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AI fully automated X-ray diffractometer

2025-09-26 08:59

Dandong Tongda Launches AI-Powered Fully Automatic X-ray Diffractometer.

Overview:

The AI fully automated X-ray diffractometer deeply integrates the high-precision manipulation of a robotic arm based on a portable diffractometer. Compared to traditional diffractometers, it significantly reduces manual intervention, making it suitable for R&D scenarios requiring high-throughput and high-repeatability testing. It can be remotely controlled via mobile phone or APP, featuring automatic door opening and closing technology. With autonomous sampling and analysis capabilities, it offers precision and convenience.


The integration of robotic arm technology in the diffractometer system is primarily reflected in automated control, precision operation, and heat dissipation optimization. If detailed functional design for specific industries is required, more detailed parameter customization solutions can be provided.


Instrument Features:

  • Modular design for easy upgrades and additions, with powerful expansion capabilities.

  • Compact and flexible, plug-and-play, with fast and accurate measurements.

  • Automatic door control technology; the instrument can be remotely controlled via mobile phone or APP.

  • Safe and reliable: enables unmanned remote continuous operation for radioactive materials.

  • Autonomous sample feeding function: independent sample grasping and testing, precise and convenient, compatible with samples in various forms such as powder, thin films, and bulk materials.

  • Highly integrated unified joint modular robotic arm: lightweight design for agility and flexibility; rich interfaces with powerful functionality; separable modular design for easy customization and maintenance.

Fully Automated Hardware: Equipped with a robotic arm, automatic sample changer, visualization, and laser positioning systems. It can perform a series of operations—automatically grabbing samples from the sample tray, placing them at the center of the goniometer, and automatic surface leveling—enabling 7x24-hour unattended batch measurements.

    • Intelligent Experiment Design: Automatically recommends or selects optimal measurement parameters (e.g., scan range, speed, optical path conditions) based on the sample type (such as powder, thin film, bulk).

    • Real-time Data Quality Assessment: Judges the quality of diffraction patterns in real-time during measurement (e.g., signal-to-noise ratio, presence of preferred orientation) and can automatically adjust parameters for re-measurement, ensuring data reliability.

    • Advanced Data Analysis: This is where AI adds the most value.


    X-ray diffractometer


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