X-ray diffraction (XRD) is a means of research to obtain information such as the composition of a material, the structure or form of an internal atom or molecule by analyzing its diffraction pattern through X-ray diffraction.
1. Instrument structure:
X-ray diffractometer is mainly composed of four parts: X-ray generator, Angle measuring instrument, X-ray intensity measuring system and diffractometer control and diffraction data acquisition and processing system.
(1)X-ray Generator:The X-ray generator provides the X-ray required for the measurement of the highly stable X-ray source. Changing the anode target of the X-ray tubecan change the wavelength of the X-ray, and adjusting the anode voltage can control the intensity of the X-ray source.
(2)Goniometer:The Angle measuring instrument is the core component of X-ray diffractometer, which is mainly composed of diaphragm, divergence slit, receiving slit, anti-scattering slit, sample base and scintillation detector.
(3)X-ray intensity measurement system：The commonly used detector in the diffractometer is the scintillation counter, which uses the fluorescence of wavelengths in the visible light range produced by X-rays in some solid substances (phosphorescent), and this fluorescence is converted into an electric current that can be measured. Since the output current is proportional to the X-ray photon energy absorbed by the counter, it can be used to measure the intensity of the diffraction line.
(4)Diffractometer control and diffraction data acquisition and processing system：After the scanning operation is completed, the original diffraction data is automatically stored in the computer hard disk for data analysis and processing. Data analysis and processing include smoothing point selection, backbottom deduction, automatic peak search, d value calculation, diffraction peak intensity calculation and so on.
2. Instrument features:
(1) The perfect combination of hardware system and software system to meet the needs of different application fields.
(2) High-precision diffraction Angle measurement system to obtain more accurate measurement results.
(3) High stability X-ray generator control system, to obtain more stable repeated measurement accuracy.
(4) Program geochemical exploration, integrated structure design, easy operation, more beautiful appearance of the instrument.
3. Typical morphology appreciation
