The multi-functional residual stress analyzer developed by Dandong Tongda Technology Co., Ltd. is designed to meet the needs of fast and accurate measurements in both laboratory and field environments. Based primarily on the X-ray diffraction principle, it enables non-destructive testing of the residual stress state inside materials. Versatile All-in-One Analysis This analyzer integrates multiple material analysis functions, significantly enhancing equipment utility and efficiency: Residual Stress Analysis: Supports various measurement modes such as standard同倾法 (omega-inclination), standard侧倾法 (psi-inclination), and standard摇摆法 (oscillation), capable of determining principal stresses and shear stresses for a comprehensive stress state evaluation. Retained Austenite Analysis: Employs the four-peak method for retained austenite testing, with fully automated data calculation for quick results. Diffraction Phase Analysis: Used to analyze crystal structures, chemical composition content, and distribution, helping researchers gain deeper insights into material constitution. Grain Size Analysis: Supports grain size evaluation from nanoscale to sub-micron scale, particularly suitable for fine grains ≤200 nm. Technical Features and Performance This instrument boasts multiple technical features aimed at ensuring precision, stability, and ease of use: High-Precision Measurement and Control: Utilizes a high-precision fully closed-loop vector drive servo system to ensure measurement accuracy and repeatability. Efficient Data Acquisition: Equipped with a multi-channel silicon strip linear array detector, which provides noise-free performance, high-intensity measurement, and rapid data collection to enhance detection efficiency. Portable Design: Features a lightweight construction, making it suitable not only for laboratory environments but also for on-site rapid measurements, adapting to various testing scenarios. User-Friendly Operation: Integrates Windows OS or automation functions, supporting one-click testing and real-time result display, lowering the operational barrier. Modularity and Safety: Employs a PLC control system with modular design for ease of operation and stable performance. Safety-wise, its low-power X-ray design complies with relevant safety standards, with radiation levels significantly below the annual public dose limit. Broad Application Fields Dandong Tongda’s multi-functional residual stress analyzer has extensive applications, covering almost all industrial sectors and research institutions requiring evaluation of material mechanical properties: Manufacturing Quality Control: Used to detect residual stresses in stamped, cast, and rolled parts during processing. Automotive Industry: Tests residual stresses in critical components such as camshafts and connecting rods to ensure reliability and durability. Aerospace: Evaluates working loads in critical areas of aerospace materials to assess safety. Materials Science Research: Applicable to various metal materials (e.g., carbon steel, alloy steel, titanium alloy, nickel-based materials), glass, and composite materials for residual stress, retained austenite, phase, and grain size analysis. Dandong Tongda Technology Co., Ltd.’s multi-functional residual stress analyzer demonstrates the company’s technical expertise in the field of material testing by integrating multiple analytical functions. This instrument provides engineers and researchers with a window into the intrinsic stress state of materials, helping to control product quality at the source, optimize process parameters, and thereby enhance product reliability and durability.

In the field of modern technology, many high-tech products—from smartphone screen substrates to core components of laser generators—rely on a fundamental material: synthetic single crystals. The precision of the cutting angle of these crystals directly determines the performance and yield of the final products. The X-Ray Orientation Analyzer is an indispensable instrument in the precision manufacturing of crystal devices. Utilizing the principle of X-ray diffraction, it accurately and rapidly measures the cutting angles of both natural and synthetic single crystals, including piezoelectric crystals, optical crystals, laser crystals, and semiconductor crystals. Dandong Tongda Science and Technology Co., Ltd. offers a range of reliable X-Ray Orientation Analyzers tailored to the research, processing, and manufacturing needs of the crystal materials industry. 01 Versatile Machine for Diverse Crystal Orientation Needs Dandong Tongda's X-Ray Orientation Analyzers primarily include models such as the TYX-200 and TYX-2H8. The TYX-200 model boasts a measurement accuracy of ±30″, with a digital display and a minimum reading of 10″. The TYX-2H8 model is an improved version of the TYX-200, featuring enhancements in the goniometer structure, load-bearing track, X-ray tube sleeve, support body, and an elevated sample stage. These improvements enable the TYX-2H8 to handle samples weighing 1–30 kg with diameters of 2–8 inches. It retains a digital angle display and a measurement accuracy of ±30″. 02 Advanced Technical Features for User-Friendly Operation Dandong Tongda's X-Ray Orientation Analyzers are designed with practicality and reliability in mind. Their user-friendly operation requires no specialized knowledge or advanced skills from the operator. The instrument features a digital angle display, ensuring intuitive and easy-to-read measurements while minimizing the risk of misreading. The display can be zeroed at any position, allowing direct reading of the wafer angle deviation. Some models are equipped with dual goniometers for simultaneous operation, significantly improving detection efficiency. A special integrator with peak amplification enhances measurement accuracy. The X-ray tube and high-voltage cable adopt an integrated design, improving high-voltage reliability. The detector high-voltage system uses a DC high-voltage module, and the vacuum suction sample stage further enhances measurement accuracy and speed. 03 Dedicated Sample Stage Designs for Various Testing Needs To meet the measurement requirements of samples with different shapes and sizes, Dandong Tongda offers a variety of specialized sample stages: TA Sample Stage: Designed for rod-shaped crystals, it features a load-bearing track and can test crystal rods weighing 1–30 kg with diameters of 2–6 inches (expandable to 8 inches). This stage can measure reference surfaces of rod-shaped crystals as well as surfaces of wafer-shaped crystals. TB Sample Stage: Also designed for rod-shaped crystals, it includes a load-bearing track and V-shaped support rails. It can test crystal rods weighing 1–30 kg, with diameters of 2–6 inches (expandable to 8 inches) and lengths of up to 500 mm. It measures end faces of rod-shaped crystals and surfaces of wafer-shaped crystals. TC Sample Stage: Primarily used for detecting the outer reference surfaces of single-crystal wafers such as silicon and sapphire. Its open-design suction plate avoids X-ray obstruction and positioning inaccuracies. The stage's suction pump securely holds wafers sized 2–8 inches, ensuring precise detection. ​ TD Sample Stage: Designed for multi-point measurements of wafers such as silicon and sapphire. Wafers can be manually rotated on the stage (e.g., 0°, 90°, 180°, 270°) to meet specific customer measurement needs. 04 High-Performance Model for Large Sample Challenges For large and challenging sample detection, Dandong Tongda's X-Ray Orientation Analyzers demonstrate exceptional performance. The TYX-2H8 model, for example, is particularly suitable for orienting sapphire crystal ingots and rods. This instrument supports measurements of sapphire A, C, M, and R crystal orientations, with an adjustable measurement range of 0–45° via electric automation. Its technical specifications are impressive: Copper-target X-ray tube with grounded anode and forced air cooling. Adjustable tube current: 0–4 mA; tube voltage: 30 kV. Operation via computer or touchscreen control. Synchronized movement of the X-ray tube and detector; electric-driven rotary table. Total power consumption: ≤2 kW. Most notably, its sample handling capacity includes crystal ingots weighing up to 30–180 kg, with maximum dimensions of 350 mm in diameter and 480 mm in length. These capabilities make it suitable for large sample detection in most industrial scenarios. 05 Broad Applications Supporting Multiple Industries Dandong Tongda's X-Ray Orientation Analyzers are widely used across various industries involved in the research, processing, and manufacturing of crystal materials. In the semiconductor industry, they enable precise orientation cutting of silicon wafers. In the optoelectronics field, they are used for precision processing of sapphire substrates, optical crystals, and laser crystals. In the piezoelectric materials sector, they ensure accurate cutting angle measurements for stable end-product performance. The instruments are particularly well-suited for sapphire materials, which are in high demand due to their hardness, high light transmittance, and excellent physicochemical stability. Sapphire is widely used in LED substrates, consumer electronic screens, and optical windows. Dandong Tongda's X-Ray Orientation Analyzers have become essential tools in China's crystal material research and manufacturing fields, thanks to their reliable performance, diverse configurations, and strong adaptability. Their modular design and variety of sample stage options allow users to select configurations that meet specific needs, ensuring high detection accuracy while improving work efficiency. Whether for research institutions or manufacturing quality control and process optimization, these instruments provide robust technical support, empowering users to achieve breakthroughs in precision manufacturing.

Dandong Tongda's X-ray Crystal Analyzer adopts advanced X-ray diffraction technology, enabling non-destructive detection of microstructural information in various materials. Whether it's single crystal orientation, defect inspection, lattice parameter measurement, or residual stress analysis, this instrument provides accurate and reliable test data, offering solid support for material research and quality control. The instrument is equipped with a highly stable X-ray generator that delivers exceptional performance. The tube voltage can be precisely adjusted within the range of 10-60kV, and the tube current can be regulated from 2-60mA, with a stability of no more than ±0.005%. This ensures highly repeatable and accurate test results, providing researchers with dependable data assurance. Dandong Tongda's X-ray Crystal Analyzer integrates intelligent control and comprehensive safety protection. It features an imported PLC automatic control system, enabling unattended automatic timed measurements. The multi-level safety protection system includes no-pressure, no-current, over-voltage, over-current, over-power, no-water, and X-ray tube over-temperature protections, ensuring the safety of operators. The TDF series X-ray crystal analyzer adopts a vertical tube housing with four windows that can be used simultaneously. It utilizes imported PLC control technology, which offers high precision and strong anti-interference capabilities, ensuring the reliable operation of the system. The PLC controls the switching and adjustment of high voltage and includes an automatic training function for the X-ray tube, effectively extending the service life of both the X-ray tube and the instrument. The instrument's radiation protection enclosure is constructed with high-density, high-transparency leaded glass, with external radiation leakage far below national safety standards, allowing researchers to conduct experimental studies in a secure environment. As a national high-tech enterprise, Dandong Tongda Technology Co., Ltd. has a comprehensive quality management system and a technical R&D team. Its products not only meet domestic market demands but are also exported to numerous countries and regions, demonstrating the strength and capability of China's scientific instrument manufacturing. Dandong Tongda's X-ray Crystal Analyzer, with its outstanding performance and reliable quality, has become a powerful assistant in the field of material analysis. It helps researchers and engineers unveil the layers of the material world and explore more unknown possibilities.

1. TDF series X-ray crystal analyzer Function and Application: This series of equipment is mainly used to study the internal microstructure of materials, suitable for single crystal orientation, defect inspection, lattice parameter determination, residual stress analysis, plate/rod structure research, unknown material structure analysis, and single crystal dislocation analysis. Technical features: As a large-scale analytical instrument, the TDF series integrates high-precision X-ray diffraction technology, which can provide deep analysis of microstructures and support research and quality control in fields such as materials science, semiconductor manufacturing, and crystal processing. The TDF series X-ray crystal analyzer adopts a vertical tube sleeve, and four windows can be used simultaneously. The TDF series X-ray crystal analyzer adopts imported PLC control technology, with high control accuracy and good anti-interference performance, which can achieve reliable operation of the system. The PLC controls the high-voltage switch, lifting, and has the function of automatically training the X-ray tube, effectively extending the service life of the X-ray tube and instrument. 2. X-ray crystal orienter Function and application: By using the principle of X-ray diffraction, the cutting angle of natural or artificial single crystals (such as piezoelectric crystals, optical crystals, laser crystals, semiconductor crystals) can be quickly and accurately determined. When combined with a cutting machine, directional cutting can be achieved. Widely used in the research, processing, and manufacturing industries of crystalline materials. Technical advantages: It can replace traditional radioactive isotope irradiation technology and directly complete high-precision directional analysis in the laboratory, improving crystal processing efficiency and accuracy.

The TDF series X-ray crystal analyzer is a large-scale analytical instrument used to study the internal microstructure of substances. The X-ray crystal analyzer is mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations. A X-ray crystal analyzer is a precision instrument that uses the principle of X-ray diffraction to analyze and determine the internal structure and composition of substances. 1. The working principle of X-ray crystal analyzer: The X-ray crystal analyzer is based on Bragg's law, which states that when X-rays are irradiated onto a crystal, diffraction occurs at a specific angle, forming diffraction spots or peaks. By measuring the angles and intensities of these diffractions, the internal structure and composition of the crystal can be inferred. 2. Components of X-ray crystal analyzer: (1) X-ray source of X-ray crystal analyzer: a device that generates X-rays, usually an X-ray tube, consisting of a filament, a target material, and a high-voltage power supply. X-ray tube of X ray crystal analyzer: Rated power: 2.4KW; Focus size (mm2): Point focus (1 × 1) Line focus (1 × 10); Target materials: Cu, Co, Fe, Cr, Mo, W, etc. High voltage generator of X-ray crystal analyzer (controlled by imported PLC): Tube voltage: 10-60KV; Tube current: 2-60mA; Stability of tube voltage and tube current ≤ ± 0.005%; Rated output power: 3KW. High voltage cable for X ray crystal analyzer: Dielectric voltage ≥ 100KV; Length: 2M. (2) The spectral crystal of X ray crystal analyzer: used to separate X-rays of different wavelengths, the X-ray crystal analyzer is a key component for achieving spectral separation. (3) Detector of X-ray crystal analyzer: used to detect X-rays scattered by the sample and convert them into electrical signals for subsequent processing. (4) Angle measuring instrument of X-ray crystal analyzer: an instrument used for precise measurement of diffraction angle, which is one of the important components to ensure measurement accuracy. (5) The control and data processing system of X-ray crystal analyzer: used to control the entire analysis process, process and analyze the collected data. Modern instruments are usually equipped with computer software to simplify the data analysis process. 3. Characteristics of X-ray crystal analyzer: The TDF series X ray crystal analyzer adopts a vertical tube sleeve, and four windows can be used simultaneously. The TDF series X-ray crystal analyzer adopts imported PLC control technology, with high control accuracy and good anti-interference performance, which can achieve reliable operation of the system. The PLC controls the high-voltage switch, lifting, and has the function of automatically training the X-ray tube, effectively extending the service life of the X-ray tube and instrument. 4. Application areas of X-ray crystal analyzer Materials Science: Research the crystal structure, phase transition, defects, etc. of materials to provide important support for the development of new materials. Chemistry: involving crystal chemistry, medicinal chemistry, etc., can be used to analyze compound structures, study chemical reaction mechanisms, etc. Biology: Used for structural analysis of biomolecules, drug design and screening, etc., the X-ray crystal analyzer is of great significance for understanding life processes and disease mechanisms. Environmental science plays an important role in the development of catalysts, characterization of nanomaterials, and analysis of pollutants. Geology:Mineral identification, rock genesis research, geochronology and other fields of study also rely on X-ray crystal analyzers. The X-ray crystal analyzer is a powerful and widely used analytical instrument that plays an irreplaceable role in multiple fields. With the continuous advancement of technology and the continuous development of the market, its performance and application scope will be further improved and expanded.

The TDF series X-ray crystal analyzer is a large-scale analytical instrument and X-ray instrument used to study the internal microstructure of materials. It is mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stress, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations.

The TDF series X-ray crystal analyzer is a large-scale analytical instrument used to study the internal microstructure of substances. It is mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations.

The TDF series X-ray crystal analyzer is a large-scale analytical X-ray instrument used to study the internal microstructure of substances.It is mainly used for single crystal orientation,defect inspection,determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations. The TDF series X-ray crystal analyzer adopts a vertical tube sleeve, and four windows can be used simultaneously. The TDF series X-ray crystal analyzer adopts imported PLC control technology, with high control accuracy and good anti-interference performance, which can achieve reliable operation of the system. The PLC controls the high-voltage switch, lifting, and has the function of automatically training the X-ray tube, effectively extending the service life of the X-ray tube and X-ray instrument.

The TDF series X-ray crystal analyzer is a large-scale X-ray instrument used to study the internal microstructure of substances. It utilizes the principle of interaction between X-ray and crystal to determine the atomic arrangement inside the crystal by analyzing the diffraction pattern of X-ray. Mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stress, study of the structure of plate and rod, investigation of the structure of unknown substances and single crystal dislocations. The X-ray crystal analyzer, as an X-ray instrument, provides valuable information for materials science research and other related fields. With the continuous advancement of technology and the expansion of applications, X-ray crystal analyzer will continue to play an important role in scientific research and industrial production.

The automatic X-ray orientation instrument is a device that uses the diffraction principle of X-ray to determine the crystal structure, orientation, and lattice parameters. It has a wide range of applications in materials science, geology, physics, and chemistry, especially in studying the microstructure and properties of single crystal, polycrystalline materials, and thin film materials. The following will provide a detailed introduction to the working principle, application, and operational precautions of the X-ray crystal orienter. With the advancement of technology, the automatic X-ray orientation instrument devices continues to improve, with higher resolution and easier operation. At the same time, the combination with other analytical techniques such as electron microscopy and spectroscopic analysis makes the analysis of crystal structure more comprehensive and in-depth. In addition, portable and online monitoring X-ray orientation analyzer devices have gradually developed, providing possibilities for on-site analysis and real-time monitoring. In summary, X-ray orientation analyzer is a powerful analytical tool that is crucial for understanding and controlling the microstructure of materials. With the continuous development of technology, its application in various fields will become more extensive and in-depth.

The X-ray orientation analyzer is a device that uses the principle of X-ray diffraction to determine crystal orientation. It is widely used in fields such as materials science, geology, physics, etc., for studying crystal structure, lattice parameters, crystal defects, etc. The working principle of an X-ray orientation analyzer​ is to irradiate a monochromatic X-ray beam onto the crystal under test. When the X-ray interacts with atoms in the crystal, scattering occurs. According to Bragg's law, when the wavelength of X-rays is an integer multiple of the atomic spacing in a crystal, scattered light will interfere and form a series of alternating bright and dark stripes, known as Bragg reflection. By measuring the angles and intensities of these Bragg reflections, information such as crystal orientation and lattice parameters can be calculated. The X-ray orientation analyzer usually includes the following main parts: 1.X-ray source: a device that produces monochromatic X-rays, typically using an X-ray tube or synchrotron radiation source. 2.Sample stage: a platform used to place the crystal to be tested, which can adjust the position and angle of the crystal. 3.Detector: used to receive scattered X-rays and convert them into electrical signals. Common detectors include scintillation counters, proportional counters, etc. 4.Data acquisition and processing system: used to collect signals output by detectors, and perform data processing and analysis. Usually includes multi-channel analyzers, computers, and other equipment. 5.Control system: used to control the movement of X-ray source, sample stage, and detector to achieve measurement of crystals in different directions. By using an X-ray orientation analyzer, researchers can accurately determine the orientation and lattice parameters of crystals, thereby gaining a deeper understanding of their structure and properties. This is of great significance for the development of new materials, geological exploration, crystal growth and other fields.

The in-situ battery accessory is a component of the X-ray diffractometer accessories.In situ battery accessories are widely used in electrochemical systems containing composite materials such as carbon, oxygen, nitrogen sulfur, and metal inserts. Test range: 0.5-160 degrees Celsius Temperature resistance: 400 ℃ Beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable) Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometers、Wholesaler of X-ray directional analyzer、Wholesaler of X-series X-ray crystal analyzer。