In X-ray diffractometer, the multifunctional integrated measuring accessories are crucial component that greatly enhances the functionality and flexibility of the instrument. Used for the analysis of films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films.
Basic overview of multifunctional integrated measuring accessories:
Definition: They are general term for a series of additional devices or modules used in X-ray diffractometer to expand instrument functions, improve measurement accuracy and efficiency.
Purpose: These attachments aim to enable X-ray diffractometer to meet a wider range of experimental needs and provide more comprehensive and accurate material structure information.
The functional characteristics of multifunctional integrated measuring accessories:
Perform polar diagram testing using transmission or reflection methods;
Stress testing can be conducted using either the parallel tilt method or the same tilt method;
Thin film testing (in-plane rotation of the sample).
Technical characteristics of multifunctional integrated measuring accessories:
High precision:They typically use advanced sensing technology and control systems to ensure high precision and repeatability of measurements.
Automation: Many attachments support automated operations and can be seamlessly integrated with the X-ray diffractometer host to achieve one click measurement.
Modular design: facilitates users to select and combine different accessory modules according to their actual needs.
Application areas of multifunctional integrated measuring accessories:
Widely used in fields such as materials science, physics, chemistry, biology, and geology;
Evaluation of metal assembly structures such as rolled plates;
Evaluation of ceramic orientation;
Evaluation of crystal priority orientation in thin film samples;
Residual stress testing of various metal and ceramic materials (evaluation of wear resistance, cutting resistance, etc.);
Residual stress testing of multilayer films (evaluation of film peeling, etc.);
Analysis of surface oxidation and nitride films on high-temperature superconducting materials such as thin films and metal plates;
Glass Si、Analysis of multilayer films on metal substrates (magnetic thin films, metal surface hardening films, etc.);
Analysis of electroplating materials such as macromolecular materials, paper, and lenses.
The multifunctional integrated measuring accessories in X-ray diffractometer are the key to improving instrument performance. They not only enhance the functionality of the instrument, but also improve the accuracy and efficiency of measurement, providing researchers with more comprehensive and in-depth material analysis methods. With the continuous advancement of technology, these attachments will continue to play an important role in promoting scientific research in related fields to achieve more breakthroughs.
