Small Angle Diffractometer Accessories
Dandong Tongda's small-angle diffraction accessory precisely measures nano-multilayer film thickness (0°-5° range). Fully compatible with TD-series diffractometers, it offers plug-and-play convenience and 0.0001° reproducibility, empowering research in new energy and semiconductors.
- Tongda
- Liaoning, China
- 1—2 months
- 100 units per year
- Information
Product Value
With the rapid advancement of nanomaterials science, researchers are demanding higher precision and specialization in analytical instruments. The small-angle diffraction accessory launched by Dandong Tongda Technology directly addresses the challenge of measuring the thickness of nano-multilayer films. By accurately measuring small-angle diffraction data within the range of 0°to 5°, this accessory provides researchers with critical material parameters, offering broad application prospects in fields such as new energy, semiconductors, and high-end composite materials.
As a functional expansion module for X-ray diffractometers, this small-angle diffraction accessory embodies Tongda Technology’s product development philosophy of “meeting users’ specific needs through modular design.”
Technical Features
The small-angle diffraction accessory is specifically designed for nanomaterial analysis, with an angular test range covering 0° to 5°. This range precisely encompasses the key areas of Small-Angle X-ray Scattering (SAXS) and Small-Angle X-ray Diffraction (SAXD), enabling researchers to accurately measure the thickness of nano-multilayer films.
The accessory is fully compatible with Tongda Technology’s flagship TD-series X-ray diffractometers, allowing for plug-and-play convenience. Users no longer need to replace multiple components or readjust the optical path system, significantly enhancing research efficiency.
Paired with the high-precision goniometer of the TD-series diffractometers, the angular reproducibility can reach 0.0001 degrees, with a minimum step size of 0.0001 degrees, ensuring high accuracy and repeatability of measurement results.
Application Fields
The small-angle diffraction accessory can be widely applied in research fields such as chemistry, chemical engineering, machinery, geology, minerals, metallurgy, building materials, ceramics, petrochemicals, and pharmaceuticals.
It excels in measuring the thickness of nano-multilayer films, providing a critical analytical tool for researchers studying new energy storage materials, semiconductor devices, and functional coatings.
The accessory also meets the measurement requirements for special samples, including loose powders, bulk solids, liquids, and sol-gel states.
The small-angle diffraction accessory and its series products from Dandong Tongda Technology are gradually breaking international monopolies, empowering breakthroughs in materials science research in China. In the future, Tongda Technology will continue to adhere to its philosophy of “Quality is the life of the enterprise, credibility is the foundation of the market, and innovation is the driving force of development,” providing domestic researchers with more high-quality high-tech products.
