In the field of modern technology, many high-tech products—from smartphone screen substrates to core components of laser generators—rely on a fundamental material: synthetic single crystals. The precision of the cutting angle of these crystals directly determines the performance and yield of the final products. The X-Ray Orientation Analyzer is an indispensable instrument in the precision manufacturing of crystal devices. Utilizing the principle of X-ray diffraction, it accurately and rapidly measures the cutting angles of both natural and synthetic single crystals, including piezoelectric crystals, optical crystals, laser crystals, and semiconductor crystals. Dandong Tongda Science and Technology Co., Ltd. offers a range of reliable X-Ray Orientation Analyzers tailored to the research, processing, and manufacturing needs of the crystal materials industry. 01 Versatile Machine for Diverse Crystal Orientation Needs Dandong Tongda's X-Ray Orientation Analyzers primarily include models such as the TYX-200 and TYX-2H8. The TYX-200 model boasts a measurement accuracy of ±30″, with a digital display and a minimum reading of 10″. The TYX-2H8 model is an improved version of the TYX-200, featuring enhancements in the goniometer structure, load-bearing track, X-ray tube sleeve, support body, and an elevated sample stage. These improvements enable the TYX-2H8 to handle samples weighing 1–30 kg with diameters of 2–8 inches. It retains a digital angle display and a measurement accuracy of ±30″. 02 Advanced Technical Features for User-Friendly Operation Dandong Tongda's X-Ray Orientation Analyzers are designed with practicality and reliability in mind. Their user-friendly operation requires no specialized knowledge or advanced skills from the operator. The instrument features a digital angle display, ensuring intuitive and easy-to-read measurements while minimizing the risk of misreading. The display can be zeroed at any position, allowing direct reading of the wafer angle deviation. Some models are equipped with dual goniometers for simultaneous operation, significantly improving detection efficiency. A special integrator with peak amplification enhances measurement accuracy. The X-ray tube and high-voltage cable adopt an integrated design, improving high-voltage reliability. The detector high-voltage system uses a DC high-voltage module, and the vacuum suction sample stage further enhances measurement accuracy and speed. 03 Dedicated Sample Stage Designs for Various Testing Needs To meet the measurement requirements of samples with different shapes and sizes, Dandong Tongda offers a variety of specialized sample stages: TA Sample Stage: Designed for rod-shaped crystals, it features a load-bearing track and can test crystal rods weighing 1–30 kg with diameters of 2–6 inches (expandable to 8 inches). This stage can measure reference surfaces of rod-shaped crystals as well as surfaces of wafer-shaped crystals. TB Sample Stage: Also designed for rod-shaped crystals, it includes a load-bearing track and V-shaped support rails. It can test crystal rods weighing 1–30 kg, with diameters of 2–6 inches (expandable to 8 inches) and lengths of up to 500 mm. It measures end faces of rod-shaped crystals and surfaces of wafer-shaped crystals. TC Sample Stage: Primarily used for detecting the outer reference surfaces of single-crystal wafers such as silicon and sapphire. Its open-design suction plate avoids X-ray obstruction and positioning inaccuracies. The stage's suction pump securely holds wafers sized 2–8 inches, ensuring precise detection. ​ TD Sample Stage: Designed for multi-point measurements of wafers such as silicon and sapphire. Wafers can be manually rotated on the stage (e.g., 0°, 90°, 180°, 270°) to meet specific customer measurement needs. 04 High-Performance Model for Large Sample Challenges For large and challenging sample detection, Dandong Tongda's X-Ray Orientation Analyzers demonstrate exceptional performance. The TYX-2H8 model, for example, is particularly suitable for orienting sapphire crystal ingots and rods. This instrument supports measurements of sapphire A, C, M, and R crystal orientations, with an adjustable measurement range of 0–45° via electric automation. Its technical specifications are impressive: Copper-target X-ray tube with grounded anode and forced air cooling. Adjustable tube current: 0–4 mA; tube voltage: 30 kV. Operation via computer or touchscreen control. Synchronized movement of the X-ray tube and detector; electric-driven rotary table. Total power consumption: ≤2 kW. Most notably, its sample handling capacity includes crystal ingots weighing up to 30–180 kg, with maximum dimensions of 350 mm in diameter and 480 mm in length. These capabilities make it suitable for large sample detection in most industrial scenarios. 05 Broad Applications Supporting Multiple Industries Dandong Tongda's X-Ray Orientation Analyzers are widely used across various industries involved in the research, processing, and manufacturing of crystal materials. In the semiconductor industry, they enable precise orientation cutting of silicon wafers. In the optoelectronics field, they are used for precision processing of sapphire substrates, optical crystals, and laser crystals. In the piezoelectric materials sector, they ensure accurate cutting angle measurements for stable end-product performance. The instruments are particularly well-suited for sapphire materials, which are in high demand due to their hardness, high light transmittance, and excellent physicochemical stability. Sapphire is widely used in LED substrates, consumer electronic screens, and optical windows. Dandong Tongda's X-Ray Orientation Analyzers have become essential tools in China's crystal material research and manufacturing fields, thanks to their reliable performance, diverse configurations, and strong adaptability. Their modular design and variety of sample stage options allow users to select configurations that meet specific needs, ensuring high detection accuracy while improving work efficiency. Whether for research institutions or manufacturing quality control and process optimization, these instruments provide robust technical support, empowering users to achieve breakthroughs in precision manufacturing.

Dandong Tongda's X-ray Crystal Analyzer adopts advanced X-ray diffraction technology, enabling non-destructive detection of microstructural information in various materials. Whether it's single crystal orientation, defect inspection, lattice parameter measurement, or residual stress analysis, this instrument provides accurate and reliable test data, offering solid support for material research and quality control. The instrument is equipped with a highly stable X-ray generator that delivers exceptional performance. The tube voltage can be precisely adjusted within the range of 10-60kV, and the tube current can be regulated from 2-60mA, with a stability of no more than ±0.005%. This ensures highly repeatable and accurate test results, providing researchers with dependable data assurance. Dandong Tongda's X-ray Crystal Analyzer integrates intelligent control and comprehensive safety protection. It features an imported PLC automatic control system, enabling unattended automatic timed measurements. The multi-level safety protection system includes no-pressure, no-current, over-voltage, over-current, over-power, no-water, and X-ray tube over-temperature protections, ensuring the safety of operators. The TDF series X-ray crystal analyzer adopts a vertical tube housing with four windows that can be used simultaneously. It utilizes imported PLC control technology, which offers high precision and strong anti-interference capabilities, ensuring the reliable operation of the system. The PLC controls the switching and adjustment of high voltage and includes an automatic training function for the X-ray tube, effectively extending the service life of both the X-ray tube and the instrument. The instrument's radiation protection enclosure is constructed with high-density, high-transparency leaded glass, with external radiation leakage far below national safety standards, allowing researchers to conduct experimental studies in a secure environment. As a national high-tech enterprise, Dandong Tongda Technology Co., Ltd. has a comprehensive quality management system and a technical R&D team. Its products not only meet domestic market demands but are also exported to numerous countries and regions, demonstrating the strength and capability of China's scientific instrument manufacturing. Dandong Tongda's X-ray Crystal Analyzer, with its outstanding performance and reliable quality, has become a powerful assistant in the field of material analysis. It helps researchers and engineers unveil the layers of the material world and explore more unknown possibilities.

X-ray crystal analyzer operates on Bragg's law, measuring diffraction patterns to determine crystal structure. Key components include X-ray tube (2.4kW, multiple targets), spectroscopic crystal, detector, and goniometer. TDF series features 4-window operation, PLC control, and automated tube training. Widely used in materials science, chemistry, biology, and geology for structural analysis.

The TDF series X-ray crystal analyzer is a large-scale analytical instrument and X-ray instrument used to study the internal microstructure of materials. It is mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stress, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations.

The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide

Product Spotlight: Dandong Tongda's X-Ray Crystal Analysis Solutions Dandong Tongda Science and Technology introduces its advanced X-ray crystal analysis equipment, delivering precision and reliability for industrial applications. The TDF Series X-Ray Crystal Analyzer combines powerful analytical capabilities with industrial-grade reliability. Featuring four operational windows and PLC control technology, it serves high-end manufacturing sectors including semiconductor wafer inspection, aerospace component stress evaluation, and laser crystal processing. Our X-Ray Crystal Orientators (TYX-200/TYX-2H8) enable rapid, precise measurement of crystal cutting angles with accuracy up to ±30 arcseconds. Capable of handling samples up to 30kg, these instruments support directional cutting of piezoelectric, optical, laser, and semiconductor crystals. Both product lines utilize non-destructive X-ray diffraction technology, replacing traditional radioactive methods while improving processing efficiency and accuracy for crystal material research and manufacturing.

TD-3500 X-Ray Diffractometer delivers exceptional precision with 0.0001° repeatability and advanced PLC control. This versatile instrument performs comprehensive material analysis across powders, films, and bulk samples while ensuring maximum safety through dual protection mechanisms. Adopted by international labs, it sets new standards in analytical performance and reliability for global research applications.

Dandong Tongda launches the TD-Mini, a portable X-ray stress analyzer. It integrates a micro-focus source and area detector to deliver lab-grade precision for on-site testing. Ideal for industrial manufacturing, aerospace, and energy sectors, it delivers fast and reliable measurements.

Dandong Tongda launches its new TD-RSD Residual Stress Analyzer. This advanced X-ray instrument ensures high-precision, efficient measurement and global compliance for enhanced safety and quality in manufacturing processes worldwide.

Dandong Tongda's TDF Series X-ray Crystal Analyzer represents China's breakthrough in high-end, self-developed analytical instruments. It delivers precise, safe, and reliable crystal structure analysis for global materials science and pharmaceutical R&D.

Dandong Tongda's X-ray crystal orienters (±30 arcsec accuracy, 30kg load capacity) deliver precise orientation for piezoelectric, optical, laser, and semiconductor crystals. With specialized models and sample stages, these systems support global crystal research and manufacturing, earning international recognition for Chinese precision instruments.

Dandong Tongda, a leading Chinese manufacturer, produces advanced X-ray crystal orienters. Utilizing X-ray diffraction, these instruments enable precise cutting angle measurement and directional cutting of various crystals. Key models like TYX-200 and TYX-2H8 offer high accuracy (±30″), large sample capacity, user-friendly operation, and efficient detection. Widely used in semiconductor, optics, and research fields, these world-class instruments are certified, patented, and exported globally.