Product News

TD-3500 X-Ray Diffractometer delivers exceptional precision with 0.0001° repeatability and advanced PLC control. This versatile instrument performs comprehensive material analysis across powders, films, and bulk samples while ensuring maximum safety through dual protection mechanisms. Adopted by international labs, it sets new standards in analytical performance and reliability for global research applications.

Dandong Tongda launches the TD-Mini, a portable X-ray stress analyzer. It integrates a micro-focus source and area detector to deliver lab-grade precision for on-site testing. Ideal for industrial manufacturing, aerospace, and energy sectors, it delivers fast and reliable measurements.

Dandong Tongda launches its new TD-RSD Residual Stress Analyzer. This advanced X-ray instrument ensures high-precision, efficient measurement and global compliance for enhanced safety and quality in manufacturing processes worldwide.

Dandong Tongda's TDF Series X-ray Crystal Analyzer represents China's breakthrough in high-end, self-developed analytical instruments. It delivers precise, safe, and reliable crystal structure analysis for global materials science and pharmaceutical R&D.

Dandong Tongda's X-ray crystal orienters (±30 arcsec accuracy, 30kg load capacity) deliver precise orientation for piezoelectric, optical, laser, and semiconductor crystals. With specialized models and sample stages, these systems support global crystal research and manufacturing, earning international recognition for Chinese precision instruments.

The TD-3500 X-ray diffractometer from Dandong Tongda Science & Technology Co., Ltd. provides precise material analysis for various industries. Its high-precision goniometer and patented PLC control ensure reliable results and user-friendly operation, offering a versatile solution for global customers.

Dandong Tongda, a leading Chinese manufacturer, produces advanced X-ray crystal orienters. Utilizing X-ray diffraction, these instruments enable precise cutting angle measurement and directional cutting of various crystals. Key models like TYX-200 and TYX-2H8 offer high accuracy (±30″), large sample capacity, user-friendly operation, and efficient detection. Widely used in semiconductor, optics, and research fields, these world-class instruments are certified, patented, and exported globally.

This Thin Film Attachment for X-ray diffractometers enables high-precision analysis of films on substrates. Its optimized optics suppress substrate interference, enhancing weak film signals for reliable data from nanometers to micrometers. Essential for R&D in electronics, semiconductors, and new energy.

Dandong Tongda's graphite bent crystal monochromator enhances X-ray analysis accuracy with ≥35% reflectivity, eliminating interference like Kβ and fluorescence rays. It excels in environmental and electronics testing, backed by national R&D projects and ISO certification, offering precise solutions for complex samples.

Dandong Tongda Tech launches a high-precision, multifunctional integrated measuring attachment for material analysis. It enables crystal phase, orientation, and stress testing on metals, ceramics, and thin films, supporting R&D in semiconductors and new energy.