Rotating Sample Holder
- Tongda
- Liaoning, China
- 1—2 months
- 100 units per year
Rotating Sample Holder
In X-ray diffraction (XRD) analysis for fields such as materials science, geological analysis, and pharmaceutical R&D, the crystal orientation and grain uniformity of a sample directly impact the accuracy and reproducibility of data. Dandong Tongda Technology Co., Ltd. has designed a High-Precision Rotation Sample Stage specifically for X-ray diffractometers. Utilizing unique in-plane rotation technology, it effectively addresses measurement errors caused by coarse grains, texture, or crystal habit in samples, helping users obtain more authentic and reliable diffraction results.
Core Technical Principle: In-Plane Rotation, Precision Statistics
The core function of this sample stage is to drive the sample to rotate continuously and steadily within its own plane.
Elimination of Coarse Grain Errors: When a sample contains a small number of coarse grains, static testing can result in non-statistically representative "spotty" diffraction patterns. By continuously rotating the sample under the X-ray beam, the rotation stage ensures the beam irradiates a larger number of grains with different orientations. This homogenizes the diffraction signal, transforming discrete spots into smooth, continuous diffraction rings and significantly reducing intensity errors caused by coarse grains.
Disruption of Preferred Orientation (Texture): For samples that have developed texture (i.e., preferred orientation of grains) during processing or growth, or samples with specific crystal habits, rotational testing ensures all possible crystal planes have an equal opportunity to diffract. This breaks the dominance of fixed orientation on diffraction intensity, yielding intensity data that truly reflects the phase composition and guarantees excellent reproducibility of measurement results.
Key Performance Parameters & Functions
Rotation Mode: β-axis (sample own plane) rotation.
Rotation Speed: Adjustable from 1 ~ 60 RPM (revolutions per minute), meeting the needs of different testing scenarios.
Operation Modes: Supports constant-speed continuous rotation for routine scans, and stepping mode for more precise measurements.
High-Precision Control: Features a minimum step width of 0.1°, ensuring precise rotational positioning.
Wide Range of Application Scenarios
This rotation sample stage is an ideal choice for the following applications:
Sample preparation and pre-treatment for texture analysis of metallic materials.
Analysis of bulk or powder samples suffering from coarse grain issues.
Analysis of samples with strong preferred orientation, such as rolled plates, coatings, and platy crystals.
Quantitative phase analysis requiring extremely high reproducibility of diffraction intensity.
Rotating Sample Holder(XRD Sample Stage)
Specifications of Rotating Sample Holder:
| Rotation mode | β axis (sample plane) |
| Rotation speed | 1~60RPM |
| Minimum step width | 0.1° |
| Operating mode | Constant speed rotation for sample scanning (step continuous) |
Rotating Sample Holder(XRD Sample Stage)
Dandong Tongda Technology Co., Ltd. is committed to providing high-performance X-ray analysis instruments and accessories for scientific research and industrial testing. This rotation sample stage exemplifies the company's strong capabilities in precision mechanical design and deep understanding of experimental needs.
For more detailed product information, pricing, and after-sales support, please feel free to contact us directly.
