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Dandong Tongda launches its new TD-RSD Residual Stress Analyzer. This advanced X-ray instrument ensures high-precision, efficient measurement and global compliance for enhanced safety and quality in manufacturing processes worldwide.

Dandong Tongda's TDF Series X-ray Crystal Analyzer represents China's breakthrough in high-end, self-developed analytical instruments. It delivers precise, safe, and reliable crystal structure analysis for global materials science and pharmaceutical R&D.

Dandong Tongda's X-ray crystal orienters (±30 arcsec accuracy, 30kg load capacity) deliver precise orientation for piezoelectric, optical, laser, and semiconductor crystals. With specialized models and sample stages, these systems support global crystal research and manufacturing, earning international recognition for Chinese precision instruments.

Dandong Tongda, a leading Chinese manufacturer, produces advanced X-ray crystal orienters. Utilizing X-ray diffraction, these instruments enable precise cutting angle measurement and directional cutting of various crystals. Key models like TYX-200 and TYX-2H8 offer high accuracy (±30″), large sample capacity, user-friendly operation, and efficient detection. Widely used in semiconductor, optics, and research fields, these world-class instruments are certified, patented, and exported globally.

The TDF series X-ray crystal analyzer is a large-scale analytical instrument used to study the internal microstructure of substances. It is mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations.

The TDF series X-ray crystal analyzer is a large-scale analytical X-ray instrument used to study the internal microstructure of substances.It is mainly used for single crystal orientation,defect inspection,determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations. The TDF series X-ray crystal analyzer adopts a vertical tube sleeve, and four windows can be used simultaneously. The TDF series X-ray crystal analyzer adopts imported PLC control technology, with high control accuracy and good anti-interference performance, which can achieve reliable operation of the system. The PLC controls the high-voltage switch, lifting, and has the function of automatically training the X-ray tube, effectively extending the service life of the X-ray tube and X-ray instrument.

The TDF series X-ray crystal analyzer is a large-scale X-ray instrument used to study the internal microstructure of substances. It utilizes the principle of interaction between X-ray and crystal to determine the atomic arrangement inside the crystal by analyzing the diffraction pattern of X-ray. Mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stress, study of the structure of plate and rod, investigation of the structure of unknown substances and single crystal dislocations. The X-ray crystal analyzer, as an X-ray instrument, provides valuable information for materials science research and other related fields. With the continuous advancement of technology and the expansion of applications, X-ray crystal analyzer will continue to play an important role in scientific research and industrial production.

The automatic X-ray orientation instrument is a device that uses the diffraction principle of X-ray to determine the crystal structure, orientation, and lattice parameters. It has a wide range of applications in materials science, geology, physics, and chemistry, especially in studying the microstructure and properties of single crystal, polycrystalline materials, and thin film materials. The following will provide a detailed introduction to the working principle, application, and operational precautions of the X-ray crystal orienter. With the advancement of technology, the automatic X-ray orientation instrument devices continues to improve, with higher resolution and easier operation. At the same time, the combination with other analytical techniques such as electron microscopy and spectroscopic analysis makes the analysis of crystal structure more comprehensive and in-depth. In addition, portable and online monitoring X-ray orientation analyzer devices have gradually developed, providing possibilities for on-site analysis and real-time monitoring. In summary, X-ray orientation analyzer is a powerful analytical tool that is crucial for understanding and controlling the microstructure of materials. With the continuous development of technology, its application in various fields will become more extensive and in-depth.

The X-ray orientation analyzer is a device that uses the principle of X-ray diffraction to determine crystal orientation. It is widely used in fields such as materials science, geology, physics, etc., for studying crystal structure, lattice parameters, crystal defects, etc. The working principle of an X-ray orientation analyzer​ is to irradiate a monochromatic X-ray beam onto the crystal under test. When the X-ray interacts with atoms in the crystal, scattering occurs. According to Bragg's law, when the wavelength of X-rays is an integer multiple of the atomic spacing in a crystal, scattered light will interfere and form a series of alternating bright and dark stripes, known as Bragg reflection. By measuring the angles and intensities of these Bragg reflections, information such as crystal orientation and lattice parameters can be calculated. The X-ray orientation analyzer usually includes the following main parts: 1.X-ray source: a device that produces monochromatic X-rays, typically using an X-ray tube or synchrotron radiation source. 2.Sample stage: a platform used to place the crystal to be tested, which can adjust the position and angle of the crystal. 3.Detector: used to receive scattered X-rays and convert them into electrical signals. Common detectors include scintillation counters, proportional counters, etc. 4.Data acquisition and processing system: used to collect signals output by detectors, and perform data processing and analysis. Usually includes multi-channel analyzers, computers, and other equipment. 5.Control system: used to control the movement of X-ray source, sample stage, and detector to achieve measurement of crystals in different directions. By using an X-ray orientation analyzer, researchers can accurately determine the orientation and lattice parameters of crystals, thereby gaining a deeper understanding of their structure and properties. This is of great significance for the development of new materials, geological exploration, crystal growth and other fields.

The in-situ battery accessory is a component of the X-ray diffractometer accessories.In situ battery accessories are widely used in electrochemical systems containing composite materials such as carbon, oxygen, nitrogen sulfur, and metal inserts. Test range: 0.5-160 degrees Celsius Temperature resistance: 400 ℃ Beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable) Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometers、Wholesaler of X-ray directional analyzer、Wholesaler of X-series X-ray crystal analyzer。