The full name of XRD is X-ray diffraction, which uses the diffraction phenomenon of an X-ray in a crystal to obtain the X-ray signal feature after diffraction, and is then processed to obtain the diffraction pattern. The use of spectral information can not only achieve the determination of the phase of the conventional microscope, but also have a "perspective eye" to see whether there are defects (dislocation) and lattice defects in the crystal.
Fig 1 Action diagram of X-ray diffractometer
In the world of X-ray diffractometer, the X-ray generation system (which produces X-rays) is the "sun", the Angle measurement and detection system is its "eyes", the recording and data processing system is its "brain", and the three work together to output the diffraction pattern.
Fig2 Structure of X-ray diffractometer