The diffraction pattern composition primarily consists of the position and intensity of the diffraction peak. The analysis of the X-ray diffraction pattern is based on changes in intensity and position to elucidate material transformations at both micro and macro scales.
Each material possesses its own unique diffraction pattern, also referred to as the characteristic diffraction pattern. The cell size of the material determines the position of the diffraction line, i.e., the peak position observed on the diffraction spectrum; while the type and arrangement of atoms within the cell determine the intensity of each diffraction peak. Furthermore, the symmetry of a crystal's shape dictates the number of diffraction peaks present.
The X-ray diffractometer is currently the most advanced system in the world, designed to be fully functional and adaptable for various micro-structure determination, analysis, and research tasks of powders, films, and complete crystals. Each substance has its own characteristic diffraction spectrum in the X-ray diffraction spectrum. In a heterogeneous mixture of substances, the XRD spectrum represents a simple superposition of each phase.
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