THIN FILM MEASURING ACCESSORY
Thin film measuring accessory from Dandong Tongda Technology enhances performance by incorporating longer grating sheets. This design effectively filters out scattered radiation, reducing interference from substrate signals while significantly strengthening the thin film diffraction signals.
- Tongda
- Liaoning, China
- 1—2 months
- 100 units per year
- Information
Dandong Tongda Technology Co., Ltd. is a National High-Tech Enterprise established in 2010, specializing in the R&D, manufacturing, and sales of X-ray analysis instruments and non-destructive testing equipment. The company is headquartered in Dandong City, Liaoning Province.
Leveraging its strong technical expertise, Dandong Tongda Technology has launched core products including X-ray diffractometers, crystal orientation instruments, and residual stress analyzers. These instruments are widely used in industrial, pharmaceutical, and materials research applications across universities, research institutes, and enterprises. The company's TD series analytical instruments and TD series non-destructive testing equipment have reached or approached world-class standards.
In addition to manufacturing X-ray diffractometers, the company also provides a range of instrument accessories. Among them, the thin film measuring accessory is a high-precision optical component specifically designed to enhance the performance of X-ray diffractometers (XRD) in thin film material analysis. This innovative accessory adopts a modular design, enabling seamless integration with the TDM-20 and other diffractometer series. By increasing the length of the grating sheet, the thin film measuring accessory effectively filters out more scattered rays, thereby reducing the impact of substrate signals on results and enhancing thin film signal intensity. Its core design philosophy lies in significantly extending the effective length of the grating sheet to achieve exceptional scattered ray filtration capability, fundamentally optimizing the quality of diffraction data and providing more reliable data support for scientific research and industrial testing.
Dandong Tongda Technology's thin film measuring accessory is not merely a hardware add-on but a systematic solution addressing key challenges in thin film analysis. Through its precise physical optical path design, it achieves a leap in data quality, offering researchers in materials science a sharper and clearer perspective when exploring the nanoscale world.
Dandong Tongda Technology Co., Ltd. welcomes all inquiries about our X-ray diffractometers and comprehensive range of accessories. Our dedicated technical team ensures prompt and professional responses within 24 hours to address your specific application requirements. We provide complete technical specifications, customized solution recommendations, and detailed product demonstrations. With extensive expertise in materials analysis instrumentation, we're committed to delivering exceptional pre-sales consultation and after-sales support. We look forward to establishing successful partnerships and providing you with reliable analytical solutions that meet your research and quality control objectives.
