Powder X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!

The TD-3700 X-ray diffractometer is a high-performance and multifunctional X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. The main features are high-performance detectors, diverse scanning methods, convenient and safe operation, stable and reliable performance. For specific details, please refer to the website of Dandong Tongda Technology Co., Ltd.

The X-ray irradiator can generate high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. Throughout history, radioactive isotope irradiators have been used, which require transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiation equipment can be installed in laboratories for convenient and rapid irradiation of cells.

X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

XRD enables precise TiO2 phase quantification, crucial for product quality. Dandong Tongda's TD-series diffractometers, with specialized programs, ensure accurate rutile/anatase analysis (<0.2% error).

The TDM-20 desktop X-ray diffractometer delivers 1200W power in a compact design, surpassing 600W international standards. With ±0.01° linearity and 0.0001° repeatability, it enables precise phase analysis for materials research and industrial QC. Its integrated cooling system and global accessory compatibility make it an ideal cost-effective solution for international laboratories

The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide

Dandong Tongda Science and Technology Co., Ltd. is an industry leader focused on R&D and innovation in key technologies like diffraction analysis. Through academia collaborations, it develops high-efficiency products with independent IP, breaking international monopolies. The company builds its brand on integrity and professionalism, adhering to "Excellence Sets the Standard, Integrity Builds the Brand" to enhance competitiveness and contribute to China's scientific instrument industry.

TD-3700 High-Resolution X-Ray Diffractometer delivers exceptional analytical performance through innovative detector technology and dual scanning modes. Featuring rapid data acquisition, user-friendly operation, and enhanced safety, it enables precise materials analysis across research and industrial applications, setting new standards for Chinese scientific instruments.

The TDM-20 Desktop X-Ray Diffractometer integrates advanced X-ray generation, high goniometric accuracy, and efficient detection in a compact design. It delivers reliable phase analysis for materials science, pharmaceuticals, and industrial QC, backed by global support and international certifications.

TD-5000 X-ray diffractometer breaks international monopoly in high-end scientific instruments. This Chinese innovation delivers exceptional precision (0.0001° accuracy) and advanced detection capabilities, serving researchers in pharmaceuticals, materials science, and chemistry through comprehensive structural analysis.

Trusted Worldwide: Dandong Tongda's X-Ray Orientation Analycer Receives Multi-National Certifications In today's rapidly evolving global landscape of semiconductors, optical devices, and materials science, precise crystal orientation measurement has become crucial for enhancing product quality and production efficiency. As a specialized developer and manufacturer in the field of X-ray analysis instruments, Dandong Tongda Technology Co., Ltd. announces the launch of its high-performance X-Ray Orientation Analyzer. This instrument integrates advanced X-ray diffraction technology with intelligent algorithms, delivering fast and accurate orientation measurement solutions for crystal-related industries worldwide. Technical Principle: The Perfect Integration of X-Ray Diffraction and Precision Measurement The X-Ray Orientation Analyzer operates based on Bragg's diffraction law. When X-rays strike the crystal surface, the regularly arranged atomic planes within the crystal generate diffraction phenomena at specific angles. By capturing these diffraction signals with precision detectors and calculating the diffraction angles, the instrument can accurately determine the crystal's orientation, providing reliable data for subsequent cutting and processing. Compared to traditional orientation methods, X-ray crystal orientation technology offers significant advantages of being non-destructive, high-precision, and highly efficient, ensuring reliable measurement results without damaging the sample. The instrument achieves a measurement accuracy of ±30 arcseconds (±30″), with a minimum reading of 10 arcseconds, meeting the orientation requirements of the vast majority of crystal materials. Product Series: Comprehensive Solutions for Diverse Application Needs Dandong Tongda Technology's X-Ray Orientation Analyzers primarily include two foundational models: the TYX-200 and the TYX-2H8. The TYX-200 model, as the base version, features a digital display with a minimum reading of 10″ and a measurement accuracy of ±30″, making it suitable for routine crystal material orientation needs. The TYX-2H8 model is a comprehensive upgrade of the TYX-200, featuring an improved goniometer structure, enhanced load-bearing tracks, and a raised sample stage. The TYX-2H8 can measure samples weighing 1-30 kg with diameters of 2-8 inches. Certain configurations can even be extended to handle samples weighing 30-180 kg, with diameters up to 350 mm and lengths up to 480 mm. For more complex research requirements, the company also offers the TDF series X-Ray Orientation Analyzers, which utilize imported PLC control technology, offer a tube voltage range of 10-60 kV, and enable broader functionalities including single-crystal orientation, defect detection, and lattice parameter determination. Functional Applications: A Key Tool for Crystal Processing Across Multiple Industries The X-Ray Orientation Analyzer can precisely and rapidly determine the cutting angles of natural and synthetic single crystals and, in coordination with cutting machines, perform oriented cutting. It is an indispensable instrument for the precision machining and manufacturing of crystal devices. In the semiconductor industry, the instrument is widely used for inspecting ingots, wafers, and chips, controlling processes such as cutting, grinding, and polishing to ensure consistent performance of semiconductor devices. For optical crystal and laser crystal processing, the instrument can accurately determine crystal orientation, ensuring the optical performance of optical devices meets design requirements and improving product yield. Particularly in the field of sapphire crystal processing, the instrument can simultaneously satisfy the measurement requirements for sapphire A, C, M, and R crystal orientations, with an electrically adjustable measurement range of 0–45°, adapting to complex processing needs. In the jewelry and gemstone industry, the instrument supports precise orientation of gemstones, enhancing cutting accuracy and the value of finished products, helping manufacturers maximize the optical effects and commercial value of gemstones. Product Features: Innovative Design Enhances User Experience Dandong Tongda Technology's X-Ray Orientation Analyzers incorporate several innovative features that significantly improve the instrument's practicality and reliability. Easy Operation: The instrument can be operated without professional knowledge or extensive skill, lowering the barrier to use and reducing personnel training time. Digital Display: The digital angle display provides intuitive observation, reduces reading errors, and can be zeroed at any position, facilitating direct display of the wafer's angle deviation. Efficient Design: Some models are equipped with dual goniometers that can operate simultaneously, greatly improving inspection efficiency. Enhanced Precision: A special integrator with peak amplification improves detection accuracy, and a vacuum suction sample plate ensures stable sample positioning. Reliability and Durability: The integrated design of the X-ray tube and high-voltage cable enhances high-voltage reliability. The detector high voltage utilizes a DC high-voltage module, ensuring long-term stable operation. Safety Protection: The instrument uses high-density, high-transmittance lead glass as the X-ray protective shield. The external radiation dose does not exceed 0.1 µSv/h, complying with international safety standards. Sample Stage Configuration: Flexible Adaptation to Diverse Measurement Needs To meet the measurement requirements for samples of different shapes and sizes, Dandong Tongda Technology offers various sample stage configurations: TA Type Sample Stage: Designed specifically for cylindrical crystal rods, equipped with load-bearing tracks. It can measure crystal rods weighing 1-30 kg with diameters of 2-6 inches (expandable to 8 inches), and can measure the reference surface of rod-shaped crystals or the surface of sheet-shaped crystal wafers. TB Type Sample Stage: Also designed for cylindrical crystal rods, it incorporates V-shaped support rails and can measure crystal rods up to 500 mm in length, making it particularly suitable for measuring the end faces of rod-shaped crystals. TC Type Sample Stage: Primarily used for detecting the outer circumference reference surface of single crystal wafers such as silicon and sapphire. Its open design overcomes issues of X-ray obstruction and positioning inaccuracies caused by suction plates. TD Type Sample Stage: Designed specifically for multi-point measurement of wafers like silicon and sapphire. The wafer can be manually rotated on the stage (e.g., 0°, 90°, 180°, 270°) to meet specific customer measurement requirements. Global Market: Empowering International Clients to Achieve Technological Breakthroughs Products from Dandong Tongda Technology Co., Ltd. have successfully entered the international market, exporting to multiple countries and regions including the United States, South Korea, Iran, Azerbaijan, Iraq, and Jordan. Adhering to the principles of "Customer First, Product First, Service First," the company provides global users with high-quality high-tech products and comprehensive technical support. For overseas customers, the company offers full technical consultation and after-sales service, including operational training, maintenance support, and spare parts supply, ensuring users have no concerns. Addressing the needs of clients in different regions, the company can also provide customized solutions, including special sample stage design and measurement software adjustments, ensuring the instrument perfectly adapts to specific application scenarios. Multi-language operation interfaces and detailed English technical documentation further lower the usage barrier for overseas customers and enhance the international user experience. Dandong Tongda Technology's X-Ray Orientation Analyzer is not merely a measurement tool but a strategic partner for enhancing corporate competitiveness. It can significantly shorten the R&D cycle for crystal materials, optimize production processes, ensure product quality, and create tangible value for the global crystal manufacturing industry. Whether in semiconductor chip manufacturing, optical component processing, or new material research, choosing Dandong Tongda Technology means opting for reliable, efficient, and precise crystal orientation solution.