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The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide

TD-3700 High-Resolution X-Ray Diffractometer delivers exceptional analytical performance through innovative detector technology and dual scanning modes. Featuring rapid data acquisition, user-friendly operation, and enhanced safety, it enables precise materials analysis across research and industrial applications, setting new standards for Chinese scientific instruments.

TD-5000 X-ray diffractometer breaks international monopoly in high-end scientific instruments. This Chinese innovation delivers exceptional precision (0.0001° accuracy) and advanced detection capabilities, serving researchers in pharmaceuticals, materials science, and chemistry through comprehensive structural analysis.

Scientific Instrument Breakthrough: Dandong Tongda's TD-3700 X-Ray Diffractometer Empowers Research Innovation Dandong Tongda Science and Technology Co., Ltd. is a high-tech enterprise specializing in the research, development, and production of X-ray analysis instruments. Its flagship product, the TD-3700 X-Ray Diffractometer , integrates rapid analysis, user-friendly operation, and robust safety features. The perfect synergy between its modular hardware and customized software systems makes it a powerful tool for research fields such as materials science, chemistry, and mineralogy. TheTD-3700 X-Ray Diffractometer demonstrates significant advantages in both detection technology and measurement modes, enabling it to meet a wide range of analytical demands. Core Technology and Performance High-Performance Detectors: The instrument can be equipped with optional high-speed 1D array detectors (e.g., MYTHEN2R), SDD detectors, or 2D detectors. Utilizing hybrid photon counting technology, it operates with no readout noise, achieves data acquisition speeds tens to hundreds of times faster than traditional scintillation detectors, and effectively eliminates fluorescence effects for excellent energy resolution. For instance, the 1D array detector features 640 channels with a remarkably short readout time of just 89 microseconds, contributing to an outstanding signal-to-noise ratio. Flexible Scanning Modes: The TD-3700 X-Ray Diffractometer supports two primary data scanning methods: conventional reflection (diffraction) mode and transmission mode. The transmission mode provides higher resolution, making it suitable for analyzing limited samples or conducting structural analysis. The reflection mode offers a stronger signal, which is more appropriate for routine phase identification in laboratory settings. This flexibility enables the instrument to handle a wide variety of sample types, ranging from trace amounts of powder and bulk solids to even liquids and viscous samples. Precision Goniometer System: It employs a θS-θd vertical goniometer where the sample remains horizontal and stationary during measurement. This design not only facilitates easier sample preparation but also helps prevent potential corrosion of the goniometer's axis system by samples, thereby extending its operational lifespan. With a wide 2θ scanning range (-110° to 161°) and exceptional repetitive accuracy of 0.0001°, it ensures highly precise and repeatable measurements. Instrument Features & Safety Assurance The TD-3700 X-Ray Diffractometer is designed with a strong emphasis on user experience and operational safety. User-Friendly Design: Effortless Operation: Features a one-click acquisition system and incorporates a touchscreen interface for real-time monitoring of instrument status. Modular Design: Components are designed for plug-and-play functionality, requiring no calibration and ensuring straightforward maintenance. Comprehensive Safety Protection: Incorporates an electronic lead door interlock system for dual-layer protection, ensuring user safety. External radiation leakage from the protection system is ≤ 0.1μSv/h, complying with stringent international safety standards. Includes multiple protective functions against excessively high/low kV, excessively high/low mA, water flow failure, and X-ray tube overheating. Stable & Reliable System: Utilizes a high-frequency, high-voltage X-ray generator known for its stable and reliable performance, with system stability ≤ 0.005%. The integrated recirculating chiller has a built-in cooling function, eliminating the need for an external water circulation unit. Applications & Global Recognition The TD-3700 X-Ray Diffractometer is widely used for qualitative/quantitative phase analysis, crystal structure analysis, materials structure research, grain size determination, and crystallinity measurement. Recognized for their reliable quality, Dandong Tongda's products have been exported to numerous countries and regions including the United States, South Korea, Iran, Azerbaijan, Iraq, and Jordan, earning validation in the international market. The company has also obtained ISO9001 and other international quality management system certifications.Dandong Tongda Science and Technology Co., Ltd.provides customers with comprehensive service and support, including after-sales service, professional training, and international business support. We warmly welcome your inquiries and look forward to your procurement!

TDM-20 Mini X-Ray Diffractometer is a high-performance benchtop analytical instrument developed and manufactured by Dandong Tongda Technology Co., Ltd.​ It is primarily used for phase analysis of polycrystalline materials such as powders, solids, bulk specimens, and pastes. Utilizing the principle of X-ray diffraction, the instrument enables qualitative and quantitative analysis, crystal structure analysis, and other functions. It finds extensive applications across various fields including industry, agriculture, defense, pharmaceuticals, mineralogy, food safety, petroleum, and educational research. TDM-20 Benchtop X-ray Diffractometer breaks through the conventional 600W limitation, delivering a maximum output power of 1200W for high-power performance. Additionally, it incorporates a high-frequency, high-voltage power supply, resulting in lower overall power consumption. It boasts high-precision goniometer technology with an angular repeatability of 0.0001°, a diffraction peak position measurement accuracy of 0.001°, and a full-profile diffraction angle linearity of ±0.010°.The instrument incorporates an advanced control system based on PLC (Programmable Logic Controller) technology and a modular design for precise operation. For detection, it can be equipped with either a proportional detector or a new high-performance array detector, significantly enhancing overall performance and data acquisition speed. The TDM-20 also offers highly flexible configuration options, supporting a variety of accessories such as a rotating sample stage, a 1D array detector, and a 6-position automatic sample changer. TDM-20 Mini X-Ray Diffractometer is further characterized by its significant advantage of being compact and portable, with a small footprint and low weight. It is recognized as one of the smallest benchtop X-ray diffractometers globally, rendering it highly suitable for laboratory environments where space is limited. Furthermore, the instrument is provided with a triple interference-free isolation protection scheme. The X-ray leakage radiation is maintained at ≤ 0.12 μSv/h, ensuring compliance with the GBZ 115-2002 protection standard. Hence, the use of the TDM-20 Mini X-Ray Diffractometer is confirmed to be safe and reliable. TDM-20 Mini X-Ray Diffractometer integrates high power, high precision, and a compact design into a single platform. It transcends the limitations of traditional, large-scale X-ray diffractometers, delivering an efficient, convenient, and reliable material analysis solution for various industries. With its advanced technical performance, comprehensive service support, and flexible operation, the TDM-20serves as a powerful tool for laboratory-based material analysis. If you have any requirements for X-ray diffraction equipment, we welcome you to choose the products from Dandong Tongda Science and Technology Co., Ltd.

The TD-5000 X-ray Single-Crystal Diffractometer is a high-performance instrument developed by Dandong Tongda Technology. Approved under China's National Key Scientific Instrument and Equipment Development Project, it fills a critical domestic gap in this field. Its primary function is determining the three-dimensional spatial structure and electron density distribution of crystalline substances—including inorganic compounds, organic compounds, and metal complexes—while also analyzing structures of special materials like twinned crystals, incommensurately modulated structures, and quasicrystals. It precisely measures the accurate 3D spatial structure of new crystalline compounds (including bond lengths, bond angles, configuration, conformation, and bonding electron density) and the actual arrangement of molecules within the crystal lattice. The system provides comprehensive structural information such as unit cell parameters, space group, molecular structure, intermolecular hydrogen bonding and weak interactions, and molecular configuration/conformation. It is widely used for analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. Core Technology: A Dual Revolution in Precision and Intelligence (1) The "Mechanical Eye" with Atomic-Level Positioning Four-Circle Concentric Diffractometer: Overcomes traditional mechanical offset limitations, maintaining a constant rotational center to ensure diffraction spot coordinate errors remain below the nanometer level. PILATUS Detector: Combines single-photon counting technology with 172μm ultra-fine pixels. Achieves frame rates up to 20Hz, with noise suppression capability 3 times greater than conventional CCD detectors. (2) Fully Intelligent Closed-Loop Workflow PLC One-Touch Control: Automates the entire process from crystal positioning to data acquisition, reducing manual operation time by 90%. Cryogenic Enhancement System: Features ±0.3 K precision temperature control (100K–300K), boosting signal intensity for weakly diffracting crystals by 50% with liquid nitrogen consumption of only 1.1–2 L/h. (3) Dual Assurance: Safety and Expandability Lead Door Interlock + Leakage Protection (≤0.12 µSv/h), exceeding national safety standards. Optional Multilayer Focusing Optics (Mo/Cu Dual Target), enabling full-scale analysis from small-molecule pharmaceuticals to minerals with large unit cells. The advent of the TD-5000 X-ray Single-Crystal Diffractometer signifies more than an instrumental breakthrough—it marks the era where China's high-end scientific research equipment officially achieves autonomous precision definition. As of 2025, this system has served over 30 leading institutions across fields including chemistry, materials science, and aerospace. As crystals unveil the secrets of life under the probing gaze of domestically developed instruments, China's scientific "eye that discerns the essence of matter" now shines with brilliant clarity.

Product Spotlight: Dandong Tongda's X-Ray Crystal Analysis Solutions Dandong Tongda Science and Technology introduces its advanced X-ray crystal analysis equipment, delivering precision and reliability for industrial applications. The TDF Series X-Ray Crystal Analyzer combines powerful analytical capabilities with industrial-grade reliability. Featuring four operational windows and PLC control technology, it serves high-end manufacturing sectors including semiconductor wafer inspection, aerospace component stress evaluation, and laser crystal processing. Our X-Ray Crystal Orientators (TYX-200/TYX-2H8) enable rapid, precise measurement of crystal cutting angles with accuracy up to ±30 arcseconds. Capable of handling samples up to 30kg, these instruments support directional cutting of piezoelectric, optical, laser, and semiconductor crystals. Both product lines utilize non-destructive X-ray diffraction technology, replacing traditional radioactive methods while improving processing efficiency and accuracy for crystal material research and manufacturing.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; Single crystal X-ray diffractometer can provide information on crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. Single crystal XRD is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. The single crystal diffractometer adopts the four circle concentricity technique to ensure that the center of the angle measuring instrument remains unchanged regardless of the rotation, achieving the goal of obtaining the most accurate data and obtaining higher integrity. Four circle concentricity is a necessary condition for conventional single crystal scanning. The company's technical personnel have completed the installation and debugging of the foreign single crystal X-ray diffractometer, and the test results have greatly satisfied foreign users. At the same time, the functionality, stability, and after-sales service of the instrument have received unanimous praise from foreign users.

The TDM-20 desktop X-ray diffractometer is mainly used for phase analysis of powders, solids, and similar paste like materials.Benchtop XRD utilizes the principle of X-ray diffractometer to perform qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. The TDM-20 desktop X-ray diffractometer is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research. The loading of a new high-performance array detector has led to a significant improvement in the performance of benchtop XRD。 Benchtop XRD equipment has a small volume and light weight; The working power of the Benchtop XRD high-voltage power supply can reach 1600 watts; Benchtop XRD can quickly calibrate and test samples; Benchtop XRD circuit control is simple and easy to debug and install; The repeatability of the Benchtop XRD angle can reach 0.0001.

The TD-3700 high-resolution X-ray diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with a high-performance array detector. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period. The TD-3700 high-resolution X-ray diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation.