The portable X-ray residual stress analyzer is a non-destructive testing device based on X-ray diffraction technology. Its working principle is that when X-rays irradiate a crystalline material, diffraction occurs due to the crystal lattice structure. By measuring the changes in the diffraction angle, the alteration in the interplanar spacing can be precisely calculated, thereby obtaining the internal strain of the material. The residual stress value is ultimately calculated based on the material's elastic modulus. This method is primarily used for measuring surface and near-surface residual stress distribution in materials such as metals and plastics, combining high precision with field adaptability. Measuring residual stress is crucial for evaluating the fatigue strength, stress corrosion resistance, dimensional stability, and service life of workpieces. The TD-Mini X-ray Stress Analyzer from Dandong Tongda Science and Technology Co., Ltd. boasts the following significant features and advantages:
Main Instrument Features
Excellent Portability and Adaptability: Compact size and light weight make it suitable for rapid on-site measurement of large workpieces, complex structural components, and in confined spaces.
Intelligent and Simple Operation: User-friendly operation with an intuitive interface, yet capable of meeting complex detection needs from routine inspection to scientific research analysis.
High Measurement Efficiency: Offers high measurement efficiency with a short single measurement time.
Wide Range of Applications: Broad application scope, usable in industrial manufacturing, aerospace, and the energy sector, among others. Specific applications include stress assessment after processes such as welding, casting, forging, heat treatment (e.g., quenching, carburizing), and shot peening, as well as inspection of critical components like gears, bearings, springs, and bolts.
High-Performance X-Ray Tube
Utilizes a fine-focus ceramic X-ray tube with a power of 60W. The built-in sealed self-circulating cooling system and this integrated efficient heat dissipation design enable it to meet the requirements for continuous 24/7 X-ray operation, while featuring automatic over-temperature protection, ensuring operational reliability and safety.
Multiple target materials are available, including Cr, Cu, Mn, Co, V, Ti, Fe, Mo, etc. Among them, the Chromium (Cr) target is a common choice for measuring residual stress in ferrous materials (such as various steels). The rich selection of target materials allows the instrument to match the most suitable characteristic X-ray wavelength for different materials being tested, achieving optimal diffraction effects and measurement accuracy.
High-Speed Area Photon Counting Detector
Employs advanced silicon strip technology for direct X-ray detection, achieving a high signal-to-noise ratio.
Equipped with a 640-channel silicon strip linear array, with an overall counting rate > 1x10⁹ cps. This means the detector can capture sufficient diffraction signals in a very short time, ensuring high-speed and high-precision measurements.
This detector features a compact size, high speed, and high sensitivity. Its single-photon counting technology can effectively distinguish between noise and real X-ray signals. Even when diffraction signals are weak, it can accurately capture minute changes in interplanar spacing, ensuring the reliability of stress measurement results.