The Multifunctional Integrated Measurement Attachment from Dandong Tongda is a high-precision sample analysis platform mounted on wide-angle goniometers to significantly enhance X-ray analytical capabilities. This multi-axis system enables sophisticated material analysis, including phase identification, residual stress testing, and thin film in-plane structure characterization. Featuring α-axis tilt (-45°-90°), β-axis 360° rotation, and XYZ translation (±10mm) with 0.001°/.001mm resolution, it supports both transmission/reflection pole figure measurements and iso-/side-inclination stress methods. Essential for advanced materials research, it facilitates texture analysis, stress evaluation, and multilayer film studies on metals, ceramics, and various substrates, making it a powerful tool for both research and industrial inspection applications.
