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  • Diffractometer
    Diffractometer
    1. The accuracy of Diffractometer is high. 2. The application range of Diffractometer is wide. 3. Diffractometer is easy to operate, convenient and efficient.
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  • Single Crystal XRD
    Single Crystal XRD
    1.The single crystal machine adopts PLC control technology. 2.Modular design, accessories plug and play. 3.Electronic lead door interlocking equipment with double protection. 4.Single crystal X-ray tube: a variety of targets can be selected, such as Cu, Mo,etc. 5. Single crystal adopts four-circle concentric technology to ensure that the center of no goniometer remains unchanged.
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  • A 2D X-ray Diffractometer
    A 2D X-ray Diffractometer
    Advantages: Continuously adjustable X-ray penetration depth Capability to observe the distribution of crystal planes with different orientations Analysis of orientation distribution in samples such as fibers, thin films, and powders Examination of structural characteristics like lattice distortion and crystallite size
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  • X-ray Diffraction Residual Stress Analyzer
    X-ray Diffraction Residual Stress Analyzer
    TD-RSD XRD Residual Stress Analyzer ±7MPa accuracy, dual-detector innovation, full-auto operation & powerful software. Optimize processes, enhance product reliability. Compact, efficient, leading solution.
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Powerful analysis software - XRPD

2023-11-30

Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometer, has a history of 14 years, and has reached cooperation with many universities and enterprises at home and abroad.


Our X-ray diffractometer not only has mature technology, but also is equipped with powerful analysis software, which is also an important reason for the popularity of X-ray diffractometer. This program is a self-developed program. It contains a variety of quantitative analysis functions developed by itself, which conform to the diffraction theory and all use the integral intensity to calculate. The measurement methods all use the concept of integral intensity quantification, which can be fitted to the full spectrum under the condition of different phase linewidths without involving the structure. The interference of overlapping peaks can be eliminated, and the influence of preferred orientation can be reduced or eliminated.


X-ray diffractometerQuantitative analysisdiffractometer


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