In the field of materials science research, precise measurement serves as the key to unlocking material properties. The multi-functional integrated measurement accessory developed by Dandong Tongda Science and Technology Co., Ltd. is a high-precision tool designed to enhance X-ray diffraction analysis capabilities. This multi-functional integrated measurement accessory is specifically designed for installation on wide-angle goniometers. Its core mission is to accurately analyze plate materials, bulk materials, and thin films deposited on substrates. The accessory can perform various measurement tasks, including crystal phase detection, orientation degree analysis, and stress testing. It supports texture analysis, residual stress determination, and in-plane structure testing of thin films, providing comprehensive data support for materials research. The core technical features of this accessory are reflected in its multi-axis coordinated precision mechanical system and highly adaptable measurement methods. The multi-functional integrated measurement accessory supports pole figure measurements using either transmission or reflection methods, offering flexibility for different samples and testing requirements. For stress testing, it can employ both the side-inclination method and the normal-inclination method. For thin film samples, the accessory also enables in-plane rotation testing, allowing for in-depth analysis of film structures. Its precision mechanical system ensures high measurement accuracy and repeatability, with minimum step increments of 0.001° (for rotation axes) and 0.001mm (for translation axes). The application scope of the multi-functional integrated measurement accessory is extremely broad, covering almost all advanced manufacturing and R&D fields that require material structure analysis. In the field of metal materials, it is used for evaluating the collective organization of metals such as rolled plates; in ceramics, it focuses on assessing ceramic orientation. For thin film materials, the accessory can analyze the preferred crystal orientation of film samples and test the residual stress of multilayer films (evaluating properties such as film peeling). It can also analyze surface oxidation and nitridation films on high-temperature superconducting material films and metal plates, as well as multilayer films on glass, silicon, and metal substrates. Notably, it can also be applied to the analysis of macromolecular materials, paper, lens plating materials, and more, demonstrating its interdisciplinary application potential. Measurement Accessory

Driven by an imported stepper motor and controlled by an imported Siemens programmable logic controller (PLC), there is no need for manual sample replacement. The system automatically measures samples continuously and saves data automatically. Six samples can be loaded at once for continuous measurement.

Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray products, with two main series of products: X-ray analysis instruments and X-ray non-destructive testing instruments. And in 2013, it became the undertaking unit of the X-ray single crystal diffractometer project of the National Major Scientific Instrument and Equipment Development Special Project of the Ministry of Science and Technology. Our company adheres to the principles of customer first, product first, and service first, insists on people-oriented, and has a strong technology team. We are committed to providing users with the highest quality high-tech products with advanced technology, and providing strong support and services to users with efficient technical consulting and after-sales service institutions.

The data collected through low-temperature equipment yields more ideal results. With the help of low-temperature equipment, more advantageous conditions can be provided, which can enable undesirable crystals to obtain ideal results, as well as ideal crystals to obtain more ideal results.

Software feature description：This program is a self-developed program. It contains various quantitative methods developed independently, in accordance with diffraction theory, and calculated entirely using integrated intensity.Analysis function. If this program contains the function of full spectrum peak fitting, separation and quantification that can still be accurately quantified under different phase line widths; as The function of the integrated intensity quantification method, which can conveniently automatically eliminate the interference of overlapping peaks of this phase and other phases, and is not affected by the different line widths of each phase, such as Complete PDF file calculation spectrum combination full spectrum fitting method, custom card file calculation spectrum combination full spectrum fitting method, etc. All the above methods use integration. The concept of intensity can be quantified by full spectrum fitting without involving structure and with different phase line widths. Can exclude overlapping peaks.Interference can reduce or eliminate the influence of preferred orientation.

Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray products, with two main series of products: X-ray analysis instruments and X-ray non-destructive testing instruments. And in 2013, it became the undertaking unit of the national major scientific instrument and equipment development special X-ray single crystal diffractometer project of the Ministry of Science and Technology of China. Our company adheres to the principles of customer first, product first, and service first, insists on people-oriented, and has a strong scientific and technological team. We are committed to providing users with the highest quality high-tech products with advanced technology, and providing strong support and services with efficient technical consulting and after-sales service institutions.

The use of hybrid pixel detector can achieve the best data quality while ensuring low power consumption and low cooling. This detector combines the key technologies of single photon counting and hybrid pixels, and is applied in various fields such as synchrotron radiation and conventional laboratory light sources, effectively eliminating the interference of readout noise and dark current. Hybrid pixel technology can directly detect X-rays, making it easier to distinguish signals, and detector can efficiently provide high-quality data.

The TD series X-ray diffractometer inherits its consistent high stability and high-precision closed-loop vector driven servo positioning technology, further improving accuracy. In addition to upgrading traditional performance such as plug and play optical path with triple protection, the TD-3700 also incorporates vertical hollow axis and HPC hybrid photon counting technology, making it a representative of the new generation of X-ray diffractometers and one of the best X-ray polycrystalline diffractometers in the world.

We not only provide products, but as a carrier, we pay more attention to the convenience, efficiency, accuracy, and satisfaction that it can bring to our customers' actual work. This is our commitment that we have always upheld. As the most advanced domestically produced X-ray diffractometer, TD-3500 has benefited organizations such as colleges, research institutions, and industrial enterprises in material identification and analysis, receiving high praise. This also confirms our commitment to customer satisfaction. Of course, with the rapid pace of the times and competition, in order to ensure higher customer expectations, we continuously update and improve our product line. Our goal is not only to lead domestically, but also to keep up with the world!

Recently, the Ministry of Science and Technology announced the list of the second batch of key projects under the 2023 National key research and Development Plan "Basic scientific research Conditions and major scientific instruments and equipment research and development".

It is difficult to quantify the amorphous and crystalline phases of cement materials due to the complexity of the mineral phases in the mixture and the significant overlapping peaks. Excellent results can be obtained by Rietveld refinement of the measured sample using standard measurement configurations.

X-ray diffraction spectroscopy mainly analyzes the crystal state and microstructure of materials, and there are two X-ray diffraction measurement methods for crystal analysis.