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  • Diffractometer
    Diffractometer
    1. The accuracy of Diffractometer is high. 2. The application range of Diffractometer is wide. 3. Diffractometer is easy to operate, convenient and efficient.
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  • Single Crystal XRD
    Single Crystal XRD
    1.The single crystal machine adopts PLC control technology. 2.Modular design, accessories plug and play. 3.Electronic lead door interlocking equipment with double protection. 4.Single crystal X-ray tube: a variety of targets can be selected, such as Cu, Mo,etc. 5. Single crystal adopts four-circle concentric technology to ensure that the center of no goniometer remains unchanged.
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  • Series X-ray Crystal Analyzer
    Series X-ray Crystal Analyzer
    1. X-ray instrument is easy to operate and fast to detect. 2. X-ray instrument is accurate and reliable, with excellent performance. 3. X-ray instrument has various functional accessories to meet the needs of different testing purposes.
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  • Powder Diffractometer
    Powder Diffractometer
    1. Detector type: Array detector or SDD detector; 2. PLC automatic control calculus, Integration mode conversion, PLC automatically performs PHA, dead time correction 3.Sample measurement type: powder sample, liquid samples, melt-state samples, viscous samples, loose powders, bulk solid samples 4.Available with a variety of diffractometer accessories 5.Maximum output powder: 3kW
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Powerful analysis software - XRPD

2023-11-30

Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometer, has a history of 14 years, and has reached cooperation with many universities and enterprises at home and abroad.


Our X-ray diffractometer not only has mature technology, but also is equipped with powerful analysis software, which is also an important reason for the popularity of X-ray diffractometer. This program is a self-developed program. It contains a variety of quantitative analysis functions developed by itself, which conform to the diffraction theory and all use the integral intensity to calculate. The measurement methods all use the concept of integral intensity quantification, which can be fitted to the full spectrum under the condition of different phase linewidths without involving the structure. The interference of overlapping peaks can be eliminated, and the influence of preferred orientation can be reduced or eliminated.


X-ray diffractometerQuantitative analysisdiffractometer


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