In fields such as materials science, semiconductor manufacturing, and biomedicine, X-ray diffractometers are core instruments for characterizing material crystal structures, phase compositions, and lattice parameters. The diversity of sample forms—powder, thin films, bulk materials, single crystals, etc.—places stringent demands on the adaptability of such equipment. As one of China's key production hubs for X-ray diffractometers, Dandong Tongda has developed and manufactured a series of X-ray diffractometers that feature modular design and precise optical path control technology. These capabilities enable full-scenario compatibility for samples ranging from powders to thin films, providing reliable technical support for material research and quality inspection across various industries.
Efficient analysis of powder samples is a fundamental strength of Dandong Tongda's X-ray diffractometersand a key reason for their widespread use in geological exploration and chemical material R&D. For powder samples, this series of instruments is equipped with dedicated powder sample holders that support conventional preparation methods such as pelletizing and smearing. The horizontal and angular fine-tuning precision of the sample holder can reach 0.001°, ensuring strict parallelism between the sample surface and the incident optical path. Additionally, the high-sensitivity detector and optimized optical system effectively capture characteristic peak signals from powder diffraction. Even trace-doped powder samples can be accurately identified for phase composition. For example, in lithium battery cathode material development, researchers can use X-ray diffractometers to rapidly analyze the crystal purity of lithium iron phosphate powder and assess the degree of lattice defects, providing data-driven guidance for material performance optimization.
To meet the precise characterization needs of thin film samples, Dandong Tongda's X-ray diffractometers demonstrate strong technical adaptability. Thin film materials generally exhibit characteristics such as ultra-thin thickness (nanometer to micrometer scale), weak adhesion, and susceptibility to substrate interference, making it difficult for conventional diffractometers to effectively separate the diffraction signals of the film and substrate. To address this, the X-ray diffractometers employ Grazing-Incidence X-ray Diffraction (GIXRD) technology. By controlling the incident X-ray to strike the sample surface at a very small angle (0.1°–2°), interference from the substrate signal is significantly reduced, allowing focused analysis of the thin film's own crystal structure. The instrument’s thin film sample holder also supports vacuum adsorption or conductive adhesive fixation, preventing displacement of thin film samples during testing. This meets the detection requirements in fields such as semiconductor chip coatings, optical thin films, and flexible electronic devices. For instance, in solar cell thin film R&D, the instrument can accurately analyze the crystallinity and orientation of perovskite thin films, aiding in the enhancement of the cells’ photoelectric conversion efficiency.
Beyond powders and thin films, the X-ray diffractometers further extend their adaptability to more sample forms through modular accessories. For bulk and single-crystal samples, specialized single-crystal sample holders can be installed to enable three-dimensional rotation and positioning. For one-dimensional materials like fibers and nanowires, equipped fiber sample holders ensure alignment along specific directions to obtain oriented diffraction data. Moreover, the instruments support in-situ testing capabilities and can be paired with auxiliary modules such as high/low temperature or high pressure to enable dynamic monitoring of sample structures under various environmental conditions, thereby broadening their application scenarios.
Against the backdrop of the rapid rise of domestic scientific instruments, Dandong Tongda's X-ray diffractometers, with their flexible sample adaptability and high cost-effectiveness, have broken the market monopoly of imported equipment. From fundamental material research in laboratories to quality control on industrial production lines, their precise analysis capabilities for diverse sample forms make them vital tools driving innovation in materials science and industrial upgrading.