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Dandong Tongda , with 30% R&D staff and full proprietary core technologies, offers a complete XRD product line for research and industry. Export-ready with multilingual support and CE compliance, the company provides quality assurance, global services, and custom solutions worldwide.

Dandong Tongda launches TD-5000, a self-developed high-precision X-ray single crystal diffractometer with 3kW generator, Kappa four-circle goniometer (0.0001° accuracy), hybrid pixel detector, and cryo-control (100–300K). Fully automated, CE-certified, ISO9001, offering cost-effective, reliable structural analysis for global research and industrial users.

Tongda Science and Technology developed China's first X-ray single crystal diffractometer (TD-5000). It offers diffractometers, orienters, analyzers with AI robotics and remote control. 30% R&D staff, 23 patents. Exported globally.

To improve single crystal diffraction data quality, ensure high-quality crystals, select appropriate target, optimize conditions, adjust collection strategies, and perform careful data processing and validation.

Single-crystal X-ray diffraction is essential in materials science for crystal structure analysis, phase identification, and stress analysis. It enables precise atomic-level characterization, supports rational material design, and is advancing with new technologies like synchrotron radiation and AI-assisted structure determination.

A single-crystal X-ray diffractometer reveals 3D atomic structure by analyzing X-ray diffraction patterns (Bragg's Law). Through data collection, Fourier transformation, and model refinement, it generates electron density maps to determine molecular configurations.

A quality single crystal for X-ray diffraction requires optimal solvent choice (moderate solubility/volatility), proper growth method (evaporation/diffusion), high sample purity, and a vibration-free environment to ensure well-defined morphology and minimal defects.

This article details a comprehensive three-pronged strategy to eliminate higher-order diffraction interference in X-ray single-crystal analysis. The methods involve hardware filtration at the source using monochromators and slits, parameter optimization during data collection to suppress detection, and software correction algorithms for residual effects in data processing. This combined approach ensures high-precision crystal structure determination by controlling intensity errors.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. X-ray single crystal diffractometer​ is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. Single crystal XRD is a high-tech product under the National Major Scientific Instrument and Equipment Development Project of the Ministry of Science and Technology, led by Dandong Tongda Technology Co., Ltd., filling the gap in the development and production of single crystal x-ray diffractometer in China.