



X-ray diffractometer , also known as X-ray crystal diffractometer, abbreviated XPD or XRD, is an instrument to study the internal microstructure of matter. X-ray diffractometer has the advantages of high precision, high stability and convenient operation.
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X-Ray Diffraction (XRD) is a major method for studying the phase and crystal structure of a substance. When a substance (crystal or non-crystal) is diffraction analysis, the substance is irradiated by X-rays to produce different degrees of diffraction phenomenon, material composition, crystal type, intramolecular bonding mode, molecular configuration, conformation and other material characteristics determine the specific diffraction pattern of the substance.
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