X-ray diffractometer is a kind of instrument to analyze the crystal structure, phase composition and crystal orientation of a substance by the interaction of X-ray with matter.
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The degree of graphitization refers to how closely the crystal structure of the graphite material resembles perfect graphite after rearranging the amorphous carbon structure.
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An X-ray stress diffractometer is a widely utilized instrument in the field of materials science and engineering for measuring the internal stress distribution of materials.
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X-ray diffraction is a basic technique for the study of solid structure, which can provide unique spectral information for the chemical composition and structure arrangement of samples.
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XRD is the most advanced X-ray diffractometer system in the world today, with precise design and complete functions, and can flexibly adapt to various microstructure determination such as powder.
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Founded in 2002, Dandong Tongda Technology Co., Ltd. is a national high-tech enterprise with X-ray analysis instruments and X-ray non-destructive testing instruments as its leading products
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Recently, the Ministry of Science and Technology announced the list of the second batch of key projects under the 2023 National key research and Development Plan "Basic scientific research Conditions and major scientific instruments and equipment research and development".
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Different crystal forms of the same drug may differ significantly in appearance, solubility, melting point, etc., affecting the stability, production, bioavailability, and safety of the drug.
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X-ray diffraction is a method to study the phase and crystal structure of a substance by using the diffraction phenomenon of X-rays in a crystal.
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