The TD-3700 high-resolution X-ray diffractometer​ is equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. TD-3700 X-ray diffractometer integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. TD-3700 X-ray diffractometer can increase the diffraction calculation intensity by tens of times or more, obtain complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity in a shorter sampling period, and also support transmission data scanning. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. X-ray single crystal diffractometer​ is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. Single crystal XRD is a high-tech product under the National Major Scientific Instrument and Equipment Development Project of the Ministry of Science and Technology, led by Dandong Tongda Technology Co., Ltd., filling the gap in the development and production of single crystal x-ray diffractometer in China.

Powder X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!

The TD-3700 X-ray diffractometer is a high-performance and multifunctional X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. The main features are high-performance detectors, diverse scanning methods, convenient and safe operation, stable and reliable performance. For specific details, please refer to the website of Dandong Tongda Technology Co., Ltd.

Scientific Instrument Breakthrough: Dandong Tongda's TD-3700 X-Ray Diffractometer Empowers Research Innovation Dandong Tongda Science and Technology Co., Ltd. is a high-tech enterprise specializing in the research, development, and production of X-ray analysis instruments. Its flagship product, the TD-3700 X-Ray Diffractometer , integrates rapid analysis, user-friendly operation, and robust safety features. The perfect synergy between its modular hardware and customized software systems makes it a powerful tool for research fields such as materials science, chemistry, and mineralogy. TheTD-3700 X-Ray Diffractometer demonstrates significant advantages in both detection technology and measurement modes, enabling it to meet a wide range of analytical demands. Core Technology and Performance High-Performance Detectors: The instrument can be equipped with optional high-speed 1D array detectors (e.g., MYTHEN2R), SDD detectors, or 2D detectors. Utilizing hybrid photon counting technology, it operates with no readout noise, achieves data acquisition speeds tens to hundreds of times faster than traditional scintillation detectors, and effectively eliminates fluorescence effects for excellent energy resolution. For instance, the 1D array detector features 640 channels with a remarkably short readout time of just 89 microseconds, contributing to an outstanding signal-to-noise ratio. Flexible Scanning Modes: The TD-3700 X-Ray Diffractometer supports two primary data scanning methods: conventional reflection (diffraction) mode and transmission mode. The transmission mode provides higher resolution, making it suitable for analyzing limited samples or conducting structural analysis. The reflection mode offers a stronger signal, which is more appropriate for routine phase identification in laboratory settings. This flexibility enables the instrument to handle a wide variety of sample types, ranging from trace amounts of powder and bulk solids to even liquids and viscous samples. Precision Goniometer System: It employs a θS-θd vertical goniometer where the sample remains horizontal and stationary during measurement. This design not only facilitates easier sample preparation but also helps prevent potential corrosion of the goniometer's axis system by samples, thereby extending its operational lifespan. With a wide 2θ scanning range (-110° to 161°) and exceptional repetitive accuracy of 0.0001°, it ensures highly precise and repeatable measurements. Instrument Features & Safety Assurance The TD-3700 X-Ray Diffractometer is designed with a strong emphasis on user experience and operational safety. User-Friendly Design: Effortless Operation: Features a one-click acquisition system and incorporates a touchscreen interface for real-time monitoring of instrument status. Modular Design: Components are designed for plug-and-play functionality, requiring no calibration and ensuring straightforward maintenance. Comprehensive Safety Protection: Incorporates an electronic lead door interlock system for dual-layer protection, ensuring user safety. External radiation leakage from the protection system is ≤ 0.1μSv/h, complying with stringent international safety standards. Includes multiple protective functions against excessively high/low kV, excessively high/low mA, water flow failure, and X-ray tube overheating. Stable & Reliable System: Utilizes a high-frequency, high-voltage X-ray generator known for its stable and reliable performance, with system stability ≤ 0.005%. The integrated recirculating chiller has a built-in cooling function, eliminating the need for an external water circulation unit. Applications & Global Recognition The TD-3700 X-Ray Diffractometer is widely used for qualitative/quantitative phase analysis, crystal structure analysis, materials structure research, grain size determination, and crystallinity measurement. Recognized for their reliable quality, Dandong Tongda's products have been exported to numerous countries and regions including the United States, South Korea, Iran, Azerbaijan, Iraq, and Jordan, earning validation in the international market. The company has also obtained ISO9001 and other international quality management system certifications.Dandong Tongda Science and Technology Co., Ltd.provides customers with comprehensive service and support, including after-sales service, professional training, and international business support. We warmly welcome your inquiries and look forward to your procurement!

TDM-20 Mini X-Ray Diffractometer is a high-performance benchtop analytical instrument developed and manufactured by Dandong Tongda Technology Co., Ltd.​ It is primarily used for phase analysis of polycrystalline materials such as powders, solids, bulk specimens, and pastes. Utilizing the principle of X-ray diffraction, the instrument enables qualitative and quantitative analysis, crystal structure analysis, and other functions. It finds extensive applications across various fields including industry, agriculture, defense, pharmaceuticals, mineralogy, food safety, petroleum, and educational research. TDM-20 Benchtop X-ray Diffractometer breaks through the conventional 600W limitation, delivering a maximum output power of 1200W for high-power performance. Additionally, it incorporates a high-frequency, high-voltage power supply, resulting in lower overall power consumption. It boasts high-precision goniometer technology with an angular repeatability of 0.0001°, a diffraction peak position measurement accuracy of 0.001°, and a full-profile diffraction angle linearity of ±0.010°.The instrument incorporates an advanced control system based on PLC (Programmable Logic Controller) technology and a modular design for precise operation. For detection, it can be equipped with either a proportional detector or a new high-performance array detector, significantly enhancing overall performance and data acquisition speed. The TDM-20 also offers highly flexible configuration options, supporting a variety of accessories such as a rotating sample stage, a 1D array detector, and a 6-position automatic sample changer. TDM-20 Mini X-Ray Diffractometer is further characterized by its significant advantage of being compact and portable, with a small footprint and low weight. It is recognized as one of the smallest benchtop X-ray diffractometers globally, rendering it highly suitable for laboratory environments where space is limited. Furthermore, the instrument is provided with a triple interference-free isolation protection scheme. The X-ray leakage radiation is maintained at ≤ 0.12 μSv/h, ensuring compliance with the GBZ 115-2002 protection standard. Hence, the use of the TDM-20 Mini X-Ray Diffractometer is confirmed to be safe and reliable. TDM-20 Mini X-Ray Diffractometer integrates high power, high precision, and a compact design into a single platform. It transcends the limitations of traditional, large-scale X-ray diffractometers, delivering an efficient, convenient, and reliable material analysis solution for various industries. With its advanced technical performance, comprehensive service support, and flexible operation, the TDM-20serves as a powerful tool for laboratory-based material analysis. If you have any requirements for X-ray diffraction equipment, we welcome you to choose the products from Dandong Tongda Science and Technology Co., Ltd.

The auto sample changer adopts an imported stepper motor drive and a programmable logic controller (PLC) as the core control system. The selection of these two key components significantly ensures the precision, stability, and long-term reliability of the equipment's operation. The workflow of the auto sample changer is designed to be simple and efficient: The operator pre-loads up to six samples sequentially into designated positions of the sample changer. After setting the measurement parameters via the control system, the sample changer begins operation. Following program instructions, it automatically and accurately delivers each sample in sequence to the measurement position of the X-ray diffractometer.Once the measurement of one sample is completed, the device automatically removes it and swiftly delivers the next sample until all samples are measured. Measurement data is automatically saved, facilitating subsequent review and analysis while reducing recording errors that may arise from manual operations.The entire process requires no manual intervention, allowing the operator to free up time for other tasks and avoiding potential fatigue-related errors from prolonged operation. In addition to the basic auto sample changing function, the equipment also boasts several noteworthy features: Efficiency Enhancement: Enables unattended continuous auto measurement, making it particularly suitable for rapid screening of batch samples or sequential analysis over long periods. Data Consistency: The automated process reduces human intervention, helping to improve the repeatability and comparability of measurement data. Ease of Operation: The PLC-based control system is typically stable and user-friendly, lowering the operational threshold. Flexible Application: Primarily used in fields such as environmental protection, electronics/batteries, and other areas requiring material analysis technologies. This auto sample changer primarily serves the application field of X-ray diffraction (XRD) analysis. Dandong Tongda Science and Technology Co., Ltd. has accumulated experience in the field of analytical instruments. Its TD series of analytical instruments and non-destructive testing equipment are applied in various material research fields. This 6-position (or 12-position) auto sample changer reflects the company's approach of integrating automation technology into traditional testing equipment to enhance overall efficiency. As a functional accessory, it works in coordination with X-ray diffractometers, enhancing the automation capabilities of the host instrument.

The TD-5000 X-ray Single-Crystal Diffractometer is a high-performance instrument developed by Dandong Tongda Technology. Approved under China's National Key Scientific Instrument and Equipment Development Project, it fills a critical domestic gap in this field. Its primary function is determining the three-dimensional spatial structure and electron density distribution of crystalline substances—including inorganic compounds, organic compounds, and metal complexes—while also analyzing structures of special materials like twinned crystals, incommensurately modulated structures, and quasicrystals. It precisely measures the accurate 3D spatial structure of new crystalline compounds (including bond lengths, bond angles, configuration, conformation, and bonding electron density) and the actual arrangement of molecules within the crystal lattice. The system provides comprehensive structural information such as unit cell parameters, space group, molecular structure, intermolecular hydrogen bonding and weak interactions, and molecular configuration/conformation. It is widely used for analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. Core Technology: A Dual Revolution in Precision and Intelligence (1) The "Mechanical Eye" with Atomic-Level Positioning Four-Circle Concentric Diffractometer: Overcomes traditional mechanical offset limitations, maintaining a constant rotational center to ensure diffraction spot coordinate errors remain below the nanometer level. PILATUS Detector: Combines single-photon counting technology with 172μm ultra-fine pixels. Achieves frame rates up to 20Hz, with noise suppression capability 3 times greater than conventional CCD detectors. (2) Fully Intelligent Closed-Loop Workflow PLC One-Touch Control: Automates the entire process from crystal positioning to data acquisition, reducing manual operation time by 90%. Cryogenic Enhancement System: Features ±0.3 K precision temperature control (100K–300K), boosting signal intensity for weakly diffracting crystals by 50% with liquid nitrogen consumption of only 1.1–2 L/h. (3) Dual Assurance: Safety and Expandability Lead Door Interlock + Leakage Protection (≤0.12 µSv/h), exceeding national safety standards. Optional Multilayer Focusing Optics (Mo/Cu Dual Target), enabling full-scale analysis from small-molecule pharmaceuticals to minerals with large unit cells. The advent of the TD-5000 X-ray Single-Crystal Diffractometer signifies more than an instrumental breakthrough—it marks the era where China's high-end scientific research equipment officially achieves autonomous precision definition. As of 2025, this system has served over 30 leading institutions across fields including chemistry, materials science, and aerospace. As crystals unveil the secrets of life under the probing gaze of domestically developed instruments, China's scientific "eye that discerns the essence of matter" now shines with brilliant clarity.

The TDM-20 high-power X-ray diffractometer (benchtop XRD) is mainly used for phase analysis of powders, solids, and similar paste like materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. It is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. It produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!

The TD-3700 series high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. It is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science.