The TD-3700 X-ray diffractometer is a high-performance and multifunctional X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. The main features are high-performance detectors, diverse scanning methods, convenient and safe operation, stable and reliable performance. For specific details, please refer to the website of Dandong Tongda Technology Co., Ltd.

The X-ray irradiator can generate high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. Throughout history, radioactive isotope irradiators have been used, which require transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiation equipment can be installed in laboratories for convenient and rapid irradiation of cells.

X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

Trusted Worldwide: Dandong Tongda's X-Ray Orientation Analycer Receives Multi-National Certifications In today's rapidly evolving global landscape of semiconductors, optical devices, and materials science, precise crystal orientation measurement has become crucial for enhancing product quality and production efficiency. As a specialized developer and manufacturer in the field of X-ray analysis instruments, Dandong Tongda Technology Co., Ltd. announces the launch of its high-performance X-Ray Orientation Analyzer. This instrument integrates advanced X-ray diffraction technology with intelligent algorithms, delivering fast and accurate orientation measurement solutions for crystal-related industries worldwide. Technical Principle: The Perfect Integration of X-Ray Diffraction and Precision Measurement The X-Ray Orientation Analyzer operates based on Bragg's diffraction law. When X-rays strike the crystal surface, the regularly arranged atomic planes within the crystal generate diffraction phenomena at specific angles. By capturing these diffraction signals with precision detectors and calculating the diffraction angles, the instrument can accurately determine the crystal's orientation, providing reliable data for subsequent cutting and processing. Compared to traditional orientation methods, X-ray crystal orientation technology offers significant advantages of being non-destructive, high-precision, and highly efficient, ensuring reliable measurement results without damaging the sample. The instrument achieves a measurement accuracy of ±30 arcseconds (±30″), with a minimum reading of 10 arcseconds, meeting the orientation requirements of the vast majority of crystal materials. Product Series: Comprehensive Solutions for Diverse Application Needs Dandong Tongda Technology's X-Ray Orientation Analyzers primarily include two foundational models: the TYX-200 and the TYX-2H8. The TYX-200 model, as the base version, features a digital display with a minimum reading of 10″ and a measurement accuracy of ±30″, making it suitable for routine crystal material orientation needs. The TYX-2H8 model is a comprehensive upgrade of the TYX-200, featuring an improved goniometer structure, enhanced load-bearing tracks, and a raised sample stage. The TYX-2H8 can measure samples weighing 1-30 kg with diameters of 2-8 inches. Certain configurations can even be extended to handle samples weighing 30-180 kg, with diameters up to 350 mm and lengths up to 480 mm. For more complex research requirements, the company also offers the TDF series X-Ray Orientation Analyzers, which utilize imported PLC control technology, offer a tube voltage range of 10-60 kV, and enable broader functionalities including single-crystal orientation, defect detection, and lattice parameter determination. Functional Applications: A Key Tool for Crystal Processing Across Multiple Industries The X-Ray Orientation Analyzer can precisely and rapidly determine the cutting angles of natural and synthetic single crystals and, in coordination with cutting machines, perform oriented cutting. It is an indispensable instrument for the precision machining and manufacturing of crystal devices. In the semiconductor industry, the instrument is widely used for inspecting ingots, wafers, and chips, controlling processes such as cutting, grinding, and polishing to ensure consistent performance of semiconductor devices. For optical crystal and laser crystal processing, the instrument can accurately determine crystal orientation, ensuring the optical performance of optical devices meets design requirements and improving product yield. Particularly in the field of sapphire crystal processing, the instrument can simultaneously satisfy the measurement requirements for sapphire A, C, M, and R crystal orientations, with an electrically adjustable measurement range of 0–45°, adapting to complex processing needs. In the jewelry and gemstone industry, the instrument supports precise orientation of gemstones, enhancing cutting accuracy and the value of finished products, helping manufacturers maximize the optical effects and commercial value of gemstones. Product Features: Innovative Design Enhances User Experience Dandong Tongda Technology's X-Ray Orientation Analyzers incorporate several innovative features that significantly improve the instrument's practicality and reliability. Easy Operation: The instrument can be operated without professional knowledge or extensive skill, lowering the barrier to use and reducing personnel training time. Digital Display: The digital angle display provides intuitive observation, reduces reading errors, and can be zeroed at any position, facilitating direct display of the wafer's angle deviation. Efficient Design: Some models are equipped with dual goniometers that can operate simultaneously, greatly improving inspection efficiency. Enhanced Precision: A special integrator with peak amplification improves detection accuracy, and a vacuum suction sample plate ensures stable sample positioning. Reliability and Durability: The integrated design of the X-ray tube and high-voltage cable enhances high-voltage reliability. The detector high voltage utilizes a DC high-voltage module, ensuring long-term stable operation. Safety Protection: The instrument uses high-density, high-transmittance lead glass as the X-ray protective shield. The external radiation dose does not exceed 0.1 µSv/h, complying with international safety standards. Sample Stage Configuration: Flexible Adaptation to Diverse Measurement Needs To meet the measurement requirements for samples of different shapes and sizes, Dandong Tongda Technology offers various sample stage configurations: TA Type Sample Stage: Designed specifically for cylindrical crystal rods, equipped with load-bearing tracks. It can measure crystal rods weighing 1-30 kg with diameters of 2-6 inches (expandable to 8 inches), and can measure the reference surface of rod-shaped crystals or the surface of sheet-shaped crystal wafers. TB Type Sample Stage: Also designed for cylindrical crystal rods, it incorporates V-shaped support rails and can measure crystal rods up to 500 mm in length, making it particularly suitable for measuring the end faces of rod-shaped crystals. TC Type Sample Stage: Primarily used for detecting the outer circumference reference surface of single crystal wafers such as silicon and sapphire. Its open design overcomes issues of X-ray obstruction and positioning inaccuracies caused by suction plates. TD Type Sample Stage: Designed specifically for multi-point measurement of wafers like silicon and sapphire. The wafer can be manually rotated on the stage (e.g., 0°, 90°, 180°, 270°) to meet specific customer measurement requirements. Global Market: Empowering International Clients to Achieve Technological Breakthroughs Products from Dandong Tongda Technology Co., Ltd. have successfully entered the international market, exporting to multiple countries and regions including the United States, South Korea, Iran, Azerbaijan, Iraq, and Jordan. Adhering to the principles of "Customer First, Product First, Service First," the company provides global users with high-quality high-tech products and comprehensive technical support. For overseas customers, the company offers full technical consultation and after-sales service, including operational training, maintenance support, and spare parts supply, ensuring users have no concerns. Addressing the needs of clients in different regions, the company can also provide customized solutions, including special sample stage design and measurement software adjustments, ensuring the instrument perfectly adapts to specific application scenarios. Multi-language operation interfaces and detailed English technical documentation further lower the usage barrier for overseas customers and enhance the international user experience. Dandong Tongda Technology's X-Ray Orientation Analyzer is not merely a measurement tool but a strategic partner for enhancing corporate competitiveness. It can significantly shorten the R&D cycle for crystal materials, optimize production processes, ensure product quality, and create tangible value for the global crystal manufacturing industry. Whether in semiconductor chip manufacturing, optical component processing, or new material research, choosing Dandong Tongda Technology means opting for reliable, efficient, and precise crystal orientation solution.

Scientific Instrument Breakthrough: Dandong Tongda's TD-3700 X-Ray Diffractometer Empowers Research Innovation Dandong Tongda Science and Technology Co., Ltd. is a high-tech enterprise specializing in the research, development, and production of X-ray analysis instruments. Its flagship product, the TD-3700 X-Ray Diffractometer , integrates rapid analysis, user-friendly operation, and robust safety features. The perfect synergy between its modular hardware and customized software systems makes it a powerful tool for research fields such as materials science, chemistry, and mineralogy. TheTD-3700 X-Ray Diffractometer demonstrates significant advantages in both detection technology and measurement modes, enabling it to meet a wide range of analytical demands. Core Technology and Performance High-Performance Detectors: The instrument can be equipped with optional high-speed 1D array detectors (e.g., MYTHEN2R), SDD detectors, or 2D detectors. Utilizing hybrid photon counting technology, it operates with no readout noise, achieves data acquisition speeds tens to hundreds of times faster than traditional scintillation detectors, and effectively eliminates fluorescence effects for excellent energy resolution. For instance, the 1D array detector features 640 channels with a remarkably short readout time of just 89 microseconds, contributing to an outstanding signal-to-noise ratio. Flexible Scanning Modes: The TD-3700 X-Ray Diffractometer supports two primary data scanning methods: conventional reflection (diffraction) mode and transmission mode. The transmission mode provides higher resolution, making it suitable for analyzing limited samples or conducting structural analysis. The reflection mode offers a stronger signal, which is more appropriate for routine phase identification in laboratory settings. This flexibility enables the instrument to handle a wide variety of sample types, ranging from trace amounts of powder and bulk solids to even liquids and viscous samples. Precision Goniometer System: It employs a θS-θd vertical goniometer where the sample remains horizontal and stationary during measurement. This design not only facilitates easier sample preparation but also helps prevent potential corrosion of the goniometer's axis system by samples, thereby extending its operational lifespan. With a wide 2θ scanning range (-110° to 161°) and exceptional repetitive accuracy of 0.0001°, it ensures highly precise and repeatable measurements. Instrument Features & Safety Assurance The TD-3700 X-Ray Diffractometer is designed with a strong emphasis on user experience and operational safety. User-Friendly Design: Effortless Operation: Features a one-click acquisition system and incorporates a touchscreen interface for real-time monitoring of instrument status. Modular Design: Components are designed for plug-and-play functionality, requiring no calibration and ensuring straightforward maintenance. Comprehensive Safety Protection: Incorporates an electronic lead door interlock system for dual-layer protection, ensuring user safety. External radiation leakage from the protection system is ≤ 0.1μSv/h, complying with stringent international safety standards. Includes multiple protective functions against excessively high/low kV, excessively high/low mA, water flow failure, and X-ray tube overheating. Stable & Reliable System: Utilizes a high-frequency, high-voltage X-ray generator known for its stable and reliable performance, with system stability ≤ 0.005%. The integrated recirculating chiller has a built-in cooling function, eliminating the need for an external water circulation unit. Applications & Global Recognition The TD-3700 X-Ray Diffractometer is widely used for qualitative/quantitative phase analysis, crystal structure analysis, materials structure research, grain size determination, and crystallinity measurement. Recognized for their reliable quality, Dandong Tongda's products have been exported to numerous countries and regions including the United States, South Korea, Iran, Azerbaijan, Iraq, and Jordan, earning validation in the international market. The company has also obtained ISO9001 and other international quality management system certifications.Dandong Tongda Science and Technology Co., Ltd.provides customers with comprehensive service and support, including after-sales service, professional training, and international business support. We warmly welcome your inquiries and look forward to your procurement!

TDM-20 Mini X-Ray Diffractometer is a high-performance benchtop analytical instrument developed and manufactured by Dandong Tongda Technology Co., Ltd.​ It is primarily used for phase analysis of polycrystalline materials such as powders, solids, bulk specimens, and pastes. Utilizing the principle of X-ray diffraction, the instrument enables qualitative and quantitative analysis, crystal structure analysis, and other functions. It finds extensive applications across various fields including industry, agriculture, defense, pharmaceuticals, mineralogy, food safety, petroleum, and educational research. TDM-20 Benchtop X-ray Diffractometer breaks through the conventional 600W limitation, delivering a maximum output power of 1200W for high-power performance. Additionally, it incorporates a high-frequency, high-voltage power supply, resulting in lower overall power consumption. It boasts high-precision goniometer technology with an angular repeatability of 0.0001°, a diffraction peak position measurement accuracy of 0.001°, and a full-profile diffraction angle linearity of ±0.010°.The instrument incorporates an advanced control system based on PLC (Programmable Logic Controller) technology and a modular design for precise operation. For detection, it can be equipped with either a proportional detector or a new high-performance array detector, significantly enhancing overall performance and data acquisition speed. The TDM-20 also offers highly flexible configuration options, supporting a variety of accessories such as a rotating sample stage, a 1D array detector, and a 6-position automatic sample changer. TDM-20 Mini X-Ray Diffractometer is further characterized by its significant advantage of being compact and portable, with a small footprint and low weight. It is recognized as one of the smallest benchtop X-ray diffractometers globally, rendering it highly suitable for laboratory environments where space is limited. Furthermore, the instrument is provided with a triple interference-free isolation protection scheme. The X-ray leakage radiation is maintained at ≤ 0.12 μSv/h, ensuring compliance with the GBZ 115-2002 protection standard. Hence, the use of the TDM-20 Mini X-Ray Diffractometer is confirmed to be safe and reliable. TDM-20 Mini X-Ray Diffractometer integrates high power, high precision, and a compact design into a single platform. It transcends the limitations of traditional, large-scale X-ray diffractometers, delivering an efficient, convenient, and reliable material analysis solution for various industries. With its advanced technical performance, comprehensive service support, and flexible operation, the TDM-20serves as a powerful tool for laboratory-based material analysis. If you have any requirements for X-ray diffraction equipment, we welcome you to choose the products from Dandong Tongda Science and Technology Co., Ltd.

The auto sample changer adopts an imported stepper motor drive and a programmable logic controller (PLC) as the core control system. The selection of these two key components significantly ensures the precision, stability, and long-term reliability of the equipment's operation. The workflow of the auto sample changer is designed to be simple and efficient: The operator pre-loads up to six samples sequentially into designated positions of the sample changer. After setting the measurement parameters via the control system, the sample changer begins operation. Following program instructions, it automatically and accurately delivers each sample in sequence to the measurement position of the X-ray diffractometer.Once the measurement of one sample is completed, the device automatically removes it and swiftly delivers the next sample until all samples are measured. Measurement data is automatically saved, facilitating subsequent review and analysis while reducing recording errors that may arise from manual operations.The entire process requires no manual intervention, allowing the operator to free up time for other tasks and avoiding potential fatigue-related errors from prolonged operation. In addition to the basic auto sample changing function, the equipment also boasts several noteworthy features: Efficiency Enhancement: Enables unattended continuous auto measurement, making it particularly suitable for rapid screening of batch samples or sequential analysis over long periods. Data Consistency: The automated process reduces human intervention, helping to improve the repeatability and comparability of measurement data. Ease of Operation: The PLC-based control system is typically stable and user-friendly, lowering the operational threshold. Flexible Application: Primarily used in fields such as environmental protection, electronics/batteries, and other areas requiring material analysis technologies. This auto sample changer primarily serves the application field of X-ray diffraction (XRD) analysis. Dandong Tongda Science and Technology Co., Ltd. has accumulated experience in the field of analytical instruments. Its TD series of analytical instruments and non-destructive testing equipment are applied in various material research fields. This 6-position (or 12-position) auto sample changer reflects the company's approach of integrating automation technology into traditional testing equipment to enhance overall efficiency. As a functional accessory, it works in coordination with X-ray diffractometers, enhancing the automation capabilities of the host instrument.

The TD-5000 X-ray Single-Crystal Diffractometer is a high-performance instrument developed by Dandong Tongda Technology. Approved under China's National Key Scientific Instrument and Equipment Development Project, it fills a critical domestic gap in this field. Its primary function is determining the three-dimensional spatial structure and electron density distribution of crystalline substances—including inorganic compounds, organic compounds, and metal complexes—while also analyzing structures of special materials like twinned crystals, incommensurately modulated structures, and quasicrystals. It precisely measures the accurate 3D spatial structure of new crystalline compounds (including bond lengths, bond angles, configuration, conformation, and bonding electron density) and the actual arrangement of molecules within the crystal lattice. The system provides comprehensive structural information such as unit cell parameters, space group, molecular structure, intermolecular hydrogen bonding and weak interactions, and molecular configuration/conformation. It is widely used for analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. Core Technology: A Dual Revolution in Precision and Intelligence (1) The "Mechanical Eye" with Atomic-Level Positioning Four-Circle Concentric Diffractometer: Overcomes traditional mechanical offset limitations, maintaining a constant rotational center to ensure diffraction spot coordinate errors remain below the nanometer level. PILATUS Detector: Combines single-photon counting technology with 172μm ultra-fine pixels. Achieves frame rates up to 20Hz, with noise suppression capability 3 times greater than conventional CCD detectors. (2) Fully Intelligent Closed-Loop Workflow PLC One-Touch Control: Automates the entire process from crystal positioning to data acquisition, reducing manual operation time by 90%. Cryogenic Enhancement System: Features ±0.3 K precision temperature control (100K–300K), boosting signal intensity for weakly diffracting crystals by 50% with liquid nitrogen consumption of only 1.1–2 L/h. (3) Dual Assurance: Safety and Expandability Lead Door Interlock + Leakage Protection (≤0.12 µSv/h), exceeding national safety standards. Optional Multilayer Focusing Optics (Mo/Cu Dual Target), enabling full-scale analysis from small-molecule pharmaceuticals to minerals with large unit cells. The advent of the TD-5000 X-ray Single-Crystal Diffractometer signifies more than an instrumental breakthrough—it marks the era where China's high-end scientific research equipment officially achieves autonomous precision definition. As of 2025, this system has served over 30 leading institutions across fields including chemistry, materials science, and aerospace. As crystals unveil the secrets of life under the probing gaze of domestically developed instruments, China's scientific "eye that discerns the essence of matter" now shines with brilliant clarity.

Product Spotlight: Dandong Tongda's X-Ray Crystal Analysis Solutions Dandong Tongda Science and Technology introduces its advanced X-ray crystal analysis equipment, delivering precision and reliability for industrial applications. The TDF Series X-Ray Crystal Analyzer combines powerful analytical capabilities with industrial-grade reliability. Featuring four operational windows and PLC control technology, it serves high-end manufacturing sectors including semiconductor wafer inspection, aerospace component stress evaluation, and laser crystal processing. Our X-Ray Crystal Orientators (TYX-200/TYX-2H8) enable rapid, precise measurement of crystal cutting angles with accuracy up to ±30 arcseconds. Capable of handling samples up to 30kg, these instruments support directional cutting of piezoelectric, optical, laser, and semiconductor crystals. Both product lines utilize non-destructive X-ray diffraction technology, replacing traditional radioactive methods while improving processing efficiency and accuracy for crystal material research and manufacturing.

The TDF series X-ray crystal analyzer is a large-scale analytical instrument used to study the internal microstructure of substances. It is mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations.

The TDM-20 high-power X-ray diffractometer (benchtop XRD) is mainly used for phase analysis of powders, solids, and similar paste like materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. It is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. It produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!