TD-RSD X-ray Diffraction Residual Stress Analyzer by Dandong Tongda Science & Technology Co., Ltd. integrates multiple diffraction geometries and high-precision detection technologies. It is suitable for detecting and analyzing residual stress in various metals, ceramics, and composite materials during processing, heat treatment, and service. It serves as a comprehensive measurement platform for both industrial testing and materials research.
Key Features and Performance Parameters:
High-Voltage Generator: 3 kW power output, providing stable and reliable X-ray excitation conditions.
Detector System: Utilizes a photon-counting area array detector with high sensitivity and fast response characteristics.
Optical Path Adjustment Mechanism: Equipped with a vertical adjustment mechanism for the X-ray emission angle, adapting to various measurement geometries.
Diffraction Geometries: Supports the dual-detector same-tilt (ω) method, dual-detector side-inclination (ψ) method, and oscillation method, covering multiple stress measurement scenarios.
Analysis Software Features: Includes a comprehensive 3D stress analysis module, supporting data processing methods such as ellipse fitting and line profile fitting, capable of handling stress analysis tasks under nearly all complex conditions.
Measurement Accuracy and Repeatability: Tested on stress-free iron powder samples, the standard deviation of stress values from 5 consecutive measurements is less than ±7 MPa, demonstrating excellent system repeatability.
Overall Dimensions: 1300 × 1200 × 1880 mm (L×W×H), featuring a compact structure suitable for both laboratory and field testing environments.
Goniometer and Main Accessories:
Control Method: Fully automated computer control, integrating same-tilt and side-inclination measurement modes, with expandable functionality for integrated oscillation scanning.
X-Ray Tube: Employs a fine-focus ceramic X-ray tube with a built-in sealed self-circulating cooling system, supporting continuous 24/7 operation and featuring automatic over-temperature protection. Multiple target options are available (e.g., Cr, Cu, Mn, Co, V, Ti, Fe, Mo) to meet different material analysis requirements.
Focusing and Positioning: Supports both manual and automatic focusing modes, combined with a laser positioning device for rapid and precise positioning of measurement points.
Detector System Highlights:
Configuration: Two symmetrically arranged high-speed area array photon-counting detectors effectively enhance signal acquisition efficiency and data consistency.
Composite Count Rate: The total count rate exceeds 1 × 10⁹ cps, effectively avoiding count saturation and making it suitable for high-intensity diffraction signal acquisition.
Structural Advantages: The detectors are compact, feature fast response times, and high sensitivity, providing hardware assurance for rapid and high-precision stress measurement.
Summary:
In conclusion, the TD-RSD X-ray Diffraction Residual Stress Analyzer from Dandong Tongda Science & Technology Co., Ltd.is a high-precision, efficient, and safe Chinese-made residual stress analyzer suitable for long-term stable operation in laboratories. Should you have any inquiries, please feel free to contact us!
