X-ray single crystal diffractometer​ is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. Single crystal XRD is a high-tech product under the National Major Scientific Instrument and Equipment Development Project of the Ministry of Science and Technology, led by Dandong Tongda Technology Co., Ltd., filling the gap in the development and production of single crystal x-ray diffractometer in China.