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Dandong Tongda Technology Co., Ltd., a leading Chinese manufacturer of analytical instruments, is proud to present its flagship product to the global market: the TD-3500 X-ray Diffractometer (XRD). Meticulously engineered with cutting-edge technology and precision craftsmanship, the TD-3500 is designed to deliver an exceptional analytical experience for global research institutions, university laboratories, and industrial quality control departments. The TD-3500 is far from an ordinary X-ray diffractometer. It embodies Tongda Technology's profound technical expertise and deep understanding of user needs. Designed around the core principles of "Precise, Efficient, Stable, and User-friendly," it is committed to becoming your most reliable laboratory partner. This high-precision instrument is widely used in material analysis and excels at in-depth microstructural analysis of powders, bulk solids, and thin films. Core Technical Specifications & Features High-Stability X-Ray Generator: Utilizes an imported PLC (Programmable Logic Controller) for precise control. With a rated power of up to 5kW, wide tube voltage and current ranges (10-60kV, 2-80mA), and an output stability better than 0.01%, it guarantees exceptionally stable and reliable data acquisition. High-Precision Goniometer: The heart of the diffractometer features imported high-precision bearings and a fully closed-loop vector drive servo system. It offers extremely high angular reproducibility (minimum step size of 0.0001 degrees), ensuring unparalleled measurement accuracy. Its vertical (θ-θ) design keeps the sample stationary and horizontal during testing, making it suitable not only for solids but also for challenging states like liquids, gels, and viscous samples. Low-Noise Detection & Counting System: Equipped with high-performance proportional or scintillation counters, the system boasts a wide counting linear range (≥700,000 cps) with very low background noise (≤1 cps), effectively capturing weak diffraction signals for enhanced data accuracy. Comprehensive Safety Protection: Safety is paramount. The TD-3500 is equipped with a dual protection system: the shutter interlock is linked to the lead door. If the door is accidentally opened, the shutter closes automatically, high voltage drops to a safe level, and data acquisition halts immediately, maximizing operator safety. Radiation leakage is significantly below national standards. Powerful Analysis Software & Database: The system includes robust software for data collection and processing, integrated with professional analysis tools like Jade and the PDF database. Notably, it features a dedicated measurement program for the titanium dioxide industry, enabling rapid and accurate analysis of Rutile and Anatase content with errors controlled within 0.2%. Key Competitive Advantages of the TD-3500 1. Exceptional Performance & Precision High Resolution & Intensity: An optimized optical path and highly stable X-ray generator ensure high-resolution, high signal-to-noise ratio diffraction patterns. It delivers impeccable data quality for both qualitative/quantitative phase analysis and precise lattice parameter calculations. Robust Stability: Core components feature a fully enclosed protective design, coupled with a precise temperature control system. This ensures ultra-high stability and data reproducibility during long-term continuous operation, meeting the most stringent demands of industrial online detection. 2. Intelligent & User-Friendly Operation One-Click Smart Operation: The new-generation intelligent control software features an intuitive interface and smooth operation. Even novice users can easily complete complex testing tasks using pre-set programs, significantly reducing the learning curve and operational barriers. Powerful Data Analysis Capabilities: The software incorporates a powerful database and advanced analysis algorithms, enabling rapid phase identification, crystallite size and microstrain calculation, residual stress analysis, and more, helping you extract key insights from vast amounts of data quickly. 3. Wide Applicability & Flexibility The TD-3500 effortlessly handles samples of various forms—powder, bulk, thin film—finding applications across diverse fields such as new material R&D, metallurgy, chemicals, pharmaceuticals, cement, ceramics, geological exploration, and cultural heritage authentication. Its modular design also allows for future functional expansions, protecting your investment. 4. Rugged Construction & Global Support Built with meticulous attention to detail and superior materials, the TD-3500 ensures stable operation in various complex environments worldwide. Furthermore, Dandong Tongda Technology Co., Ltd. has established a comprehensive global sales and service network, providing professional pre-sales consultation, technical training, and timely after-sales support to ensure peace of mind for customers anywhere in the world. Our Commitment With years of deep expertise in the X-ray analysis instrument field, we understand the unique challenges each customer faces. The launch of the TD-3500 X-ray Diffractometer represents not only the pinnacle of our technology but also our commitment to empowering global customer success. "We are dedicated to bringing the world's scientists and engineers the most reliable technological tools through continuous innovation," said the General Manager of Tongda Technology. "The TD-3500 X-ray Diffractometer is our sincere offering to the market. We believe it will become a powerful engine for our customers to explore material mysteries, enhance product quality, and drive technological revolution."

Amidst ongoing breakthroughs and technological innovations in global materials science, China's scientific instrument manufacturing industry is steadily rising to prominence. The TDF Series X-ray Crystal Analyzer, developed by Dandong Tongda Technology Co., Ltd., represents a leading example of domestically produced high-end analytical instrumentation. It is gaining traction in global scientific research and industrial sectors precisely due to its exceptional performance and reliable precision. The TDF Series X-ray Crystal Analyzer is a major analytical instrument designed for investigating the internal microstructure of substances. Its key applications encompass crystal orientation, defect inspection, lattice parameter determination, and residual stress measurement. Whether analyzing the structure of plates and rods, or deciphering the structure of unknown materials and single crystal dislocations, this equipment delivers accurate and reliable data support. In modern fields like materials science, semiconductor manufacturing, new energy development, and pharmaceuticals, a deep understanding of material microstructure has become the cornerstone of technological progress. The TDF Series is engineered for this purpose – empowering scientists and engineers worldwide to unlock the secrets of material properties. Vertical Tube Housing & Four-Port Design The TDF Series X-ray Crystal Analyzer incorporates a unique vertical tube housing design with four usable ports simultaneously. This innovative design significantly enhances operational efficiency, allowing users to switch rapidly between multiple experimental channels and save valuable research time. Precision Control with PLC Technology Equipped with an imported PLC control system, the TDF Series X-ray Crystal Analyzer demonstrates outstanding performance in control precision and anti-interference capabilities. This system not only enables precise control of high-voltage switching and lifting operations but also features an automatic X-ray tube training function, effectively extending the service life of both the X-ray tube and the entire instrument. For experimental scenarios requiring long-term, continuous operation, this reliability substantially reduces the risk of equipment failure and potential data loss. Powerful and Stable High-Voltage Generation System The high-voltage generator of the TDF Series performs exceptionally well, offering a tube voltage adjustable from 10 to 60 kV and a tube current range from 2 to 80 mA, with a rated output power of up to 5 kW. The stability of tube voltage and current reaches 0.3‰, ensuring highly reproducible experimental data. The system is also equipped with multiple protection functions (e.g., no voltage, overvoltage, no mA, over-power, no water, X-ray tube overtemperature), providing comprehensive safety assurance. Versatile X-Ray Tube Configurations To accommodate diverse analytical needs, the TDF Series offers a choice of various target materials, including Cu, Co, Fe, Cr, Mo, and W. With a rated power of 2.4 kW and focal spot options of point focus (1×1) and line focus (1×10), users can select the most suitable configuration based on sample characteristics and analytical objectives. Comprehensive Safety Protection Design Safety performance is another standout feature of the TDF Series X-ray Crystal Analyzer. Utilizing high-density, high-transparency lead glass for the X-ray protective shielding, the external radiation leakage is maintained at ≤ 0.1 μSv/h – a level well below international safety standards – ensuring reliable protection for operators. Configurations for Diverse Application Scenarios The TDF Series X-ray Crystal Analyzer supports various X-ray cameras, including Laue cameras (large/small powder), flat panel cameras, 3D sample stages, and Multiwire cameras (US-made). This flexible configuration scheme enables the instrument to adapt to a wide range of requirements, from fundamental research to high-end materials analysis. For applications demanding high-precision positioning, the TDF Series X-ray Crystal Analyzer offers a maximum positioning speed of up to 1500°/min, ensuring fast and accurate data acquisition. Whether for analyzing unknown materials in scientific research or for quality monitoring in industrial production, the TDF Series provides a dependable solution. As cutting-edge fields like new materials, new energy, and semiconductors continue to develop rapidly, the demand for material microstructure analysis is growing, and the required precision is constantly increasing. The TDF Series X-ray Crystal Analyzer will continue to evolve and upgrade to meet the latest needs of the global scientific and industrial communities. Dandong Tongda Technology Co., Ltd. remains committed to its philosophy of technological innovation and quality first. We will continue to provide global users with superior products and services, working hand-in-hand with scientists and engineers worldwide to jointly advance materials science and enhance industrial quality standards. We invite global partners and users to inquire and discuss collaboration opportunities. Discover more about the technical details and application cases of the TDF Series X-ray Crystal Analyzer. Let's join hands to explore the mysteries of the microscopic world of materials and jointly drive technological innovation and industrial progress!

The TD-5000 X-ray Single-Crystal Diffractometer is the outcome of a Major Scientific Instrument Development Project funded by China's Ministry of Science and Technology, with Dandong Tongda Science and Technology Co., Ltd. as the lead unit. This instrument represents a significant breakthrough for China in the high-end scientific instrument sector, filling a longstanding domestic gap in the development and manufacturing of single-crystal diffractometers. Its industry recognition is underscored by the prestigious "3i Award - 2022 Outstanding New Instrument of the Year," a highly authoritative accolade in the field.The TD-5000 X-ray Single-Crystal Diffractometer is capable of determining the three-dimensional spatial structure and electron density distribution of crystalline substances, including inorganic compounds, organic compounds, and metal complexes. It can analyze key crystal parameters such as bond lengths, bond angles, configuration, conformation, unit cell parameters, space group, and intermolecular interactions. The instrument is designed to determine the precise three-dimensional spatial structure of new compounds (in crystalline form)—including bond lengths, angles, configuration, conformation, and even bonding electron density—as well as the actual arrangement of molecules within the crystal lattice. It provides comprehensive structural information such as unit cell parameters, space group, molecular crystal structure, hydrogen bonding and weak intermolecular interactions, and molecular configuration and conformation.It is widely used in analytical research across various fields including chemical crystallography, molecular biology, pharmaceutical sciences, mineralogy, and materials science.The system is user-friendly, featuring one-click collection and a modular design. It employs high-precision goniometry with four-circle concentric technology to ensure goniometer center stability. Additionally, it is equipped with a high-performance detector and offers the option of a PILATUS hybrid pixel array detector, enabling high data quality and very fast scanning speeds. Beyond performance, the instrument is safe and reliable, featuring an electronic lead glass door interlock system that provides dual protection. The TD-5000 X-ray Single-Crystal Diffractometer is a precision analytical instrument designed for scientific research and high-end industrial applications. It excels in key performance metrics through sophisticated design and represents a significant breakthrough in its category. For users with relevant procurement needs who demand high-quality, high-standard instrumentation, it is a option worthy of serious consideration. Dandong Tongda Technology Co., Ltd. is committed to fully meeting your expectations with reliable performance and professional support. We look forward to your inquiries and potential collaboration.

Dandong Tongda's X-ray Crystal Analyzer adopts advanced X-ray diffraction technology, enabling non-destructive detection of microstructural information in various materials. Whether it's single crystal orientation, defect inspection, lattice parameter measurement, or residual stress analysis, this instrument provides accurate and reliable test data, offering solid support for material research and quality control. The instrument is equipped with a highly stable X-ray generator that delivers exceptional performance. The tube voltage can be precisely adjusted within the range of 10-60kV, and the tube current can be regulated from 2-60mA, with a stability of no more than ±0.005%. This ensures highly repeatable and accurate test results, providing researchers with dependable data assurance. Dandong Tongda's X-ray Crystal Analyzer integrates intelligent control and comprehensive safety protection. It features an imported PLC automatic control system, enabling unattended automatic timed measurements. The multi-level safety protection system includes no-pressure, no-current, over-voltage, over-current, over-power, no-water, and X-ray tube over-temperature protections, ensuring the safety of operators. The TDF series X-ray crystal analyzer adopts a vertical tube housing with four windows that can be used simultaneously. It utilizes imported PLC control technology, which offers high precision and strong anti-interference capabilities, ensuring the reliable operation of the system. The PLC controls the switching and adjustment of high voltage and includes an automatic training function for the X-ray tube, effectively extending the service life of both the X-ray tube and the instrument. The instrument's radiation protection enclosure is constructed with high-density, high-transparency leaded glass, with external radiation leakage far below national safety standards, allowing researchers to conduct experimental studies in a secure environment. As a national high-tech enterprise, Dandong Tongda Technology Co., Ltd. has a comprehensive quality management system and a technical R&D team. Its products not only meet domestic market demands but are also exported to numerous countries and regions, demonstrating the strength and capability of China's scientific instrument manufacturing. Dandong Tongda's X-ray Crystal Analyzer, with its outstanding performance and reliable quality, has become a powerful assistant in the field of material analysis. It helps researchers and engineers unveil the layers of the material world and explore more unknown possibilities.

In the fields of materials science and industrial testing, every minute change in crystal structure can determine the final properties of a material. Today, a precision instrument embodying the essence of R&D from Dandong Tongda Science and Technology— TD-3500 X-ray Diffractometer—is opening a new window into the microscopic world for researchers and industrial inspectors with its outstanding performance and intelligent design. Evolution Through Craftsmanship and Technology The TD series diffractometers incorporate years of technological accumulation from Tongda Science and Technology, continuously evolving with the times. As the "gold standard" for material analysis, X-ray diffraction technology enables comprehensive structural analysis of powder, bulk, or thin-film samples: from qualitative and quantitative phase analysis, crystal structure analysis, and material structure analysis, to orientation analysis, macro/micro stress measurement, grain size, and crystallinity determination—the TD-3500 does it all. Intelligent Core, Stable and Reliable The core advantage of the TD-3500 X-ray Diffractometer lies in its use of an imported Siemens PLC control system. This innovative design gives the instrument outstanding features such as high precision, high accuracy, excellent stability, long service life, easy upgradability, user-friendly operation, and intelligent functionality, enabling it to flexibly adapt to the testing and research needs of various industries. The X-ray generator offers two options: high-frequency high-voltage solid-state or工频(line-frequency) generators, with high automation, extremely low failure rates, strong anti-interference capabilities, and excellent system stability. The system automatically controls the shutter switch, adjusts tube voltage and current, and includes an automatic X-ray tube training function. Real-time monitoring via a touchscreen greatly reduces operational complexity. Innovative Control, Revolutionary Operation Compared to traditional single-chip microcomputer circuits, the PLC control technology used in the TD-3500 offers multiple breakthroughs: Simple circuit control for easy debugging and installation Modular design allows users to perform maintenance and debugging themselves, significantly reducing costs Strong expandability for easy addition of various functional accessories without hardware modifications True-color touchscreen for human-machine interaction, user-friendly operation, and intuitive fault information display Precision Measurement, Safety Assured The TD series goniometer uses imported high-precision bearing transmission and is equipped with a high-precision full closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, capable of automatically correcting minute movement position errors to ensure high precision and accuracy of measurement results, with angular reproducibility reaching 0.0001 degrees. For safety, the TD-3500 adopts a hollow-axis structure with electronic lead door interlock装置, providing dual protection. The shutter window is linked to the lead door—when the lead door opens, the shutter automatically closes, ensuring comprehensive operator safety. Flexible Configuration, Comprehensive Compatibility The instrument offers two detector choices—proportional counter (PC) or scintillation counter (SC)—and multiple X-ray tube options including glass, corrugated ceramic, and metal-ceramic tubes, meeting different application scenarios and budget requirements. The TD-3500 X-ray Diffractometer is not only a high-performance analytical instrument but also a reflection of Tongda Science and Technology's relentless pursuit of quality. It is quietly playing a vital role in laboratories across the country, supporting scientific innovation and quality control, and becoming the most trusted analytical partner for scientists and engineers. Whether you are engaged in new material development, mineral resource analysis, pharmaceutical quality control, or metal material testing, the TD-3500 can provide you with accurate and reliable data support, helping you discover more possibilities in the microscopic world. Explore the Unknown with TD-3500—Let Tongda Science and Technology work with you to uncover the mysteries of materials science.

In the fields of materials science and industrial inspection, highly efficient and precise X-ray diffraction analysis has always been a core support for scientific breakthroughs and quality control. The TD-3700 series X-ray diffractometer redefines the performance limits of diffraction equipment with multiple innovative technologies, providing an unprecedented efficient solution for academic research, corporate R&D, and quality control applications. Multi-Detector Synergy Ushers in a New Era of High-Speed Analysis The TD-3700 series breaks through the limitations of traditional detectors by offering a variety of options, including high-speed one-dimensional array detectors, two-dimensional detectors, and SDD detectors. Compared to conventional scintillation or proportional detectors, it increases diffraction signal intensity by dozens of times, capturing high-sensitivity, high-resolution diffraction patterns within extremely short sampling cycles and significantly improving data output efficiency. Coupled with hybrid photon counting technology, the detectors operate noise-free, effectively suppress fluorescence background, and demonstrate excellent energy resolution and signal-to-noise performance—making them particularly suited for analyzing complex samples and trace specimens. Dual Diffraction/Transmission Modes Expand Application Boundaries The instrument not only supports conventional diffraction scanning but also innovatively introduces a transmission mode. This mode offers significantly higher resolution than diffraction mode, making it especially suitable for high-end applications such as crystal structure analysis and nanomaterials research. Meanwhile, diffraction mode, with its ultra-high signal stability, is ideal for routine phase identification. Another major advantage of transmission mode is its support for trace sample testing, greatly alleviating the challenges of sample preparation and limited sample availability. This opens up new possibilities for pharmaceutical development, geological analysis, cultural heritage identification, and other fields. Modular and Intelligent Design for a Reliable and User-Friendly Experimental Platform The TD-3700 adopts a modular hardware design where all components are plug-and-play without requiring calibration, significantly reducing maintenance costs and failure rates. Its one-click acquisition system and customized software greatly enhance operational convenience, allowing even non-specialists to get started quickly. A touchscreen interface provides real-time monitoring of instrument status, making experimental progress clear at a glance. Safety is also uncompromised: an electronic lead door interlock device offers dual protection, while a high-frequency high-voltage X-ray generator ensures stable and reliable performance. Combined with an anti-interference control unit, it maintains long-term operational reliability while ensuring user safety. Born for the Era: A Future-Oriented Benchmark in Diffraction Technology The TD-3700 series X-ray diffractometer integrates rapid analysis, intelligent operation, and comprehensive safety. It not only inherits the stability of the TD-3500 series but also achieves breakthroughs in detector technology, application flexibility, and system integration. Its emergence greatly meets the needs of modern laboratories for high-throughput, high-precision, and diverse sample analysis, making it an indispensable tool for material characterization, chemical analysis, pharmaceuticals, and academic research.

The TDM-20 X-ray Diffractometer (Benchtop XRD) is primarily used for phase analysis of powders, solids, and paste-like substances. Based on the principle of X-ray diffraction, it enables qualitative and quantitative analysis, as well as crystal structure analysis, of polycrystalline materials like powdered samples and metal samples. It is widely applied in industries including industry, agriculture, national defense, pharmaceuticals, mineralogy, food safety, petroleum, and education/research. Core Principle: X-ray Diffraction, the Key to the Microscopic World The TDM-20 X-ray Diffractometer operates on the principle of X-ray diffraction. When X-rays illuminate a sample, they interact with the atoms in the sample and diffract. Different crystal structures produce unique diffraction patterns, much like individual fingerprints. By analyzing these patterns, the instrument precisely reveals key information about the sample's crystal structure, phase composition, and more, uncovering the secrets hidden at the microscopic level. Performance Breakthrough The TDM-20 X-ray Diffractometer (Benchtop XRD) surpasses the previous international standard of 600W, undergoing a comprehensive upgrade to 1200W. The instrument features simple operation, stable performance, and low energy consumption. It can be equipped with either a proportional detector or a new high-speed array detector, resulting in a significant leap in overall performance. Device Features Compact size and lightweight design High-frequency, high-voltage power supply design for lower overall energy consumption Supports rapid sample calibration and testing Simplified circuit control for easy debugging and installation Full-spectrum diffraction angle linear accuracy reaches ±0.01° Rich Accessories The TDM-20 can be paired with various accessories, including a 1D array detector, proportional detector, 6-position automatic sample changer, rotating sample stage, among others. Conclusion The TDM-20 X-ray Diffractometer (Benchtop XRD) , with its outstanding performance, user-friendly operation, and broad range of applications, has become an indispensable tool across numerous industries and research fields. It acts like a "detective" of the microscopic world, helping us unravel the mysteries of material structure and driving progress in various domains. If you too seek to delve deeper into the microscopic secrets of matter, consider the TDM-20 to embark on a journey of precise and efficient research and production.

The TDM-10 desktop X-ray diffractometer is a compact and high-precision phase analysis device. The following is a detailed introduction to the product: 1. Core functions and applications of TDM-10 desktop X-ray diffractometer (1) Phase analysis Suitable for qualitative and quantitative analysis of powder, solid, paste like materials, and thin film samples, it can identify the crystal structure, phase composition, and crystallinity in the samples. (2) Crystal structure analysis It can measure grain size, crystal orientation, macroscopic/microscopic stress, and structural properties of materials. (3) Industrial and Research Applications Widely used in fields such as geology, materials science, chemistry, biology, medicine, and nuclear industry, suitable for rapid laboratory testing and teaching demonstrations. 2. Technical characteristics of TDM-10 desktop X-ray diffractometer (1) Compact design and efficient performance Small size, light weight, low power consumption, easy to operate, suitable for desktop environments. Equipped with high-frequency and high-voltage power supply, the power can reach 1200W (refer to TDM-20 model), ensuring X-ray stability. (2) High precision measurement The measurement accuracy of diffraction peak position reaches 0.001 °, with excellent angular repeatability, meeting the requirements of high-precision analysis. By using the principles of Debye Scherrer geometry and Bragg's law, the crystal reflection signal is recorded through conical surface diffraction, achieving accurate phase identification. (3) Intelligent Control and Data Processing Computer controlled data acquisition, supporting real-time data acquisition and processing under Windows system, with an intuitive operating interface. Can be paired with array detectors (referring to the high-performance detector technology of TDM-20) to improve detection efficiency and sensitivity. 3. Applicable scenarios of TDM-10 desktop X-ray diffractometer (1) Research field Universities and research institutes are used for material research and development, crystal structure analysis, and characterization of nanomaterials. (2) Industrial applications Mineral identification, drug composition analysis, food safety testing (such as crystal impurity screening), etc. (3) Teaching Demonstration Easy to operate desktop device, suitable for student experimental teaching, covering the basic theory and practical operation of phase analysis. 4. Technical parameters of TDM-10 desktop X-ray diffractometer (1) Measurement accuracy: diffraction peak position accuracy of 0.001 ° (2) Control method: Computer control (Windows system) (3) Power supply: Low power design, high-frequency high-voltage power supply (4) Detector: Supports array detectors or proportional detectors (refer to TDM-20 accessories) (5) Sample stand: can be paired with a rotating sample stand or an automatic sample changer (optional accessory) 5. Product advantages of TDM-10 desktop X-ray diffractometer (1) High cost-effectiveness: Domestic equipment has outstanding performance and is much cheaper than imported equipment, making it suitable for laboratories with limited budgets. (2) Quick detection: Optimize calibration process, shorten testing time, and improve experimental efficiency. (3) Scalability: Supports multiple accessories (such as low-temperature cooling systems, in-situ battery accessories, etc.), which can be extended to special scenario analysis. 6. Related series and comparison of TDM-10 desktop X-ray diffractometer TDM-20 model: TDM-20 is an upgraded version of TDM-10, with higher power (1600W), new high-performance array detectors, support for automatic sample changers and other accessories, suitable for more complex industrial and scientific research needs. Other models: The Dandong Tongda TD series also includes high-resolution diffraction instruments such as TD-3500 and TD-3700, as well as TDF series crystal analyzers, covering multidimensional analysis needs. The TDM-10 desktop X-ray diffractometer has become the preferred equipment for laboratory phase analysis due to its compact design, high-precision measurement, and intelligent operation. It has a wide range of application scenarios, especially suitable for scientific research and industrial environments that require fast and accurate detection. If higher configuration is required, TDM-20 or other models in the same series can be considered.

The TDM-20 desktop X-ray diffractometer is a compact desktop device mainly used for material phase analysis and crystal structure research. 1. The core functions of TDM-20 desktop X-ray diffractometer Phase analysis of TDM-20: TDM-20 can perform qualitative/quantitative analysis on polycrystalline samples such as powders, solids, and paste materials. Crystal structure analysis of TDM-20: Based on the principle of X-ray diffraction, TDM-20 supports the analysis of crystal structures of metal samples, minerals, compounds, etc. 2. Technical characteristics of TDM-20 desktop X-ray diffractometer The high power and performance of TDM-20: using high-frequency high-voltage power supply, the power is increased to 1600W. Equipped with new high-speed array detectors or proportional detectors to improve data acquisition efficiency and accuracy. Convenient operation of TDM-20: The device is small in size and light in weight, suitable for compact laboratory spaces; Supports fast calibration and testing, with simple circuit control and easy installation and debugging. The accuracy and stability of TDM-20: the angle repeatability is as high as 0.0001 °, and the full spectrum diffraction angle linearity is ± 0.01 °. Scalability of TDM-20: TDM-20 can be equipped with a 6-digit automatic sample changer, a rotating sample stage, a low-temperature cooling system, and in-situ high/medium low temperature accessories to meet diverse testing needs. 3. Application scenarios of TDM-20 desktop X-ray diffractometer The research fields of TDM-20 include crystal structure characterization and phase transition analysis in materials science, geology, and pharmaceutical research. Industrial applications of TDM-20: pharmaceutical industry drug consistency assessment, mineral identification, petrochemical catalyst analysis, food safety testing (such as crystal composition determination). Education and National Defense of TDM-20: Rapid Phase Identification in University Teaching Experiments and National Defense Material Development. 4. Manufacturers and accessories of TDM-20 Manufacturer: Dandong Tongda Technology Co., Ltd. Optional accessories: one-dimensional array detector, proportional detector, 6-digit automatic sample changer, rotating sample stage, graphite bent crystal monochromator, etc. Overall, TDM-20, with its high power, high precision, and compact design, has become an efficient tool for laboratory phase analysis and is widely used in scientific research, industry, and teaching fields.

The TD-3500X-ray diffractometer (TD-3500XRD) is a high-performance analytical instrument produced by Dandong Tongda Technology Co., Ltd. It is mainly used for the analysis of crystal structure, phase composition, and material properties. 1. Core technical parameters of TD-3500X-ray diffractometer The X-ray source of TD-3500 diffractometer: Provide Cu K α or Mo K α target material selection, with adjustable tube voltage range of 10~60kV and tube current range of 2~80mA, supporting high-frequency and high-voltage solid-state generators or power frequency generators. Equipped with an imported Siemens PLC control system, it achieves automated light gate switching, tube pressure/flow regulation, and X-ray tube training functions with high stability. Angle measurement system of TD-3500X-ray diffractometer: Adopting a θ -2 θ vertical structure with a diffraction circle radius of 185mm (adjustable to 285mm), it supports testing of liquid, sol, powder, and block samples. The angular resolution reaches 0.0001 degrees, the step accuracy is 0.0001 degrees, and the angle measurement range is -5 °~165 ° (2 θ), suitable for high-precision crystal analysis. Detector of TD-3500X-ray diffractometer: Optional proportional detector (PC) or scintillation detector (SC), with a counting linear range of ≥ 700000 cps and background noise ≤ 1cps. Equipped with dual crystal monochromator technology, effectively suppressing the K α 2 component and improving the monochromaticity of the radiation. Control and software of TD-3500X-ray diffractometer: A human-machine interaction system based on imported PLC and true color touch screen, supporting parameter setting, real-time monitoring, and fault diagnosis. The software has functions such as phase diagram matching, stress analysis, and grain size calculation, and can generate standardized reports. 2. Technical characteristics and advantages of TD-3500X-ray diffractometer High precision and stability of TD-3500X-ray diffractometer: The angle measuring instrument adopts imported high-precision bearings and a fully closed-loop servo drive system, with automatic correction of motion errors and repeatability better than 0.0006 °. PLC modular design has strong anti-interference ability, supports long-term fault free operation, and can expand multiple functional accessories. Safety and protection of TD-3500X-ray diffractometer: The electronic lead door interlocking device achieves dual protection, with the light gate and lead door interlocked to ensure safe operation. Equipped with a circulating water cooling system (split or integrated), it automatically controls the water temperature and monitors the temperature of the X-ray tube to avoid blockage. Intelligent operation of TD-3500X-ray diffractometer: The touch screen displays the instrument status in real-time, supports parameter settings (such as scanning range, step size, sampling time), and remote fault diagnosis. Preset scanning modes (θ -2 θ, single crystal diffraction, thin film analysis) to meet different sample requirements. 3. The main application areas of TD-3500X-ray diffractometer Material analysis of TD-3500X-ray diffractometer: Qualitative/quantitative analysis of phases, identification of crystal structure, determination of grain size and crystallinity. Phase composition and stress analysis of materials such as semiconductors, ceramics, metals, polymers, etc. Research experiment of TD-3500X-ray diffractometer: Analysis of film orientation, phase transition research of catalyst/battery materials, and characterization of nano material structures. Biological crystals, macroscopic/microscopic stress measurement, and material temperature evolution analysis (requiring the use of a thermal analyzer). Typical user case of TD-3500X-ray diffractometer: Wuhan University of Technology (New Material Structure Research), Beijing Institute of Technology (Oxide Semiconductor Phase Transformation Research), Tongji University (Titanium Alloy Structure Analysis), etc. 4. Key points for operation and maintenance of TD-3500X-ray diffractometer Operation process of TD-3500X-ray diffractometer: Start up and preheat for 10-15 minutes → Sample preparation and fixation → Set scanning parameters (such as 2 θ range, step width, tube pressure/flow) → Start scanning → Data analysis. Support the combination of SEM and EDS to achieve comprehensive characterization of micro/nano structures and components. Widely used in materials science, chemistry, physics and other fields, it is the preferred tool for crystal structure and phase analysis.