TD-Mini X-ray Stress Diffractometer
The portable X-ray residual stress analyzer is a non-destructive testing device based on X-ray diffraction technology. It is primarily used for measuring surface and near-surface residual stress distribution in materials such as metals and plastics, combining high precision with field adaptability.
- Tongda
- Liaoning,China
- 1—2 months
- 100 units per year
- Information
The portable X-ray residual stress analyzer is a non-destructive testing device based on X-ray diffraction technology. It is primarily used for measuring surface and near-surface residual stress distribution in materials such as metals and plastics, combining high precision with field adaptability.
Features:
Compact size and light weight, suitable for rapid on-site measurement.
Simple operation, yet capable of meeting complex detection requirements.
High measurement efficiency, with single measurement time reduced to seconds.
Wide range of applications, usable in industrial manufacturing, aerospace, energy sector, and more.
X-ray Tube：
Fine-focus ceramic X-ray tube with a built-in sealed self-circulating cooling system, capable of meeting requirements for continuous 24/7 X-ray operation, featuring automatic over-temperature protection.
Multiple target materials available, including Cr, Cu, Mn, Co, V, Ti, Fe, Mo, etc.
High-Speed Area-Array Photon-Counting Detector：
Utilizes silicon strip technology for direct X-ray detection.
640 silicon strip line array, with an overall counting rate > 1×10⁹ cps.
Compact size, high speed, and high sensitivity.
