In the field of materials science research, precise measurement serves as the key to unlocking material properties. The multi-functional integrated measurement accessory developed by Dandong Tongda Science and Technology Co., Ltd. is a high-precision tool designed to enhance X-ray diffraction analysis capabilities.

This multi-functional integrated measurement accessory is specifically designed for installation on wide-angle goniometers. Its core mission is to accurately analyze plate materials, bulk materials, and thin films deposited on substrates.

The accessory can perform various measurement tasks, including crystal phase detection, orientation degree analysis, and stress testing. It supports texture analysis, residual stress determination, and in-plane structure testing of thin films, providing comprehensive data support for materials research.

The core technical features of this accessory are reflected in its multi-axis coordinated precision mechanical system and highly adaptable measurement methods.

The multi-functional integrated measurement accessory supports pole figure measurements using either transmission or reflection methods, offering flexibility for different samples and testing requirements.

For stress testing, it can employ both the side-inclination method and the normal-inclination method. For thin film samples, the accessory also enables in-plane rotation testing, allowing for in-depth analysis of film structures.

Its precision mechanical system ensures high measurement accuracy and repeatability, with minimum step increments of 0.001° (for rotation axes) and 0.001mm (for translation axes).

The application scope of the multi-functional integrated measurement accessory is extremely broad, covering almost all advanced manufacturing and R&D fields that require material structure analysis.

In the field of metal materials, it is used for evaluating the collective organization of metals such as rolled plates; in ceramics, it focuses on assessing ceramic orientation.

For thin film materials, the accessory can analyze the preferred crystal orientation of film samples and test the residual stress of multilayer films (evaluating properties such as film peeling).

It can also analyze surface oxidation and nitridation films on high-temperature superconducting material films and metal plates, as well as multilayer films on glass, silicon, and metal substrates.

Notably, it can also be applied to the analysis of macromolecular materials, paper, lens plating materials, and more, demonstrating its interdisciplinary application potential.