The crystal orientation instrument serves as a critical navigator in high-end manufacturing, enabling precise, non-destructive detection of atomic alignment in materials like silicon and sapphire. It ensures optimal cutting and processing in semiconductor and optical industries, enhancing product performance, reducing waste, and supporting automated, high-precision production.

X-ray crystal orientation analyzers are vital for developing high-performance optoelectronic materials like those in LEDs and solar cells. They enable precise control of crystal structure during growth and thin-film production, ensuring optimal quality. Essential for R&D, they bridge fundamental science and industrial manufacturing, supporting innovation in next-generation devices.

Enhance resolution by upgrading to a high-resolution detector, optimizing crystal quality, employing precise data collection strategies, utilizing advanced software, and ensuring regular instrument maintenance.

A single-crystal X-ray diffractometer reveals 3D atomic structure by analyzing X-ray diffraction patterns (Bragg's Law). Through data collection, Fourier transformation, and model refinement, it generates electron density maps to determine molecular configurations.

A quality single crystal for X-ray diffraction requires optimal solvent choice (moderate solubility/volatility), proper growth method (evaporation/diffusion), high sample purity, and a vibration-free environment to ensure well-defined morphology and minimal defects.

This article details a comprehensive three-pronged strategy to eliminate higher-order diffraction interference in X-ray single-crystal analysis. The methods involve hardware filtration at the source using monochromators and slits, parameter optimization during data collection to suppress detection, and software correction algorithms for residual effects in data processing. This combined approach ensures high-precision crystal structure determination by controlling intensity errors.

A premier X-ray crystal analyzer enabling precise exploration of material microstructures. Its advanced PLC control, modular design, and robust 5KW output ensure high reliability for global R&D and industrial quality control applications.

Dandong Tongda Tech, a professional manufacturer of X-ray analysis instruments, provides high-precision crystal orienters. These key instruments ensure machining accuracy in the research and manufacturing of piezoelectric, optical, laser, and semiconductor crystals, supporting high-end industries.

Dandong Tongda Science & Technology Co., Ltd., achieved a breakthrough by independently developing the TD-5000 X-ray single crystal diffractometer through collaboration with Academician Chen Xiaoming. This success, stemming from a national R&D project, signifies China's leap in high-end scientific instruments, gaining both domestic and international market recognition.

Amidst ongoing breakthroughs and technological innovations in global materials science, China's scientific instrument manufacturing industry is steadily rising to prominence. The TDF Series X-ray Crystal Analyzer, developed by Dandong Tongda Technology Co., Ltd., represents a leading example of domestically produced high-end analytical instrumentation. It is gaining traction in global scientific research and industrial sectors precisely due to its exceptional performance and reliable precision. The TDF Series X-ray Crystal Analyzer is a major analytical instrument designed for investigating the internal microstructure of substances. Its key applications encompass crystal orientation, defect inspection, lattice parameter determination, and residual stress measurement. Whether analyzing the structure of plates and rods, or deciphering the structure of unknown materials and single crystal dislocations, this equipment delivers accurate and reliable data support. In modern fields like materials science, semiconductor manufacturing, new energy development, and pharmaceuticals, a deep understanding of material microstructure has become the cornerstone of technological progress. The TDF Series is engineered for this purpose – empowering scientists and engineers worldwide to unlock the secrets of material properties. Vertical Tube Housing & Four-Port Design The TDF Series X-ray Crystal Analyzer incorporates a unique vertical tube housing design with four usable ports simultaneously. This innovative design significantly enhances operational efficiency, allowing users to switch rapidly between multiple experimental channels and save valuable research time. Precision Control with PLC Technology Equipped with an imported PLC control system, the TDF Series X-ray Crystal Analyzer demonstrates outstanding performance in control precision and anti-interference capabilities. This system not only enables precise control of high-voltage switching and lifting operations but also features an automatic X-ray tube training function, effectively extending the service life of both the X-ray tube and the entire instrument. For experimental scenarios requiring long-term, continuous operation, this reliability substantially reduces the risk of equipment failure and potential data loss. Powerful and Stable High-Voltage Generation System The high-voltage generator of the TDF Series performs exceptionally well, offering a tube voltage adjustable from 10 to 60 kV and a tube current range from 2 to 80 mA, with a rated output power of up to 5 kW. The stability of tube voltage and current reaches 0.3‰, ensuring highly reproducible experimental data. The system is also equipped with multiple protection functions (e.g., no voltage, overvoltage, no mA, over-power, no water, X-ray tube overtemperature), providing comprehensive safety assurance. Versatile X-Ray Tube Configurations To accommodate diverse analytical needs, the TDF Series offers a choice of various target materials, including Cu, Co, Fe, Cr, Mo, and W. With a rated power of 2.4 kW and focal spot options of point focus (1×1) and line focus (1×10), users can select the most suitable configuration based on sample characteristics and analytical objectives. Comprehensive Safety Protection Design Safety performance is another standout feature of the TDF Series X-ray Crystal Analyzer. Utilizing high-density, high-transparency lead glass for the X-ray protective shielding, the external radiation leakage is maintained at ≤ 0.1 μSv/h – a level well below international safety standards – ensuring reliable protection for operators. Configurations for Diverse Application Scenarios The TDF Series X-ray Crystal Analyzer supports various X-ray cameras, including Laue cameras (large/small powder), flat panel cameras, 3D sample stages, and Multiwire cameras (US-made). This flexible configuration scheme enables the instrument to adapt to a wide range of requirements, from fundamental research to high-end materials analysis. For applications demanding high-precision positioning, the TDF Series X-ray Crystal Analyzer offers a maximum positioning speed of up to 1500°/min, ensuring fast and accurate data acquisition. Whether for analyzing unknown materials in scientific research or for quality monitoring in industrial production, the TDF Series provides a dependable solution. As cutting-edge fields like new materials, new energy, and semiconductors continue to develop rapidly, the demand for material microstructure analysis is growing, and the required precision is constantly increasing. The TDF Series X-ray Crystal Analyzer will continue to evolve and upgrade to meet the latest needs of the global scientific and industrial communities. Dandong Tongda Technology Co., Ltd. remains committed to its philosophy of technological innovation and quality first. We will continue to provide global users with superior products and services, working hand-in-hand with scientists and engineers worldwide to jointly advance materials science and enhance industrial quality standards. We invite global partners and users to inquire and discuss collaboration opportunities. Discover more about the technical details and application cases of the TDF Series X-ray Crystal Analyzer. Let's join hands to explore the mysteries of the microscopic world of materials and jointly drive technological innovation and industrial progress!

The TD-5000 X-ray Single-Crystal Diffractometer is the outcome of a Major Scientific Instrument Development Project funded by China's Ministry of Science and Technology, with Dandong Tongda Science and Technology Co., Ltd. as the lead unit. This instrument represents a significant breakthrough for China in the high-end scientific instrument sector, filling a longstanding domestic gap in the development and manufacturing of single-crystal diffractometers. Its industry recognition is underscored by the prestigious "3i Award - 2022 Outstanding New Instrument of the Year," a highly authoritative accolade in the field.The TD-5000 X-ray Single-Crystal Diffractometer is capable of determining the three-dimensional spatial structure and electron density distribution of crystalline substances, including inorganic compounds, organic compounds, and metal complexes. It can analyze key crystal parameters such as bond lengths, bond angles, configuration, conformation, unit cell parameters, space group, and intermolecular interactions. The instrument is designed to determine the precise three-dimensional spatial structure of new compounds (in crystalline form)—including bond lengths, angles, configuration, conformation, and even bonding electron density—as well as the actual arrangement of molecules within the crystal lattice. It provides comprehensive structural information such as unit cell parameters, space group, molecular crystal structure, hydrogen bonding and weak intermolecular interactions, and molecular configuration and conformation.It is widely used in analytical research across various fields including chemical crystallography, molecular biology, pharmaceutical sciences, mineralogy, and materials science.The system is user-friendly, featuring one-click collection and a modular design. It employs high-precision goniometry with four-circle concentric technology to ensure goniometer center stability. Additionally, it is equipped with a high-performance detector and offers the option of a PILATUS hybrid pixel array detector, enabling high data quality and very fast scanning speeds. Beyond performance, the instrument is safe and reliable, featuring an electronic lead glass door interlock system that provides dual protection. The TD-5000 X-ray Single-Crystal Diffractometer is a precision analytical instrument designed for scientific research and high-end industrial applications. It excels in key performance metrics through sophisticated design and represents a significant breakthrough in its category. For users with relevant procurement needs who demand high-quality, high-standard instrumentation, it is a option worthy of serious consideration. Dandong Tongda Technology Co., Ltd. is committed to fully meeting your expectations with reliable performance and professional support. We look forward to your inquiries and potential collaboration.