Dandong Tongda's X-ray Crystal Analyzer adopts advanced X-ray diffraction technology, enabling non-destructive detection of microstructural information in various materials. Whether it's single crystal orientation, defect inspection, lattice parameter measurement, or residual stress analysis, this instrument provides accurate and reliable test data, offering solid support for material research and quality control. The instrument is equipped with a highly stable X-ray generator that delivers exceptional performance. The tube voltage can be precisely adjusted within the range of 10-60kV, and the tube current can be regulated from 2-60mA, with a stability of no more than ±0.005%. This ensures highly repeatable and accurate test results, providing researchers with dependable data assurance. Dandong Tongda's X-ray Crystal Analyzer integrates intelligent control and comprehensive safety protection. It features an imported PLC automatic control system, enabling unattended automatic timed measurements. The multi-level safety protection system includes no-pressure, no-current, over-voltage, over-current, over-power, no-water, and X-ray tube over-temperature protections, ensuring the safety of operators. The TDF series X-ray crystal analyzer adopts a vertical tube housing with four windows that can be used simultaneously. It utilizes imported PLC control technology, which offers high precision and strong anti-interference capabilities, ensuring the reliable operation of the system. The PLC controls the switching and adjustment of high voltage and includes an automatic training function for the X-ray tube, effectively extending the service life of both the X-ray tube and the instrument. The instrument's radiation protection enclosure is constructed with high-density, high-transparency leaded glass, with external radiation leakage far below national safety standards, allowing researchers to conduct experimental studies in a secure environment. As a national high-tech enterprise, Dandong Tongda Technology Co., Ltd. has a comprehensive quality management system and a technical R&D team. Its products not only meet domestic market demands but are also exported to numerous countries and regions, demonstrating the strength and capability of China's scientific instrument manufacturing. Dandong Tongda's X-ray Crystal Analyzer, with its outstanding performance and reliable quality, has become a powerful assistant in the field of material analysis. It helps researchers and engineers unveil the layers of the material world and explore more unknown possibilities.

In the fields of materials science and industrial testing, every minute change in crystal structure can determine the final properties of a material. Today, a precision instrument embodying the essence of R&D from Dandong Tongda Science and Technology— TD-3500 X-ray Diffractometer—is opening a new window into the microscopic world for researchers and industrial inspectors with its outstanding performance and intelligent design. Evolution Through Craftsmanship and Technology The TD series diffractometers incorporate years of technological accumulation from Tongda Science and Technology, continuously evolving with the times. As the "gold standard" for material analysis, X-ray diffraction technology enables comprehensive structural analysis of powder, bulk, or thin-film samples: from qualitative and quantitative phase analysis, crystal structure analysis, and material structure analysis, to orientation analysis, macro/micro stress measurement, grain size, and crystallinity determination—the TD-3500 does it all. Intelligent Core, Stable and Reliable The core advantage of the TD-3500 X-ray Diffractometer lies in its use of an imported Siemens PLC control system. This innovative design gives the instrument outstanding features such as high precision, high accuracy, excellent stability, long service life, easy upgradability, user-friendly operation, and intelligent functionality, enabling it to flexibly adapt to the testing and research needs of various industries. The X-ray generator offers two options: high-frequency high-voltage solid-state or工频(line-frequency) generators, with high automation, extremely low failure rates, strong anti-interference capabilities, and excellent system stability. The system automatically controls the shutter switch, adjusts tube voltage and current, and includes an automatic X-ray tube training function. Real-time monitoring via a touchscreen greatly reduces operational complexity. Innovative Control, Revolutionary Operation Compared to traditional single-chip microcomputer circuits, the PLC control technology used in the TD-3500 offers multiple breakthroughs: Simple circuit control for easy debugging and installation Modular design allows users to perform maintenance and debugging themselves, significantly reducing costs Strong expandability for easy addition of various functional accessories without hardware modifications True-color touchscreen for human-machine interaction, user-friendly operation, and intuitive fault information display Precision Measurement, Safety Assured The TD series goniometer uses imported high-precision bearing transmission and is equipped with a high-precision full closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, capable of automatically correcting minute movement position errors to ensure high precision and accuracy of measurement results, with angular reproducibility reaching 0.0001 degrees. For safety, the TD-3500 adopts a hollow-axis structure with electronic lead door interlock装置, providing dual protection. The shutter window is linked to the lead door—when the lead door opens, the shutter automatically closes, ensuring comprehensive operator safety. Flexible Configuration, Comprehensive Compatibility The instrument offers two detector choices—proportional counter (PC) or scintillation counter (SC)—and multiple X-ray tube options including glass, corrugated ceramic, and metal-ceramic tubes, meeting different application scenarios and budget requirements. The TD-3500 X-ray Diffractometer is not only a high-performance analytical instrument but also a reflection of Tongda Science and Technology's relentless pursuit of quality. It is quietly playing a vital role in laboratories across the country, supporting scientific innovation and quality control, and becoming the most trusted analytical partner for scientists and engineers. Whether you are engaged in new material development, mineral resource analysis, pharmaceutical quality control, or metal material testing, the TD-3500 can provide you with accurate and reliable data support, helping you discover more possibilities in the microscopic world. Explore the Unknown with TD-3500—Let Tongda Science and Technology work with you to uncover the mysteries of materials science.

In the fields of materials science and industrial inspection, highly efficient and precise X-ray diffraction analysis has always been a core support for scientific breakthroughs and quality control. The TD-3700 series X-ray diffractometer redefines the performance limits of diffraction equipment with multiple innovative technologies, providing an unprecedented efficient solution for academic research, corporate R&D, and quality control applications. Multi-Detector Synergy Ushers in a New Era of High-Speed Analysis The TD-3700 series breaks through the limitations of traditional detectors by offering a variety of options, including high-speed one-dimensional array detectors, two-dimensional detectors, and SDD detectors. Compared to conventional scintillation or proportional detectors, it increases diffraction signal intensity by dozens of times, capturing high-sensitivity, high-resolution diffraction patterns within extremely short sampling cycles and significantly improving data output efficiency. Coupled with hybrid photon counting technology, the detectors operate noise-free, effectively suppress fluorescence background, and demonstrate excellent energy resolution and signal-to-noise performance—making them particularly suited for analyzing complex samples and trace specimens. Dual Diffraction/Transmission Modes Expand Application Boundaries The instrument not only supports conventional diffraction scanning but also innovatively introduces a transmission mode. This mode offers significantly higher resolution than diffraction mode, making it especially suitable for high-end applications such as crystal structure analysis and nanomaterials research. Meanwhile, diffraction mode, with its ultra-high signal stability, is ideal for routine phase identification. Another major advantage of transmission mode is its support for trace sample testing, greatly alleviating the challenges of sample preparation and limited sample availability. This opens up new possibilities for pharmaceutical development, geological analysis, cultural heritage identification, and other fields. Modular and Intelligent Design for a Reliable and User-Friendly Experimental Platform The TD-3700 adopts a modular hardware design where all components are plug-and-play without requiring calibration, significantly reducing maintenance costs and failure rates. Its one-click acquisition system and customized software greatly enhance operational convenience, allowing even non-specialists to get started quickly. A touchscreen interface provides real-time monitoring of instrument status, making experimental progress clear at a glance. Safety is also uncompromised: an electronic lead door interlock device offers dual protection, while a high-frequency high-voltage X-ray generator ensures stable and reliable performance. Combined with an anti-interference control unit, it maintains long-term operational reliability while ensuring user safety. Born for the Era: A Future-Oriented Benchmark in Diffraction Technology The TD-3700 series X-ray diffractometer integrates rapid analysis, intelligent operation, and comprehensive safety. It not only inherits the stability of the TD-3500 series but also achieves breakthroughs in detector technology, application flexibility, and system integration. Its emergence greatly meets the needs of modern laboratories for high-throughput, high-precision, and diverse sample analysis, making it an indispensable tool for material characterization, chemical analysis, pharmaceuticals, and academic research.

The TDM-20 X-ray Diffractometer (Benchtop XRD) is primarily used for phase analysis of powders, solids, and paste-like substances. Based on the principle of X-ray diffraction, it enables qualitative and quantitative analysis, as well as crystal structure analysis, of polycrystalline materials like powdered samples and metal samples. It is widely applied in industries including industry, agriculture, national defense, pharmaceuticals, mineralogy, food safety, petroleum, and education/research. Core Principle: X-ray Diffraction, the Key to the Microscopic World The TDM-20 X-ray Diffractometer operates on the principle of X-ray diffraction. When X-rays illuminate a sample, they interact with the atoms in the sample and diffract. Different crystal structures produce unique diffraction patterns, much like individual fingerprints. By analyzing these patterns, the instrument precisely reveals key information about the sample's crystal structure, phase composition, and more, uncovering the secrets hidden at the microscopic level. Performance Breakthrough The TDM-20 X-ray Diffractometer (Benchtop XRD) surpasses the previous international standard of 600W, undergoing a comprehensive upgrade to 1200W. The instrument features simple operation, stable performance, and low energy consumption. It can be equipped with either a proportional detector or a new high-speed array detector, resulting in a significant leap in overall performance. Device Features Compact size and lightweight design High-frequency, high-voltage power supply design for lower overall energy consumption Supports rapid sample calibration and testing Simplified circuit control for easy debugging and installation Full-spectrum diffraction angle linear accuracy reaches ±0.01° Rich Accessories The TDM-20 can be paired with various accessories, including a 1D array detector, proportional detector, 6-position automatic sample changer, rotating sample stage, among others. Conclusion The TDM-20 X-ray Diffractometer (Benchtop XRD) , with its outstanding performance, user-friendly operation, and broad range of applications, has become an indispensable tool across numerous industries and research fields. It acts like a "detective" of the microscopic world, helping us unravel the mysteries of material structure and driving progress in various domains. If you too seek to delve deeper into the microscopic secrets of matter, consider the TDM-20 to embark on a journey of precise and efficient research and production.

Dandong Tongda Technology specializes in the development of small-angle diffraction attachments, which are dedicated components for X-ray diffractometers. Covering a diffraction angle range of 0° to 5°, these attachments enable precise measurement of nanoscale multilayer film thickness and support structural analysis of nanomaterials. Designed for seamless compatibility with TD-3500, TD-3700, and other series diffractometers, they are widely used for nanoscale material characterization in fields such as materials science, chemical engineering, geology, and mineralogy. Incorporating imported PLC control technology and modular design, these attachments significantly enhance equipment automation and operational stability. The TD series instruments now meet international standards and have been successfully exported to countries including the United States and Azerbaijan, providing crucial technical support for global nanomaterial research.

Dandong Tongda's Parallel Optical Film Measuring Accessory is a specialized component for X-ray diffractometers, significantly improving thin-film sample testing performance. Its elongated grating design effectively suppresses scattering interference, enhancing signal clarity for ultra-thin and nanomultilayer films. The accessory supports small-angle diffraction analysis (0°–5°), enabling precise measurement of film thickness and interface structures. Compatible with TD-3500, TD-5000, TD-3700, and TDM-20 diffractometers, it ensures consistent performance across platforms. Widely applied in semiconductor inspection, optical coating evaluation, and new energy material research, this tool addresses challenges like weak signals and background noise. As nanomaterials and semiconductor industries advance, the accessory is poised to play an increasingly critical role in cutting-edge research and quality control.

Multifunctional Integrated Measurement Attachment enables precise texture, stress and thin-film analysis. Supports pole figure mapping, biaxial stress measurement and in-plane rotation. Ideal for metals, ceramics, coatings and polymers. Features 0.001° step precision and Φ100mm sample capacity.

The TDM-20 desktop X-ray diffractometer delivers 1200W power in a compact design, surpassing 600W international standards. With ±0.01° linearity and 0.0001° repeatability, it enables precise phase analysis for materials research and industrial QC. Its integrated cooling system and global accessory compatibility make it an ideal cost-effective solution for international laboratories

The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide

TD-3700 High-Resolution X-Ray Diffractometer delivers exceptional analytical performance through innovative detector technology and dual scanning modes. Featuring rapid data acquisition, user-friendly operation, and enhanced safety, it enables precise materials analysis across research and industrial applications, setting new standards for Chinese scientific instruments.

The TDM-20 Desktop X-Ray Diffractometer integrates advanced X-ray generation, high goniometric accuracy, and efficient detection in a compact design. It delivers reliable phase analysis for materials science, pharmaceuticals, and industrial QC, backed by global support and international certifications.

TD-5000 X-ray diffractometer breaks international monopoly in high-end scientific instruments. This Chinese innovation delivers exceptional precision (0.0001° accuracy) and advanced detection capabilities, serving researchers in pharmaceuticals, materials science, and chemistry through comprehensive structural analysis.