X-ray absorption fine structure spectrum (XAFS) is an analytical tool used to study the structure and properties of substances. XAFS obtains information about atoms and molecules in a sample by measuring the X-ray absorption of the sample within a specific energy range. XAFS is a powerful tool for studying the local atomic or electronic structure of materials.XAFS technology is widely used in materials science, chemistry, biology, and other fields, especially in research areas such as catalysis, batteries, sensors, etc. XAFS has important application value. Through XAFS technology, researchers can gain a deeper understanding of the microstructure and properties of samples, providing powerful support for the design and optimization of new materials.
